Praveen K. Srirama, Ph.D. - Publications

Affiliations: 
2007 University of Arkansas at Little Rock, USA 
Area:
Electronics and Electrical Engineering, Atmospheric Sciences, Optics Physics

15 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Srirama PK, Wallis CD, Lee D, Wexler AS. Imaging extra-thoracic airways and deposited particles in laboratory animals Journal of Aerosol Science. 45: 40-49. DOI: 10.1016/J.Jaerosci.2011.10.007  0.422
2010 Mazumder M, Srirama PK, Sharma R, Biris AS, Hidetaka I, Trigwell S, Horenstein MN. Lunar and Martian Dust Dynamics Ieee Industry Applications Magazine. 16: 14-21. DOI: 10.1109/Mias.2010.936969  0.459
2008 Sharma R, Clark DW, Srirama PK, Mazumder MK. Tribocharging characteristics of the Mars dust simulant (JSC Mars-1) Ieee Transactions On Industry Applications. 44: 32-39. DOI: 10.1109/Tia.2007.912761  0.654
2008 Saini D, Trigwell S, Srirama PK, Sims RA, Sharma R, Biris AS, Mazumder MK. Portable free-fall electrostatic separator for beneficiation of charged particulate materials Particulate Science and Technology. 26: 349-360. DOI: 10.1080/02726350802084200  0.623
2007 Saini D, Biris AS, Srirama PK, Mazumder MK. Particle size and charge distribution analysis of pharmaceutical aerosols generated by inhalers. Pharmaceutical Development and Technology. 12: 35-41. PMID 17484142 DOI: 10.1080/10837450601166536  0.698
2007 Zhang J, Srirama PK, Mazumder MK. E-SPART analyzer for Mars mission: A new approach in signal processing and sampling Ieee Transactions On Industry Applications. 43: 1084-1090. DOI: 10.1109/Tia.2007.900475  0.603
2007 Zhang J, Srirama PK, Sharma R, Mazumder MK. In-situ measurements of particle size and charge distributions for Mars and Lunar missions Conference Record - Ias Annual Meeting (Ieee Industry Applications Society). 427-433.  0.684
2007 Srirama PK, Stark JW, Zhang J, Mazumder MK. Non-contact measurements of size and charge distributions of submicron particles using an ESPART analyzer Conference Record - Ias Annual Meeting (Ieee Industry Applications Society). 424-426.  0.702
2007 Mazumder MK, Robison J, Wyatt C, Srirama PK, Sharma R, Zhang J, Biris AS. Electrohydrodynamic dispersion of dry fine powders Conference Record - Ias Annual Meeting (Ieee Industry Applications Society). 28-31.  0.584
2006 Zhang J, Srirama PK, Wu N, Mazumder MK. E-spart analyzer based on a stationary-fringe LDV Iecon Proceedings (Industrial Electronics Conference). 3074-3077. DOI: 10.1109/IECON.2006.347787  0.548
2006 Mazumder MK, Sims RA, Biris AS, Srirama PK, Saini D, Yurteri CU, Trigwell S, De S, Sharma R. Twenty-first century research needs in electrostatic processes applied to industry and medicine Chemical Engineering Science. 61: 2192-2211. DOI: 10.1016/J.Ces.2005.05.002  0.64
2005 Johnson CE, Srirama PK, Sharma R, Pruessner K, Zhang J, Mazumder MK. Effect of particle size distribution on the performance of electrodynamic screens Conference Record - Ias Annual Meeting (Ieee Industry Applications Society). 1: 341-345. DOI: 10.1109/IAS.2005.1518330  0.626
2005 Mazumder MK, Calle CI, Pruessner K, Sharma R, Srirama PK, Ali M, Immer C, Trigwell S, Sidney Clements J, Biris AS, Mantovani J, Chen A. Research needs in electrostatics for lunar and mars space missions Conference Record - Ias Annual Meeting (Ieee Industry Applications Society). 1: 327-333. DOI: 10.1109/IAS.2005.1518328  0.625
2004 Srirama PK, Mazumder MK. Measurement of charge distribution of highly charged particles by E-SPART analyzer Conference Record - Ias Annual Meeting (Ieee Industry Applications Society). 2: 1280-1282.  0.699
2004 Biris AS, Saini D, Srirama PK, Mazumder MK, Sims RA, Calle CI, Buhler CR. Electrodynamic removal of contaminant particles and its applications Conference Record - Ias Annual Meeting (Ieee Industry Applications Society). 2: 1283-1286.  0.666
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