Year |
Citation |
Score |
2011 |
Pohl DW, Rodrigo SG, Novotny L. Stacked optical antennas Applied Physics Letters. 98: 023111. DOI: 10.1063/1.3541544 |
0.455 |
|
2008 |
Biagioni P, Farahani JN, Mühlschlegel P, Eisler HJ, Pohl DW, Hecht B. A simple method for producing flattened atomic force microscopy tips. Review of Scientific Instruments. 79: 16103-16103. PMID 18248075 DOI: 10.1063/1.2834875 |
0.586 |
|
2007 |
Farahani JN, Eisler H, Pohl DW, Pavius M, Flückiger P, Gasser P, Hecht B. Bow-tie optical antenna probes for single-emitter scanning near-field optical microscopy Nanotechnology. 18: 125506-125600. DOI: 10.1088/0957-4484/18/12/125506 |
0.697 |
|
2006 |
Hecht B, Mühlschlegel P, Farahani JN, Eisler H, Pohl DW, Martin OJF, Biagioni P. Prospects of resonant optical antennas for nano-analysis Chimia. 60: 765-769. DOI: 10.2533/Chimia.2006.765 |
0.64 |
|
2006 |
Mühlschlegel P, Toquant J, Pohl DW, Hecht B. Glue-free tuning fork shear-force microscope Review of Scientific Instruments. 77: 16105. DOI: 10.1063/1.2165548 |
0.643 |
|
2005 |
Farahani JN, Pohl DW, Eisler H-, Hecht B. Single quantum dot coupled to a scanning optical antenna: a tunable superemitter. Physical Review Letters. 95: 17402. PMID 16090656 DOI: 10.1103/Physrevlett.95.017402 |
0.597 |
|
2005 |
Mühlschlegel P, Eisler HJ, Martin OJ, Hecht B, Pohl DW. Resonant optical antennas. Science (New York, N.Y.). 308: 1607-9. PMID 15947182 DOI: 10.1126/Science.1111886 |
0.674 |
|
2005 |
Haumann C, Pelargus C, Frey HG, Ros R, Anselmetti D, Toquant J, Pohl DW. Stand-alone device for the electrolytic fabrication of scanning near-field optical microscopy aperture probes Review of Scientific Instruments. 76. DOI: 10.1063/1.1866253 |
0.522 |
|
2005 |
Hecht B, Eisler H, Pohl DW, Martin OJF. Nanostrukturen Optische Antennen Physik in Unserer Zeit. 36: 209-210. DOI: 10.1002/Piuz.200590077 |
0.553 |
|
2004 |
Pohl DW. Optics at the nanometre scale. Philosophical Transactions - Royal Society. Mathematical, Physical and Engineering Sciences. 362: 701-717. PMID 15306489 DOI: 10.1098/Rsta.2003.1342 |
0.385 |
|
2001 |
Baida FI, Labeke DV, Bouhelier A, Huser T, Pohl DW. Propagation and diffraction of locally excited surface plasmons Journal of the Optical Society of America a-Optics Image Science and Vision. 18: 1552-1561. PMID 11444548 DOI: 10.1364/Josaa.18.001552 |
0.437 |
|
2001 |
Bouhelier A, Huser T, Tamaru H, Güntherodt H, Pohl DW, Baida FI, Van Labeke D. Plasmon optics of structured silver films Physical Review B. 63. DOI: 10.1103/Physrevb.63.155404 |
0.443 |
|
2001 |
Bouhelier A, Toquant J, Tamaru H, Güntherodt H-, Pohl DW, Schider G. Electrolytic formation of nanoapertures for scanning near-field optical microscopy Applied Physics Letters. 79: 683-685. DOI: 10.1063/1.1389767 |
0.573 |
|
2000 |
Hecht B, Sick B, Wild UP, Deckert V, Zenobi R, Martin OJF, Pohl DW. Scanning near-field optical microscopy with aperture probes: Fundamentals and applications Journal of Chemical Physics. 112: 7761-7774. DOI: 10.1063/1.481382 |
0.771 |
|
1999 |
Bouhelier A, Huser TR, Freyland JM, Güntherodt HJ, Pohl DW. Plasmon transmissivity and reflectivity of narrow grooves in a silver film Journal of Microscopy. 194: 571-573. PMID 11388309 DOI: 10.1046/J.1365-2818.1999.00500.X |
0.37 |
|
1998 |
Hecht B, Bielefeldt H, Pohl DW, Novotny L, Heinzelmann H. Influence of detection conditions on near-field optical imaging Journal of Applied Physics. 84: 5873-5882. DOI: 10.1063/1.368902 |
