☰

Shinichiro Muramoto, Ph.D. - Publications

Affiliations: 
2011 University of Washington, Seattle, Seattle, WA 
Area:
Chemical Engineering
Tree Info Similar researchers PubMed Report error

9 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Muramoto S, Rading D, Bush B, Gillen G, Castner DG. Low-temperature plasma for compositional depth profiling of crosslinking organic multilayers: comparison with C60 and giant argon gas cluster sources. Rapid Communications in Mass Spectrometry : Rcm. 28: 1971-8. PMID 25132297 DOI: 10.1002/Rcm.6981  0.46
2013 Brison J, Robinson MA, Benoit DS, Muramoto S, Stayton PS, Castner DG. TOF-SIMS 3D imaging of native and non-native species within HeLa cells. Analytical Chemistry. 85: 10869-77. PMID 24131300 DOI: 10.1021/Ac402288D  0.535
2012 Muramoto S, Brison J, Castner DG. Exploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi n and C 60 ions in organic films Analytical Chemistry. 84: 365-372. PMID 22084828 DOI: 10.1021/Ac202713K  0.524
2011 Muramoto S, Graham DJ, Wagner MS, Lee TG, Moon DW, Castner DG. ToF-SIMS Analysis of Adsorbed Proteins: Principal Component Analysis of the Primary Ion Species Effect on the Protein Fragmentation Patterns. The Journal of Physical Chemistry. C, Nanomaterials and Interfaces. 115: 24247-24255. PMID 22308191 DOI: 10.1021/Jp208035X  0.567
2011 Brison J, Benoit DS, Muramoto S, Robinson M, Stayton PS, Castner DG. ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine. Surface and Interface Analysis : Sia. 43: 354-357. PMID 22058579 DOI: 10.1002/Sia.3415  0.553
2011 Muramoto S, Brison J, Castner DG. ToF-SIMS depth profiling of trehalose: The effect of analysis beam dose on the quality of depth profiles Surface and Interface Analysis. 43: 58-61. DOI: 10.1002/sia.3479  0.464
2011 Brison J, Benoit DSW, Muramoto S, Robinson M, Stayton PS, Castner DG. ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine Surface and Interface Analysis. 43: 354-357. DOI: 10.1002/sia.3415  0.451
2010 Brison J, Muramoto S, Castner DG. ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam Analysis. The Journal of Physical Chemistry. C, Nanomaterials and Interfaces. 114: 5565-5573. PMID 20383274 DOI: 10.1021/Jp9066179  0.497
2010 Brison J, Muramoto S, Castner DG. ToF-SIMS depth profiling of organic films: A comparison between single-beam and dual-beam analysis Journal of Physical Chemistry C. 114: 5565-5573. DOI: 10.1021/jp9066179  0.471
Show low-probability matches.