Year |
Citation |
Score |
2007 |
Sahin O, Magonov S, Su C, Quate CF, Solgaard O. An atomic force microscope tip designed to measure time-varying nanomechanical forces. Nature Nanotechnology. 2: 507-14. PMID 18654349 DOI: 10.1038/Nnano.2007.226 |
0.434 |
|
2007 |
Khuri-Yakub BT, Park KK, Lee HJ, Yaralioglu GG, Ergun S, Oralkan O, Kupnik M, Quate CF, Braun T, Lang HP, Hegner M, Ramseyer JP, Gerber C, Gimzewski J. The capactive micromachined ultrasonic transducer (CMUT) as a chem/bio sensor Proceedings - Ieee Ultrasonics Symposium. 472-475. DOI: 10.1109/ULTSYM.2007.127 |
0.473 |
|
2007 |
Park KK, Lee HJ, Yaralioglu GG, Ergun AS, Oralkan O, Kupnik M, Quate CF, Khuri-Yakub BT, Braun T, Ramseyer JP, Lang HP, Hegner M, Gerber C, Gimzewski JK. Capacitive micromachined ultrasonic transducers for chemical detection in nitrogen Applied Physics Letters. 91. DOI: 10.1063/1.2776348 |
0.513 |
|
2006 |
Zhang X, Scott MP, Quate CF, Solgaard O. Microoptical characterization of piezoelectric vibratory microinjections in Drosophila embryos for genome-wide RNAi screen Journal of Microelectromechanical Systems. 15: 277-286. DOI: 10.1109/Jmems.2006.872242 |
0.38 |
|
2006 |
Giessibl FJ, Quate CF. Exploring the nanoworld with atomic force microscopy Physics Today. 59: 44-50. DOI: 10.1063/1.2435681 |
0.426 |
|
2006 |
Onaran AG, Balantekin M, Lee W, Hughes WL, Buchine BA, Guldiken RO, Parlak Z, Quate CF, Degertekin FL. A new atomic force microscope probe with force sensing integrated readout and active tip Review of Scientific Instruments. 77. DOI: 10.1063/1.2166469 |
0.477 |
|
2005 |
Hembacher S, Giessibl FJ, Mannhart J, Quate CF. Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite Physical Review Letters. 94. DOI: 10.1103/Physrevlett.94.056101 |
0.455 |
|
2005 |
Degertekin FL, Onaran AG, Balantekin M, Lee W, Hall NA, Quate CF. Sensor for direct measurement of interaction forces in probe microscopy Applied Physics Letters. 87: 1-3. DOI: 10.1063/1.2136430 |
0.402 |
|
2005 |
Sahin O, Quate CF, Solgaard O. Mechanical nonlinear generation with coupled torsional harmonic cantilevers for sensitive and quantitative atomic force microscopy of material characteristics 2005 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2005 Technical Proceedings. 663-666. |
0.306 |
|
2004 |
Sahin O, Quate CF, Solgaard O, Atalar A. Resonant harmonic response in tapping-mode atomic force microscopy Physical Review B - Condensed Matter and Materials Physics. 69. DOI: 10.1103/Physrevb.69.165416 |
0.622 |
|
2004 |
Sahin O, Yaralioglu G, Grow R, Zappe SF, Atalar A, Quate C, Solgaard O. High-resolution imaging of elastic properties using harmonic cantilevers Sensors and Actuators, a: Physical. 114: 183-190. DOI: 10.1016/J.Sna.2003.11.031 |
0.667 |
|
2003 |
Hembacher S, Giessibl FJ, Mannhart J, Quate CF. Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proceedings of the National Academy of Sciences of the United States of America. 100: 12539-42. PMID 14504395 DOI: 10.1073/Pnas.2134173100 |
0.418 |
|
2003 |
Crozier KB, Sundaramurthy A, Kino GS, Quate CF. Publisher’s Note: “Optical antennas: Resonators for local field enhancement” [J. Appl. Phys. 94, 4632 (2003)] Journal of Applied Physics. 94: 7950. DOI: 10.1063/1.1626674 |
0.479 |
|
2003 |
Crozier KB, Sundaramurthy A, Kino GS, Quate CF. Optical antennas: Resonators for local field enhancement Journal of Applied Physics. 94: 4632-4642. DOI: 10.1063/1.1602956 |
0.521 |
|
2003 |
Crozier KB, Sundaramurthy A, Kino GS, Quate CF, Fromm DP, Moerner WE. Field enhancement and resonance in optical antennas Conference On Quantum Electronics and Laser Science (Qels) - Technical Digest Series. 89: QTUD3/1-QTUD3/2. |
0.443 |
|
2002 |
Chow EM, Chandrasekaran V, Partridge A, Nishida T, Sheplak M, Quate CF, Kenny TW. Process compatible polysilicon-based electrical through-wafer interconnects in silicon substrates Journal of Microelectromechanical Systems. 11: 631-640. DOI: 10.1109/Jmems.2002.805206 |
0.339 |
|
2002 |