0.707 |
|
1998 |
Novotny L, Hecht B, Pohl DW. Implications of high resolution to near-field optical microscopy Ultramicroscopy. 71: 341-344. DOI: 10.1016/S0304-3991(97)00066-1 |
0.723 |
|
1997 |
Hecht B, Bielefeldt H, Inouye Y, Pohl DW, Novotny L. Facts and artifacts in near-field optical microscopy Journal of Applied Physics. 81: 2492-2498. DOI: 10.1063/1.363956 |
0.726 |
|
1996 |
Hecht B, Bielefeldt H, Novotny L, Inouye Y, Pohl D. Local Excitation, Scattering, and Interference of Surface Plasmons. Physical Review Letters. 77: 1889-1892. PMID 10063197 DOI: 10.1103/Physrevlett.77.1889 |
0.653 |
|
1996 |
Pohl D, Novotny L, Hecht B, Heinzelmann H. Radiation coupling and image formation in scanning near-field optical microscopy Thin Solid Films. 273: 161-167. DOI: 10.1016/0040-6090(95)06810-4 |
0.71 |
|
1996 |
Heinzelmann H, Lacoste T, Huser T, Güntherodt H, Hecht B, Pohl D. Instrumental developments and recent experiments in near-field optical microscopy Thin Solid Films. 273: 149-153. DOI: 10.1016/0040-6090(95)06808-2 |
0.732 |
|
1995 |
Novotny L, Pohl DW, Hecht B. Scanning near-field optical probe with ultrasmall spot size Optics Letters. 20: 970-972. DOI: 10.1364/Ol.20.000970 |
0.718 |
|
1995 |
Pohl DW. Some thoughts about scanning probe microscopy, micromechanics, and storage Ibm Journal of Research and Development. 39: 701-712. DOI: 10.1147/Rd.396.0701 |
0.336 |
|
1995 |
HEINZELMANN H, HECHT B, NOVOTNY L, POHL DW. Forbidden light scanning near-field optical microscopy Journal of Microscopy. 177: 115-118. DOI: 10.1111/J.1365-2818.1995.Tb03541.X |
0.724 |
|
1995 |
Pohl D, Durig U, Gueret P. Resolving Near‐Field Microscopy History Physics Today. 48: 74-75. DOI: 10.1063/1.2807895 |
0.323 |
|
1995 |
Hecht B, Pohl D, Heinzelmann H, Novotny L. “Tunnel” near-field optical microscopy: TNOM-2 Ultramicroscopy. 61: 99-104. DOI: 10.1016/0304-3991(95)00106-9 |
0.739 |
|
1995 |
Novotny L, Pohl DW, Hecht B. Light confinement in scanning near-field optical microscopy Ultramicroscopy. 61: 1-9. DOI: 10.1016/0304-3991(95)00095-X |
0.711 |
|
1995 |
Hecht B, Heinzelmann H, Pohl DW. Combined aperture SNOM/PSTM: best of both worlds? Ultramicroscopy. 57: 228-234. DOI: 10.1016/0304-3991(94)00144-C |
0.717 |
|
1995 |
Novotny L, Pohl DW, Regli P. Near-field, far-field and imaging properties of the 2D aperture SNOM Ultramicroscopy. 57: 180-188. DOI: 10.1016/0304-3991(94)00133-8 |
0.434 |
|
1995 |
Pohl DW. Near-field optics : light for the world of nano-scale science Thin Solid Films. 264: 250-254. DOI: 10.1016/0040-6090(95)05822-2 |
0.591 |
|
1994 |
Moerner WE, Plakhotnik T, Irngartinger T, Wild UP, Pohl DW, Hecht B. Near-field optical spectroscopy of individual molecules in solids. Physical Review Letters. 73: 2764-2767. PMID 10057186 DOI: 10.1103/Physrevlett.73.2764 |
0.73 |
|
1994 |
Novotny L, Pohl DW, Regli P. Light propagation through nanometer-sized structures: The two-dimensional-aperture scanning near-field optical microscope Journal of the Optical Society of America a: Optics and Image Science, and Vision. 11: 1768-1789. DOI: 10.1364/Josaa.11.001768 |
0.551 |
|
1994 |
Pohl DW. Near-field optics: Light for the world of NANO Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 12: 1441. DOI: 10.1116/1.587313 |
0.542 |
|
1994 |
Heinzelmann H, Pohl DW. Scanning near-field optical microscopy Applied Physics A. 59: 89-101. DOI: 10.1007/Bf00332200 |
0.55 |
|
1991 |
