Year |
Citation |
Score |
2018 |
Kim K, Luo H, Zhu T, Pierron ON, Graham S. Influence of Polymer Substrate Damage on the Time Dependent Cracking of SiNBarrier Films. Scientific Reports. 8: 4560. PMID 29540713 DOI: 10.1038/S41598-018-22105-2 |
0.44 |
|
2018 |
Barrios A, Gupta S, Castelluccio G, Pierron ON. Quantitative In Situ SEM High Cycle Fatigue: the Critical Role of Oxygen on Nanoscale-Void-Controlled Nucleation and Propagation of Small Cracks in Ni Microbeams. Nano Letters. PMID 29489378 DOI: 10.1021/Acs.Nanolett.8B00343 |
0.469 |
|
2016 |
Kim K, Luo H, Singh AK, Zhu T, Graham S, Pierron ON. Environmentally-Assisted Cracking In Silicon Nitride Barrier Films On PET Substrates. Acs Applied Materials & Interfaces. PMID 27643813 DOI: 10.1021/Acsami.6B06417 |
0.472 |
|
2016 |
Sadeghi-Tohidi F, Pierron ON. Extreme stress gradient effects on the fatigue behavior of Ni notched microbeams Acta Materialia. 106: 388-400. DOI: 10.1016/j.actamat.2016.01.013 |
0.473 |
|
2015 |
Hosseinian E, Pierron ON. Correction: Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films. Nanoscale. 7: 11468-70. PMID 26083001 DOI: 10.1039/c5nr90109j |
0.382 |
|
2015 |
Sadeghi-Tohidi F, Pierron ON. Extreme stress gradient effects on microstructural fatigue crack propagation rates in Ni microbeams Applied Physics Letters. 106. DOI: 10.1063/1.4921476 |
0.431 |
|
2014 |
Sadeghi-Tohidi F, Samet D, Graham S, Pierron ON. Comparison of the cohesive and delamination fatigue properties of atomic-layer-deposited alumina and titania ultrathin protective coatings deposited at 200 °C. Science and Technology of Advanced Materials. 15: 015003. PMID 27877645 DOI: 10.1088/1468-6996/15/1/015003 |
0.476 |
|
2014 |
Sadeghi-Tohidi F, Samet D, Graham S, Pierron ON. Comparison of the cohesive and delamination fatigue properties of atomic-layer-deposited alumina and titania ultrathin protective coatings deposited at 200 °c Science and Technology of Advanced Materials. 15. DOI: 10.1088/1468-6996/15/1/015003 |
0.479 |
|
2014 |
Baumert EK, Sadeghi-Tohidi F, Hosseinian E, Pierron ON. Fatigue-induced thick oxide formation and its role on fatigue crack initiation in Ni thin films at low temperatures Acta Materialia. 67: 156-167. DOI: 10.1016/j.actamat.2013.11.057 |
0.567 |
|
2013 |
Hosseinian E, Pierron ON. Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films. Nanoscale. 5: 12532-41. PMID 24173603 DOI: 10.1039/c3nr04035f |
0.359 |
|
2013 |
Baumert EK, Pierron ON. Interfacial cyclic fatigue of atomic-layer-deposited alumina coatings on silicon thin films. Acs Applied Materials & Interfaces. 5: 6216-24. PMID 23721232 DOI: 10.1021/am4011989 |
0.531 |
|
2013 |
Straub T, Theillet PO, Eberl C, Pierron ON. Comparison of the stress distribution and fatigue behavior of 10-and 25-μm-thick deep-reactive-ion-etched si kilohertz resonators Journal of Microelectromechanical Systems. 22: 418-429. DOI: 10.1109/JMEMS.2012.2226933 |
0.391 |
|
2013 |
Baumert EK, Pierron ON. Fatigue degradation properties of LIGA Ni films using kilohertz microresonators Journal of Microelectromechanical Systems. 22: 16-25. DOI: 10.1109/JMEMS.2012.2212422 |
0.558 |
|
2013 |
Bulusu A, Behm H, Sadeghi-Tohidi F, Bahre H, Baumert E, Samet D, Hopmann C, Winter J, Pierron O, Graham S. The mechanical reliability of flexible ALD barrier films Digest of Technical Papers - Sid International Symposium. 44: 361-364. DOI: 10.1002/j.2168-0159.2013.tb06221.x |
0.495 |
|
2012 |
Baumert EK, Pierron ON. Fatigue properties of atomic-layer-deposited alumina ultra-barriers and their implications for the reliability of flexible organic electronics Applied Physics Letters. 101. DOI: 10.1063/1.4772471 |
0.466 |
|
2012 |
Straub T, Baumert EK, Eberl C, Pierron ON. A method for probing the effects of conformal nanoscale coatings on fatigue crack initiation in electroplated Ni films Thin Solid Films. 526: 176-182. DOI: 10.1016/j.tsf.2012.11.011 |
0.501 |
|
2012 |
Baumert EK, Pierron ON. Very high cycle fatigue crack initiation in electroplated Ni films under extreme stress gradients Scripta Materialia. 67: 45-48. DOI: 10.1016/j.scriptamat.2012.03.017 |
0.565 |
|
2011 |
Theillet PO, Pierron ON. Quantifying adsorbed water monolayers on silicon MEMS resonators exposed to humid environments Sensors and Actuators, a: Physical. 171: 375-380. DOI: 10.1016/j.sna.2011.09.002 |
0.315 |
|
2011 |