Crozier KB, Fletcher DA, Kino GS, Quate CF. Micromachined silicon nitride solid immersion lens Journal of Microelectromechanical Systems. 11: 470-478. DOI: 10.1109/Jmems.2002.803282 |
0.609 |
|
2002 |
Grow RJ, Minne SC, Manalis SR, Quate CF. Silicon nitride cantilevers with oxidation-sharpened silicon tips for atomic force microscopy Journal of Microelectromechanical Systems. 11: 317-321. DOI: 10.1109/Jmems.2002.800924 |
0.689 |
|
2002 |
Sulchek T, Yaralioglu GG, Quate CF, Minne SC. Characterization and optimization of scan speed for tapping-mode atomic force microscopy Review of Scientific Instruments. 73: 2928. DOI: 10.1063/1.1488679 |
0.658 |
|
2002 |
Chow EM, Yaralioglu GG, Quate CF, Kenny TW. Characterization of a two-dimensional cantilever array with through-wafer electrical interconnects Applied Physics Letters. 80: 664-666. DOI: 10.1063/1.1435804 |
0.468 |
|
2002 |
Onaran AG, Degertekin FL, Hadimioglu B, Sulchek T, Quate CF. Actuation of atomic force microscope cantilevers in fluids using acoustic radiation pressure Proceedings of the Ieee Micro Electro Mechanical Systems (Mems). 356-359. |
0.305 |
|
2001 |
Sulchek T, Hsieh R, Minne SC, Quate CF, Manalis SR. Interdigital cantilever as a biological sensor Proceedings of the Ieee Conference On Nanotechnology. 2001: 562-566. DOI: 10.1109/NANO.2001.966485 |
0.682 |
|
2001 |
Crozier KB, Sundaramurthy A, Fletcher DA, Kino GS, Quate CF. Nearfield optics with solid immersion lenses and sharp metal probes Proceedings of the Ieee Conference On Nanotechnology. 2001: 501-506. DOI: 10.1109/NANO.2001.966474 |
0.462 |
|
2001 |
Fletcher DA, Crozier KB, Guarini KW, Minne SC, Kino GS, Quate CF, Goodson KE. Microfabricated silicon solid immersion lens Journal of Microelectromechanical Systems. 10: 450-459. DOI: 10.1109/84.946806 |
0.598 |
|
2001 |
Fletcher DA, Crozier KB, Quate CF, Kino GS, Goodson KE, Simanovskii D, Palanker DV. Refraction contrast imaging with a scanning microlens Applied Physics Letters. 78: 3589-3591. DOI: 10.1063/1.1377318 |
0.583 |
|
2001 |
Degertekin FL, Hadimioglu B, Sulchek T, Quate CF. Actuation and characterization of atomic force microscope cantilevers in fluids by acoustic radiation pressure Applied Physics Letters. 78: 1628-1630. DOI: 10.1063/1.1354157 |
0.656 |
|
2001 |
Sulchek T, Grow RJ, Yaralioglu GG, Minne SC, Quate CF, Manalis SR, Kiraz A, Aydine A, Atalar A. Parallel atomic force microscopy with optical interferometric detection Applied Physics Letters. 78: 1787-1789. DOI: 10.1063/1.1352697 |
0.817 |
|
2001 |
Matsumoto K, Kinosita S, Gotoh Y, Uchiyama T, Manalis S, Quate C. Ultralow biased field emitter using single-wall carbon nanotube directly grown onto silicon tip by thermal chemical vapor deposition Applied Physics Letters. 78: 539-540. DOI: 10.1063/1.1343470 |
0.604 |
|
2001 |
Onaran AG, Degertekin FL, Hadimioglu B, Sulchek T, Quate CF. Actuation of atomic force microscope cantilevers by acoustic radiation pressure Proceedings of the Ieee Ultrasonics Symposium. 1: 509-512. |
0.323 |
|
2000 |
Crozier KB, Yaralioglu GG, Degertekin FL, Adams JD, Minne SC, Quate CF. Non-destructive film thickness measurement using atomic force microscopy at ultrasonic frequencies Proceedings of Spie - the International Society For Optical Engineering. 4099: 48-58. DOI: 10.1117/12.405835 |
0.523 |
|
2000 |
Gotoh Y, Matsumoto K, Maeda T, Cooper EB, Manalis SR, Fang H, Minne SC, Hunt T, Dai H, Harris J, Quate CF. Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 18: 1321-1325. DOI: 10.1116/1.582347 |
0.657 |
|
2000 |
Yaralioglu GG, Degertekin FL, Crozier KB, Quate CF. Contact stiffness of layered materials for ultrasonic atomic force microscopy Journal of Applied Physics. 87: 7491-7496. DOI: 10.1063/1.373014 |
0.559 |
|
2000 |
Fletcher DA, Crozier KB, Quate CF, Kino GS, Goodson KE, Simanovskii D, Palanker DV. Near-field infrared imaging with a microfabricated solid immersion lens Applied Physics Letters. 77: 2109-2111. DOI: 10.1063/1.1313368 |
0.6 |
|
2000 |
Cooper EB, Post ER, Griffith S, Levitan J, Manalis SR, Schmidt MA, Quate CF. High-resolution micromachined interferometric accelerometer Applied Physics Letters. 76: 3316-3318. DOI: 10.1063/1.126637 |