Denk W, Pohl DW. Local electrical dissipation imaged by scanning force microscopy Applied Physics Letters. 59: 2171-2173. DOI: 10.1063/1.106088 |
0.355 |
|
1988 |
Pohl DW, Fischer UC, Dürig UT. Scanning near-field optical microscopy (SNOM) Journal of Microscopy. 152: 853-861. DOI: 10.1111/J.1365-2818.1988.Tb01458.X |
0.562 |
|
1988 |
Fischer UC, Dürig UT, Pohl DW. Near‐field optical scanning microscopy in reflection Applied Physics Letters. 52: 249-251. DOI: 10.1063/1.99483 |
0.506 |
|
1988 |
Pohl DW, Möller R. ``Tracking'' tunneling microscopy Review of Scientific Instruments. 59: 840-842. DOI: 10.1063/1.1139790 |
0.329 |
|
1987 |
Gimzewski JK, Möller R, Pohl DW, Schlittler RR. Transition from tunneling to point contact investigated by scanning tunneling microscopy and spectroscopy Surface Science. 189: 15-23. DOI: 10.1016/S0039-6028(87)80409-0 |
0.313 |
|
1986 |
Dürig U, Gimzewski JK, Pohl DW. Experimental observation of forces acting during scanning tunneling microscopy. Physical Review Letters. 57: 2403-2406. PMID 10033716 DOI: 10.1103/Physrevlett.57.2403 |
0.325 |
|
1986 |
Dürig U, Pohl D, Rohner F. Near-field optical scanning microscopy with tunnel-distance regulation Ibm Journal of Research and Development. 30: 478-483. DOI: 10.1147/Rd.305.0478 |
0.55 |
|
1986 |
Pohl DW. Some design criteria in scanning tunneling microscopy Ibm Journal of Research and Development. 30: 417-427. DOI: 10.1147/Rd.304.0417 |
0.314 |
|
1986 |
Muralt P, Pohl DW. Scanning tunneling potentiometry Applied Physics Letters. 48: 514-516. DOI: 10.1063/1.96491 |
0.323 |
|
1986 |
Dürig U, Pohl DW, Rohner F. Near‐field optical‐scanning microscopy Journal of Applied Physics. 59: 3318-3327. DOI: 10.1063/1.336848 |
0.446 |
|
1986 |
Gimzewski J, Humbert A, Pohl D, Vepřek S. Scanning tunneling microscopy of nanocrystalline silicon surfaces Surface Science. 168: 795-800. DOI: 10.1016/0039-6028(86)90911-8 |
0.329 |
|
1984 |
Pohl DW, Denk W, Lanz M. Optical stethoscopy: Image recording with resolution λ/20 Applied Physics Letters. 44: 651-653. DOI: 10.1063/1.94865 |
0.507 |
|
1979 |
Pohl DW. Forced Rayleigh scattering Ibm Journal of Research and Development. 23: 604-614. DOI: 10.1147/Rd.235.0604 |
0.346 |
|
1979 |
Pohl DW. Anomalies in the Forced Rayleigh Scattering in Glasses Physical Review Letters. 43: 143-146. DOI: 10.1103/Physrevlett.43.143 |
0.3 |
|
1975 |
Pohl DW, Jaggi R, Gisler K, Weibel H. Optical and electrical properties of metallic SmS films Solid State Communications. 17: 705-708. DOI: 10.1016/0038-1098(75)90390-7 |
0.332 |
|
1974 |
Pohl D. Stacked optical memories. Applied Optics. 13: 341-346. PMID 20125985 DOI: 10.1364/Ao.13.000341 |
0.336 |
|
1974 |
Pohl DW, Badertscher R, Müller KA, Wachter P. Laser-Induced Phase Transition in the Surface of SmS Crystals. Applied Optics. 13: 95-7. PMID 20125926 DOI: 10.1364/Ao.13.000095 |
0.326 |
|
1974 |
McNelly T, Pohl D. Multiphonon Optical Spectrum of NaF Physical Review Letters. 32: 1305-1308. DOI: 10.1103/Physrevlett.32.1305 |
0.478 |
|
1973 |
Pohl DW, Schwarz SE. Thermo- and elasto-optic parameters of NaF and their implications for light scattering from second sound Physical Review B. 7: 2735-2739. DOI: 10.1103/Physrevb.7.2735 |
0.426 |
|
1870 |
Dürig U, Züger O, Pohl DW. Force sensing in scanning tunnelling microscopy: Observation of adhesion forces on clean metal surfaces Journal of Microscopy. 152: 259-267. DOI: 10.1111/J.1365-2818.1988.Tb01387.X |
0.308 |
|
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