Baumert EK, Theillet PO, Pierron ON. Fatigue-resistant silicon films coated with nanoscale alumina layers Scripta Materialia. 65: 596-599. DOI: 10.1016/j.scriptamat.2011.06.034 |
0.523 |
|
2010 |
Budnitzki M, Scates MC, Ritchie RO, Stach EA, Muhlstein CL, Pierron ON. The effects of cubic stiffness on fatigue characterization resonator performance Sensors and Actuators, a: Physical. 157: 228-234. DOI: 10.1016/J.Sna.2009.11.020 |
0.693 |
|
2010 |
Baumert EK, Theillet PO, Pierron ON. Investigation of the low-cycle fatigue mechanism for micron-scale monocrystalline silicon films Acta Materialia. 58: 2854-2863. DOI: 10.1016/j.actamat.2010.01.011 |
0.61 |
|
2009 |
Theillet PO, Pierron O. Low-cycle fatigue testing of silicon resonators Proceedings of Spie - the International Society For Optical Engineering. 7206. DOI: 10.1117/12.808180 |
0.475 |
|
2009 |
Theillet PO, Pierron ON. Fatigue rates of monocrystalline silicon thin films in harsh environments: Influence of stress amplitude, relative humidity, and temperature Applied Physics Letters. 94. DOI: 10.1063/1.3133357 |
0.51 |
|
2009 |
Budnitzki M, Pierron O. The influence of nanoscale atomic-layer-deposited alumina coating on the fatigue behavior of polycrystalline silicon thin films Applied Physics Letters. 94. DOI: 10.1063/1.3112565 |
0.565 |
|
2009 |
Budnitzki M, Pierron ON. Highly localized surface oxide thickening on polycrystalline silicon thin films during cyclic loading in humid environments Acta Materialia. 57: 2944-2955. DOI: 10.1016/j.actamat.2009.03.004 |
0.561 |
|
2007 |
Pierron ON, Muhlstein CL. The role of debris-induced cantilever effects in cyclic fatigue of micron-scale silicon films Fatigue and Fracture of Engineering Materials and Structures. 30: 57-63. DOI: 10.1111/j.1460-2695.2006.01042.x |
0.714 |
|
2007 |
Pierron ON, Muhlstein CL. Notch root oxide formation during fatigue of polycrystalline silicon structural films Journal of Microelectromechanical Systems. 16: 1441-1450. DOI: 10.1109/Jmems.2007.906076 |
0.755 |
|
2007 |
Alsem DH, Pierron ON, Stach EA, Muhlstein CL, Ritchie RO. Mechanisms for fatigue of micron-scale silicon structural films Advanced Engineering Materials. 9: 15-30. DOI: 10.1002/Adem.200600269 |
0.75 |
|
2006 |
Pierron ON, Muhlstein CL. Fatigue of polycrystalline silicon films with thin surface oxides Proceedings of Spie - the International Society For Optical Engineering. 6111. DOI: 10.1117/12.646468 |
0.748 |
|
2006 |
Pierron ON, Muhlstein CL. The critical role of environment in fatigue damage accumulation in deep-reactive ion-etched single-crystal silicon structural films Journal of Microelectromechanical Systems. 15: 111-119. DOI: 10.1109/Jmems.2005.863602 |
0.75 |
|
2006 |
Pierron ON, Abnet CC, Muhlstein CL. Methodology for low- and high-cycle fatigue characterization with kHz-frequency resonators Sensors and Actuators, a: Physical. 128: 140-150. DOI: 10.1016/J.Sna.2006.01.013 |
0.689 |
|
2005 |
Glendening A, Koss DA, Motta AT, Pierron ON, Daum RS. Failure of hydrided zircaloy-4 under equal-biaxial and plane-strain tensile deformation Journal of Astm International. 2: 399-414. DOI: 10.1520/Jai12441 |
0.333 |
|
2005 |
Pierron ON, Muhlstein CL. Long-term reliability of single-crystal silicon thin films: The influence of environment on the fatigue damage accumulation rate Progress in Biomedical Optics and Imaging - Proceedings of Spie. 5716: 141-150. DOI: 10.1117/12.591219 |
0.727 |
|
2005 |
Pierron ON, MacDonald DD, Muhlstein CL. Galvanic effects in Si-based microelectromechanical systems: Thick oxide formation and its implications for fatigue reliability Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1939072 |
0.662 |
|
2005 |
Pierron ON, Muhlstein CL. The extended range of reaction-layer fatigue susceptibility of polycrystalline silicon thin films International Journal of Fracture. 135: 1-18. DOI: 10.1007/S10704-005-3469-Y |
0.747 |
|
2004 |
Muhlstein CL, Pierron ON. Reaction-layer fatigue: Understanding the limitations of structural silicon Proceedings of Spie - the International Society For Optical Engineering. 5343: 132-144. DOI: 10.1117/12.527465 |
0.723 |
|
2003 |
Pierron ON, Koss DA, Motta AT, Chan KS. The influence of hydride blisters on the fracture of Zircaloy-4 Journal of Nuclear Materials. 322: 21-35. DOI: 10.1016/S0022-3115(03)00299-X |
0.378 |
|
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