0.619 |
|
2000 |
Crozier KB, Yaralioglu GG, Degertekin FL, Adams JD, Minne SC, Quate CF. Thin film characterization by atomic force microscopy at ultrasonic frequencies Applied Physics Letters. 76: 1950-1952. DOI: 10.1063/1.126222 |
0.588 |
|
2000 |
Sulchek T, Hsieh R, Adams JD, Yaralioglu GG, Minne SC, Quate CF, Cleveland JP, Atalar A, Adderton DM. High-speed tapping mode imaging with active Q control for atomic force microscopy Applied Physics Letters. 76: 1473-1475. DOI: 10.1063/1.126071 |
0.759 |
|
2000 |
Manalis SR, Cooper EB, Indermuhle PF, Kernen P, Wagner P, Hafeman DG, Minne SC, Quate CF. Microvolume field-effect pH sensor for the scanning probe microscope Applied Physics Letters. 76: 1072-1074. DOI: 10.1063/1.125942 |
0.611 |
|
2000 |
Sulchek T, Hsieh R, Adams JD, Minne SC, Quate CF, Adderton DM. High-speed atomic force microscopy in liquid Review of Scientific Instruments. 71: 2097-2099. DOI: 10.1063/1.1150586 |
0.679 |
|
2000 |
Chow EM, Soh HT, Lee HC, Adams JD, Minne SC, Yaralioglu G, Atalar A, Quate CF, Kenny TW. Integration of through-wafer interconnects with a two-dimensional cantilever array Sensors and Actuators, a: Physical. 83: 118-123. DOI: 10.1016/S0924-4247(99)00381-7 |
0.724 |
|
2000 |
Sulchek T, Hsieh R, Adams JD, Minne SC, Quate CF, Adderton DM. High-speed atomic force microscopy in liquid Review of Scientific Instruments. 71: 2097-2099. |
0.354 |
|
2000 |
Sulchek T, Hsieh R, Adams JD, Yaralioglu GG, Minne SC, Quate CF, Cleveland JP, Atalar A, Adderton DM. High-speed tapping mode imaging with active Q control for atomic force microscopy Applied Physics Letters. 76: 1473-1475. |
0.328 |
|
2000 |
Fletcher DA, Crozier KB, Goodson KE, Quate CF, Kino GS. Optical characterization of microfabricated solid immersion lenses Proceedings of Spie - the International Society For Optical Engineering. 3919: 100-108. |
0.457 |
|
1999 |
Soh HT, Yue CP, McCarthy A, Ryu C, Lee TH, Wong SS, Quate CF. Ultra-Low Resistance, Through-Wafer Via (TWV) Technology and Its Applications in Three Dimensional Structures on Silicon Japanese Journal of Applied Physics. 38: 2393-2396. DOI: 10.1143/Jjap.38.2393 |
0.608 |
|
1999 |
Wilder K, Quate CF. Scanning probe lithography using a cantilever with integrated transistor for on-chip control of the exposing current Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 17: 3256-3261. DOI: 10.1116/1.590992 |
0.348 |
|
1999 |
Cooper EB, Manalis SR, Fang H, Dai H, Matsumoto K, Minne SC, Hunt T, Quate CF. Terabit-per-square-inch data storage with the atomic force microscope Applied Physics Letters. 75: 3566-3568. DOI: 10.1063/1.125390 |
0.433 |
|
1999 |
Sulchek T, Minne SC, Adams JD, Fletcher DA, Atalar A, Quate CF, Adderton DM. Dual integrated actuators for extended range high speed atomic force microscopy Applied Physics Letters. 75: 1637-1639. DOI: 10.1063/1.124779 |
0.762 |
|
1999 |
Soh HT, Quate CF, Morpurgo AF, Marcus CM, Kong J, Dai H. Integrated nanotube circuits: Controlled growth and ohmic contacting of single-walled carbon nanotubes Applied Physics Letters. 75: 627-629. DOI: 10.1063/1.124462 |
0.602 |
|
1999 |
Ghislain LP, Elings VB, Crozier KB, Manalis SR, Minne SC, Wilder K, Kino GS, Quate CF. Near-field photolithography with a solid immersion lens Applied Physics Letters. 74: 501-503. DOI: 10.1063/1.123168 |
0.601 |
|
1999 |
Ghislain LP, Elings VB, Crozier KB, Manalis SR, Minne SC, Wilder K, Kino GS, Quate CF. Near-field photolithography with a solid immersion lens Applied Physics Letters. 74: 501-503. DOI: 10.1063/1.123168 |
0.631 |
|
1999 |
Wilder K, Soh HT, Atalar A, Quate CF. Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes Review of Scientific Instruments. 70: 2822-2827. DOI: 10.1063/1.1149802 |
0.592 |
|
1999 |
Wilder K, Soh HT, Atalar A, Quate CF. Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes Review of Scientific Instruments. 70: 2822-2827. DOI: 10.1063/1.1149802 |
0.68 |
|
1999 |
