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Xiaohai Xiang, Ph.D. - Publications

Affiliations: 
2004 University of Delaware, Newark, DE, United States 
Area:
Condensed Matter Physics, Electricity and Magnetism Physics
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5 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2004 Shen F, Zhu T, Xiang X, Xiao JQ, Zhang Z. An investigation of barrier/electrode interfaces and their related influence on tunnelling magnetoresistance using electron holography Journal of Physics D: Applied Physics. 37: 1515-1519. DOI: 10.1088/0022-3727/37/11/001  0.517
2003 Zhu T, Xiang X, Xiao JQ. Bias dependence of tunneling magnetoresistance on ferromagnetic electrode thickness Applied Physics Letters. 82: 2676-2678. DOI: 10.1063/1.1568542  0.513
2003 Shen F, Zhu T, Xiang X, Xiao JQ, Zhang Z. Study on the barriers in magnetic tunnel junctions by electron holography Microscopy and Microanalysis. 9: 312-313. DOI: 10.1017/S1431927603441561  0.486
2002 Zhu T, Xiang X, Shen F, Zhang Z, Landry G, Dimitrov DV, García N, Xiao JQ. Bulk contributions to tunnel magnetoresistance in magnetic tunnel junctions Physical Review B. 66. DOI: 10.1103/Physrevb.66.094423  0.527
2001 Landry G, Xiang X, Du J, Xiao JQ. Interfacial capacitance effects in magnetic tunneling junctions Journal of Magnetism and Magnetic Materials. 226: 920-921. DOI: 10.1063/1.1336816  0.512
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