Year |
Citation |
Score |
1998 |
Liu CH, Barzilai AM, Reynolds JK, Partridge A, Kenny TW, Grade JD, Rockstad HK. Characterization of a high-sensitivity micromachined tunneling accelerometer with micro-g resolution Journal of Microelectromechanical Systems. 7: 235-243. DOI: 10.1109/84.679388 |
0.717 |
|
1998 |
Barzilai A, VanZandt T, Kenny T. Technique for measurement of the noise of a sensor in the presence of large background signals Review of Scientific Instruments. 69: 2767-2772. DOI: 10.1063/1.1149013 |
0.661 |
|
1998 |
Barzilai A, Vanzandt T, Kenny T. Technique for measurement of the noise of a sensor in the presence of large background signals Review of Scientific Instruments. 69: 2767-2772. |
0.454 |
|
1998 |
Barzilai A, VanZandt T, Kenny T. Improving the performance of a geophone through capacitive position sensing and feedback American Society of Mechanical Engineers, Dynamic Systems and Control Division (Publication) Dsc. 64: 629-636. |
0.439 |
|
1997 |
Grade J, Barzilai A, Reynolds JK, Liu C, Partridge A, Jerman H, Kenny T. Wafer-scale processing, assembly, and testing of tunneling infrared detectors Sensors. 2: 1241-1244. DOI: 10.1109/Sensor.1997.635453 |
0.763 |
|
1997 |
Grade J, Barzilai A, Reynolds JK, Liu C, Partridge A, Miller LM, Podosek JA, Kenny T. Low frequency drift in tunnel sensors Sensors. 2: 871-874. DOI: 10.1109/Sensor.1997.635240 |
0.776 |
|
1997 |
Liu CH, Grade JD, Barzilai AM, Reynolds JK, Partridge A, Rockstad HK, Kenny TW. Characterization of a high-sensitivity micromachined tunneling accelerometer Sensors. 1: 471-472. DOI: 10.1109/Sensor.1997.613688 |
0.751 |
|
1997 |
Liu CH, Reynolds JK, Partridge A, Grade JD, Barzilai AM, Kenny TW, Rockstad HK. A high-sensitivity micromachined accelerometer based on electron tunneling transducers American Society of Mechanical Engineers, Dynamic Systems and Control Division (Publication) Dsc. 62: 13-20. |
0.754 |
|
1997 |
Grade J, Barzilai A, Reynolds JK, Liu CH, Partridge A, Miller LM, Podosek JA, Kenny T. Low frequency drift in tunnel sensors International Conference On Solid-State Sensors and Actuators, Proceedings. 2: 871-874. |
0.764 |
|
1997 |
Grade J, Barzilai A, Reynolds JK, Liu CH, Partridge A, Jerman H, Kenny T. Wafer-scale processing, assembly, and testing of tunneling infrared detectors International Conference On Solid-State Sensors and Actuators, Proceedings. 2: 1241-1244. |
0.754 |
|
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