Tully DC, Trimble AR, Fréchet JMJ, Wilder K, Quate CF. Synthesis and preparation of ionically bound dendrimer monolayers and application toward scanning probe lithography Chemistry of Materials. 11: 2892-2898. DOI: 10.1021/Cm990255F |
0.333 |
|
1999 |
Lutwyche M, Andreoli C, Binnig G, Brugger J, Drechsler U, Häberle W, Rohrer H, Rothuizen H, Vettiger P, Yaralioglu G, Quate C. 5×5 2D AFM cantilever arrays a first step towards a Terabit storage device Sensors and Actuators, a: Physical. 73: 89-94. DOI: 10.1016/S0924-4247(98)00259-3 |
0.403 |
|
1999 |
Kong J, Zhou C, Morpurgo A, Soh HT, Quate CF, Marcus C, Dai H. Synthesis, integration, and electrical properties of individual single-walled carbon nanotubes Applied Physics a: Materials Science and Processing. 69: 305-308. DOI: 10.1007/S003390051005 |
0.605 |
|
1999 |
Cooper EB, Manalis SR, Fang H, Dai H, Matsumoto K, Minne SC, Hunt T, Quate CF. Terabit-per-square-inch data storage with the atomic force microscope Applied Physics Letters. 75: 3566-3568. |
0.634 |
|
1998 |
Wilder K, Quate CF, Singh B, Kyser DF. Electron beam and scanning probe lithography: A comparison Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 16: 3864-3873. DOI: 10.1116/1.590425 |
0.3 |
|
1998 |
Yaralioglu GG, Atalar A, Manalis SR, Quate CF. Analysis and design of an interdigital cantilever as a displacement sensor Journal of Applied Physics. 83: 7405-7415. DOI: 10.1063/1.367984 |
0.74 |
|
1998 |
Wilder K, Quate CF, Adderton D, Bernstein R, Elings V. Noncontact nanolithography using the atomic force microscope Applied Physics Letters. 73: 2527-2529. DOI: 10.1063/1.122504 |
0.464 |
|
1998 |
Minne SC, Adams JD, Yaralioglu G, Manalis SR, Atalar A, Quate CF. Centimeter scale atomic force microscope imaging and lithography Applied Physics Letters. 73: 1742-1744. DOI: 10.1063/1.122263 |
0.771 |
|
1998 |
Minne SC, Yaralioglu G, Manalis SR, Adams JD, Zesch J, Atalar A, Quate CF. Automated parallel high-speed atomic force microscopy Applied Physics Letters. 72: 2340-2342. DOI: 10.1063/1.121353 |
0.763 |
|
1998 |
Kong J, Soh HT, Cassell AM, Quate CF, Dai H. Synthesis of individual single-walled carbon nanotubes on patterned silicon wafers Nature. 395: 878-881. DOI: 10.1038/27632 |
0.633 |
|
1997 |
Wilder K, Soh HT, Atalar A, Quate CF. Hybrid atomic force/scanning tunneling lithography Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 15: 1811-1817. DOI: 10.1116/1.589530 |
0.683 |
|
1997 |
Manalis SR, Minne SC, Quate CF, Yaralioglu GG, Atalar A. Two-dimensional micromechanical bimorph arrays for detection of thermal radiation Applied Physics Letters. 70: 3311-3313. DOI: 10.1063/1.119147 |
0.721 |
|
1997 |
Quate CF. Scanning probes as a lithography tool for nanostructures Surface Science. 386: 259-264. DOI: 10.1016/S0039-6028(97)00305-1 |
0.344 |
|
1996 |
Wilder K, Quate CF, Singh B, Alvis R, Arnold WH. Atomic force microscopy for cross section inspection and metrology Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 14: 4004-4008. DOI: 10.1116/1.588632 |
0.424 |
|
1996 |
Manalis SR, Minne SC, Atalar A, Quate CF. Interdigital cantilevers for atomic force microscopy Applied Physics Letters. 69: 3944-3946. DOI: 10.1063/1.117578 |
0.776 |
|
1996 |
Soh HT, Ladabaum I, Atalar A, Quate CF, Khuri-Yakub BT. Silicon micromachined ultrasonic immersion transducers Applied Physics Letters. 69: 3674-3676. DOI: 10.1063/1.117185 |
0.626 |
|
1996 |
Soh HT, Ladabaum I, Atalar A, Quate CF, Khuri‐Yakub BT. Silicon micromachined ultrasonic immersion transducers Applied Physics Letters. 69: 3674-3676. DOI: 10.1063/1.117185 |
0.705 |
|
1996 |
Manalis SR, Minne SC, Quate CF. Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor Applied Physics Letters. 68: 871-873. DOI: 10.1063/1.116528 |
0.686 |
|
1996 |
Minne SC, Manalis SR, Atalar A, Quate CF. Contact imaging in the atomic force microscope using a higher order flexural mode combined with a new sensor Applied Physics Letters. 68: 1427-1429. DOI: 10.1063/1.116102 |
0.76 |
|
1996 |
Manalis SR, Minne SC, Atalar A, Quate CF. High-speed atomic force microscopy using an integrated actuator and optical lever detection Review of Scientific Instruments. 67: 3294-3297. DOI: 10.1063/1.1147410 |
0.777 |
|
1995 |
Minne SC, Flueckiger P, Soh HT, Quate CF. Atomic force microscope lithography using amorphous silicon as a resist and advances in parallel operation Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 13: 1380-1385. DOI: 10.1116/1.587857 |
0.685 |
|
1995 |
Minne SC, Manalis SR, Quate CF. Parallel atomic force microscopy using cantilevers with integrated piezoresistive sensors and integrated piezoelectric actuators Applied Physics Letters. 67: 3918. DOI: 10.1063/1.115317 |
0.681 |
|
1995 |
Park SW, Soh HT, Quate CF, Park SI. Nanometer scale lithography at high scanning speeds with the atomic force microscope using spin on glass Applied Physics Letters. 67: 2415. DOI: 10.1063/1.114565 |
0.659 |
|
1995 |
Minne SC, Soh HT, Flueckiger P, Quate CF. Fabrication of 0.1 μm metal oxide semiconductor field-effect transistors with the atomic force microscope Applied Physics Letters. 703. DOI: 10.1063/1.114105 |
0.647 |
|
1994 |
Quate CF. The AFM as a tool for surface imaging Surface Science. 299: 980-995. DOI: 10.1016/0039-6028(94)90711-0 |
0.408 |
|
1994 |
Yoshikawa SA, Nogami J, Quate CF, Pianetta P. Behavior of tellurium on silicon (100) Surface Science. 321. DOI: 10.1016/0039-6028(94)90172-4 |
0.374 |
|
1993 |
Wigren C, Andersen JN, Nyholm R, Karlsson UO, Nogami J, Baski AA, Quate CF. Adsorption-site determination of ordered Yb on Si(111) surfaces. Physical Review. B, Condensed Matter. 47: 9663-9668. PMID 10005036 DOI: 10.1103/Physrevb.47.9663 |
0.329 |
|
1993 |
Tortonese M, Barrett RC, Quate CF. Atomic resolution with an atomic force microscope using piezoresistive detection Applied Physics Letters. 62: 834-836. DOI: 10.1063/1.108593 |
0.444 |
|
1992 |
Khuri-Yakub BT, Akamine S, Hadimioglu B, Yamada H, Quate CF. Near-field acoustic microscopy (Invited Paper) Proceedings of Spie. 1556: 30-39. DOI: 10.1117/12.134885 |
0.397 |
|
1991 |
Richter M, Woicik JC, Nogami J, Pianetta P, Miyano KE, Baski AA, Kendelewicz T, Bouldin CE, Spicer WE, Quate CF, Lindau I. Erratum: ``Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2×1-Sb'' [Phys. Rev. Lett. 65, 3417 (1990)] Physical Review Letters. 66: 2836. DOI: 10.1103/Physrevlett.66.2836 |
0.313 |
|
1991 |
Barrett RC, Quate CF. Optical scan-correction system applied to atomic force microscopy Review of Scientific Instruments. 62: 1393-1399. DOI: 10.1063/1.1142506 |
0.309 |
|
1991 |
Prater CB, Hansma PK, Tortonese M, Quate CF. Improved scanning ion-conductance microscope using microfabricated probes Review of Scientific Instruments. 62: 2634-2638. DOI: 10.1063/1.1142244 |
0.425 |
|
1991 |
Lang CA, Quate CF, Nogami J. Initial stages of sputtering on Au(111) as seen by scanning tunneling microscopy Applied Physics Letters. 59: 1696-1698. DOI: 10.1063/1.106221 |
0.35 |
|
1991 |
Nogami J, Baski AA, Quate CF. Structure of the Sb-terminated Si(100) surface Applied Physics Letters. 58: 475-477. DOI: 10.1063/1.104612 |
0.344 |
|
1991 |
Penner RM, Heben MJ, Lewis NS, Quate CF. Mechanistic investigations of nanometer-scale lithography at liquid-covered graphite surfaces Applied Physics Letters. 58: 1389-1391. DOI: 10.1063/1.104317 |
0.325 |
|
1991 |
Quate CF. Switch to atom control Nature. 352: 571. DOI: 10.1038/352571A0 |
0.306 |
|
1991 |
Tortonese M, Yamada H, Barrett RC, Quate CF. Atomic force microscopy using a piezoresistive cantilever Transducers '91. 448-451. |
0.363 |
|
1990 |
Richter M, Woicik JC, Nogami J, Pianetta P, Miyano KE, Baski AA, Kendelewicz T, Bouldin CE, Spicer WE, Quate CF, Lindau I. Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2 x 1-Sb. Physical Review Letters. 65: 3417-3420. PMID 10042866 DOI: 10.1103/Physrevlett.65.3417 |
0.33 |
|
1990 |
Baski AA, Nogami J, Quate CF. Si(111)-5 x 1-Au reconstruction as studied by scanning tunneling microscopy. Physical Review. B, Condensed Matter. 41: 10247-10249. PMID 9993426 DOI: 10.1103/Physrevb.41.10247 |
0.335 |
|
1990 |
Albrecht TR, Akamine S, Zdeblick MJ, Quate CF. Microfabrication of integrated scanning tunneling microscope Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 317-318. DOI: 10.1116/1.577096 |
0.42 |
|
1990 |
Albrecht TR, Akamine S, Carver TE, Quate CF. Microfabrication of cantilever styli for the atomic force microscope Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 3386-3396. DOI: 10.1116/1.576520 |
0.457 |
|
1990 |
Nogami J, Baski AA, Quate CF. Behavior of gallium on vicinal Si(100) surfaces Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 3520-3523. DOI: 10.1116/1.576500 |
0.331 |
|
1990 |
Barrett RC, Quate CF. Imaging polished sapphire with atomic force microscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 400-402. DOI: 10.1116/1.576406 |
0.349 |
|
1990 |
Gould SAC, Massie J, Northern BD, Stoeckenius W, Albrecht TR, Drake B, Longmire M, Mukergee B, Quate CF, Prater CB, Elings V, Peterson CM, Weisenhorn AL, Manne S, Hansma HG, et al. From atoms to integrated circuit chips, blood cells, and bacteria with the atomic force microscope Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 369-373. DOI: 10.1116/1.576398 |
0.446 |
|
1990 |
Akamine S, Barrett RC, Quate CF. Improved atomic force microscope images using microcantilevers with sharp tips Applied Physics Letters. 57: 316-318. DOI: 10.1063/1.103677 |
0.485 |
|
1990 |
Barrett RC, Nogami J, Quate CF. Charge density waves of 1T-TaS2 imaged by atomic force microscopy Applied Physics Letters. 57: 992-994. DOI: 10.1063/1.103535 |
0.43 |
|
1990 |
Akamine S, Albrecht TR, Zdeblick MJ, Quate CF. A planar process for microfabrication of a scanning tunneling microscope Sensors and Actuators: a. Physical. 23: 964-970. DOI: 10.1016/0924-4247(90)87070-Y |
0.439 |
|
1990 |
Quate CF. Imaging with the tunneling and force microscopes Proceedings. Ieee Micro Electro Mechanical Systems-An Investigation of Micro Structures, Sensors, Actuators, Machines. 188-191. |
0.32 |
|
1989 |
Drake B, Prater CB, Weisenhorn AL, Gould SA, Albrecht TR, Quate CF, Cannell DS, Hansma HG, Hansma PK. Imaging crystals, polymers, and processes in water with the atomic force microscope. Science (New York, N.Y.). 243: 1586-9. PMID 2928794 DOI: 10.1126/Science.2928794 |
0.314 |
|
1989 |
Nogami J, Park SI, Quate CF. Structure of submonolayers of tin on Si(111) studied by scanning tunneling microscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 7: 1919-1921. DOI: 10.1116/1.576029 |
0.323 |
|
1989 |
Akamine S, Albrecht TR, Zdeblick MJ, Quate CF. Microfabricated Scanning Tunneling Microscope Ieee Electron Device Letters. 10: 490-492. DOI: 10.1109/55.43113 |
0.413 |
|
1989 |
Emch R, Nogami J, Dovek MM, Lang CA, Quate CF. Characterization of gold surfaces for use as substrates in scanning tunneling microscopy studies Journal of Applied Physics. 65: 79-84. DOI: 10.1063/1.343379 |
0.338 |
|
1989 |
Elrod SA, Hadimioglu B, Khuri-Yakub BT, Rawson EG, Richley E, Quate CF, Mansour NN, Lundgren TS. Nozzleless droplet formation with focused acoustic beams Journal of Applied Physics. 65: 3441-3447. DOI: 10.1063/1.342663 |
0.513 |
|
1989 |
Albrecht TR, Dovek MM, Kirk MD, Lang CA, Quate CF, Smith DPE. Nanometer-scale hole formation on graphite using a scanning tunneling microscope Applied Physics Letters. 55: 1727-1729. DOI: 10.1063/1.102201 |
0.334 |
|
1989 |
Heben MJ, Penner RM, Lewis NS, Dovek MM, Quate CF. Atomic resolution imaging of electrode surfaces in solutions containing reversible redox species Applied Physics Letters. 54: 1421-1423. DOI: 10.1063/1.100686 |
0.346 |
|
1989 |
Lang CA, Dovek MM, Nogami J, Quate CF. Au(111) Autoepitaxy studied by scanning tunneling microscopy Surface Science. 224: L947-L955. DOI: 10.1016/0039-6028(89)90889-3 |
0.301 |
|
1988 |
Kirk MD, Nogami J, Baski AA, Mitzi DB, Kapitulnik A, Geballe TH, Quate CF. The Origin of the Superstructure in Bi2Sr2CaCu2O8+dgr as Revealed by Scanning Tunneling Microscopy. Science (New York, N.Y.). 242: 1673-5. PMID 17730577 DOI: 10.1126/Science.242.4886.1673 |
0.408 |
|
1988 |
Park Si, Nogami J, Mizes HA, Quate CF. Chemical dependence of the multiple-tip effect in scanning tunneling microscopy. Physical Review. B, Condensed Matter. 38: 4269-4272. PMID 9946802 DOI: 10.1103/Physrevb.38.4269 |
0.35 |
|
1988 |
Marti O, Ribi HO, Drake B, Albrecht TR, Quate CF, Hansma PK. Atomic force microscopy of an organic monolayer. Science (New York, N.Y.). 239: 50-2. PMID 3336773 DOI: 10.1126/Science.3336773 |
0.316 |
|
1988 |
Albrecht TR, Quate CF. Atomic resolution with the atomic force microscope on conductors and nonconductors Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 6: 271-274. DOI: 10.1116/1.575441 |
0.449 |
|
1988 |
Park S‐, Nogami J, Quate CF. Metal‐induced reconstructions of the silicon(111) surface Journal of Microscopy. 152: 727-734. DOI: 10.1111/J.1365-2818.1988.Tb01443.X |
0.328 |
|
1988 |
Heben MJ, Dovek MM, Lewis NS, Penner RM, Quate CF. Preparation of STM tips for in‐situ characterization of electrode surfaces Journal of Microscopy. 152: 651-661. DOI: 10.1111/J.1365-2818.1988.Tb01434.X |
0.359 |
|
1988 |
Emch R, Nogami J, Dovek MM, Lang CA, Quate CF. Characterization and local modification of atomically flat gold surfaces by STM Journal of Microscopy. 152: 129-135. DOI: 10.1111/J.1365-2818.1988.Tb01370.X |
0.373 |
|
1988 |
Kirk MD, Eom CB, Oh B, Spielman SR, Beasley MR, Kapitulnik A, Geballe TH, Quate CF. Scanning tunneling microscopy of the a-b planes of Bi2(Ca,Sr) 3Cu2O8+δ single crystal and thin film Applied Physics Letters. 52: 2071-2073. DOI: 10.1063/1.99750 |
0.324 |
|
1988 |
Albrecht TR, Mizes HA, Nogami J, Park SI, Quate CF. Observation of tilt boundaries in graphite by scanning tunneling microscopy and associated multiple tip effects Applied Physics Letters. 52: 362-364. DOI: 10.1063/1.99465 |
0.313 |
|
1988 |
Albrecht TR, Dovek MM, Lang CA, Grütter P, Quate CF, Kuan SWJ, Frank CW, Pease RFW. Imaging and modification of polymers by scanning tunneling and atomic force microscopy Journal of Applied Physics. 64: 1178-1184. DOI: 10.1063/1.341881 |
0.618 |
|
1988 |
La Comb LJ, Quate CF. Piezodriven scanner for cryogenic applications Review of Scientific Instruments. 59: 1906-1910. DOI: 10.1063/1.1140049 |
0.306 |
|
1988 |
Dovek MM, Heben MJ, Lang CA, Lewis NS, Quate CF. Design of a scanning tunneling microscope for electrochemical applications Review of Scientific Instruments. 59: 2333-2336. DOI: 10.1063/1.1139957 |
0.377 |
|
1988 |
Kirk MD, Albrecht TR, Quate CF. Low-temperature atomic force microscopy Review of Scientific Instruments. 59: 833-835. DOI: 10.1063/1.1139788 |
0.414 |
|
1988 |
Nogami J, Park SI, Quate CF. Behavior of Ga on Si(100) as studied by scanning tunneling microscopy Applied Physics Letters. 53: 2086-2088. DOI: 10.1063/1.100289 |
0.331 |
|
1988 |
Nogami J, Park Si, Quate CF. An STM study of the gallium induced 3 × 3 reconstruction of Si(111) Surface Science. 203. DOI: 10.1016/0039-6028(88)90182-3 |
0.334 |
|
1987 |
Park Si, Nogami J, Quate CF. Effect of tip morphology on images obtained by scanning tunneling microscopy. Physical Review. B, Condensed Matter. 36: 2863-2866. PMID 9943172 DOI: 10.1103/Physrevb.36.2863 |
0.385 |
|
1987 |
Nogami J, Park Si, Quate CF. Indium-induced reconstructions of the Si(111) surface studied by scanning tunneling microscopy. Physical Review. B, Condensed Matter. 36: 6221-6224. PMID 9942323 DOI: 10.1103/Physrevb.36.6221 |
0.325 |
|
1987 |
Smith DPE, Bryant A, Quate CF, Rabe JP, Gerber C, Swalen JD. Images of a lipid bilayer at molecular resolution by scanning tunneling microscopy Proceedings of the National Academy of Sciences of the United States of America. 84: 969-972. PMID 3103128 DOI: 10.1073/Pnas.84.4.969 |
0.332 |
|
1987 |
Carim AH, Dovek MM, Quate CF, Sinclair R, Vorst C. High-resolution electron microscopy and scanning tunneling microscopy of native oxides on silicon Science. 237: 630-633. DOI: 10.1126/Science.237.4815.630 |
0.369 |
|
1987 |
Hadimioglu B, La Comb LJ, Wright DR, Khuri-Yakub BT, Quate CF. High efficiency, multiple layer ZnO acoustic transducers at millimeter-wave frequencies Applied Physics Letters. 50: 1642-1644. DOI: 10.1063/1.97754 |
0.524 |
|
1987 |
Smith DPE, Kirk MD, Quate CF. Molecular images and vibrational spectroscopy of sorbic acid with the scanning tunneling microscope The Journal of Chemical Physics. 86: 6034-6038. DOI: 10.1063/1.452491 |
0.347 |
|
1987 |
Albrecht TR, Quate CF. Atomic resolution imaging of a nonconductor by atomic force microscopy Journal of Applied Physics. 62: 2599-2602. DOI: 10.1063/1.339435 |
0.332 |
|
1987 |
Binnig G, Gerber C, Stoll E, Albrecht TR, Quate CF. Atomic resolution with atomic force microscope Surface Science. 189: 1-6. DOI: 10.1007/978-94-011-1812-5_33 |
0.411 |
|
1986 |
Bryant A, Smith DPE, Binnig G, Harrison WA, Quate CF. Anomalous distance dependence in scanning tunneling microscopy Applied Physics Letters. 49: 936-938. DOI: 10.1063/1.97489 |
0.397 |
|
1986 |
Smith DPE, Binnig G, Quate CF. Atomic point-contact imaging Applied Physics Letters. 49: 1166-1168. DOI: 10.1063/1.97403 |
0.401 |
|
1986 |
Smith DPE, Binnig G, Quate CF. Detection of phonons with a scanning tunneling microscope Applied Physics Letters. 49: 1641-1643. DOI: 10.1063/1.97252 |
0.363 |
|
1986 |
Park SI, Quate CF. Tunneling microscopy of graphite in air Applied Physics Letters. 48: 112-114. DOI: 10.1063/1.96968 |
0.357 |
|
1986 |
Bryant A, Smith DPE, Quate CF. Imaging in real time with the tunneling microscope Applied Physics Letters. 48: 832-834. DOI: 10.1063/1.96682 |
0.387 |
|
1986 |
Quate CF. Vacuum Tunneling: A New Technique for Microscopy Physics Today. 39: 26-33. DOI: 10.1063/1.881071 |
0.396 |
|
1985 |
de Lozanne AL, Elrod SA, Quate CF. Spatial variations in the superconductivity of Nb3Sn measured by low-temperature tunneling microscopy. Physical Review Letters. 54: 2433-2436. PMID 10031341 DOI: 10.1103/Physrevlett.54.2433 |
0.77 |
|
1985 |
Elrod SA, Bryant A, de Lozanne AL, Park S, Smith D, Quate CF. TUNNELING MICROSCOPY FROM 300 TO 4. 2 K Ibm Journal of Research and Development. 30: 387-395. DOI: 10.1147/Rd.304.0387 |
0.361 |
|
1984 |
Elrod SA, De Lozanne AL, Quate CF. Low-temperature vacuum tunneling microscopy Applied Physics Letters. 45: 1240-1242. DOI: 10.1063/1.95077 |
0.325 |
|
1981 |
Hildebrand JA, Rugar D, Johnston RN, Quate CF. Acoustic microscopy of living cells. Proceedings of the National Academy of Sciences of the United States of America. 78: 1656-60. PMID 6940179 DOI: 10.1073/Pnas.78.3.1656 |
0.655 |
|
1980 |
Rugar D, Heiserman J, Minden S, Quate CF. Acoustic microscopy of human metaphase chromosomes Journal of Microscopy. 120: 193-199. PMID 7218342 DOI: 10.1111/J.1365-2818.1980.Tb04135.X |
0.57 |
|
1980 |
Heiserman J, Rugar D, Quate CF. Cryogenic acoustic microscopy Journal of the Acoustical Society of America. 67: 1629-1637. DOI: 10.1121/1.384285 |
0.571 |
|
1979 |
Johnston RN, Atalar A, Heiserman J, Jipson V, Quate CF. Acoustic microscopy: Resolution of subcellular detail Proceedings of the National Academy of Sciences of the United States of America. 76: 3325-3329. PMID 291006 DOI: 10.1073/Pnas.76.7.3325 |
0.632 |
|
1979 |
Atalar A, Jipson V, Koch R, Quate CF. Acoustic Microscopy with Microwave Frequencies Annual Review of Materials Science. 9: 255-281. DOI: 10.1146/Annurev.Ms.09.080179.001351 |
0.609 |
|
1979 |
Quate CF, Atalar A, Wickramasinghe HK. Acoustic microscopy with mechanical scanning—a review Proceedings of the Ieee. 67: 1092-1114. DOI: 10.1109/PROC.1979.11406 |
0.608 |
|
1979 |
Lemons RA, Quate CF. 1 - Acoustic Microscopy Physical Acoustics. 14: 1-92. DOI: 10.1016/B978-0-12-477914-3.50006-2 |
0.317 |
|
1978 |
Wickramasinghe HK, Bray RC, Jipson V, Quate CF, Salcedo JR. Photoacoustics on a microscopic scale Applied Physics Letters. 33: 923-925. DOI: 10.1063/1.90219 |
0.374 |
|
1977 |
Atalar A, Quate CF, Wickramasinghe HK. Phase imaging in reflection with the acoustic microscope Applied Physics Letters. 31: 791-793. DOI: 10.1063/1.89551 |
0.612 |
|
1974 |
Lemons RA, Quate CF. Acoustic microscope - Scanning version Applied Physics Letters. 24: 163-165. DOI: 10.1063/1.1655136 |
0.391 |
|
1973 |
Havlice JF, Kino GS, Quate CF. Electronically focused acoustic imaging device Applied Physics Letters. 23: 581-583. DOI: 10.1063/1.1654755 |
0.349 |
|
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