| Year |
Citation |
Score |
| 2007 |
Watanabe M, Williams D. Development of Diffraction Imaging for Orientation Analysis of Grains in Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 13: 962-963. DOI: 10.1017/S1431927607075204 |
0.304 |
|
| 2006 |
Burke MG, Watanabe M, Williams DB, Hyde JM. Quantitative characterization of nanoprecipitates in irradiated low-alloy steels: Advances in the application of FEG-STEM quantitative microanalysis to real materials Journal of Materials Science. 41: 4512-4522. DOI: 10.1007/S10853-006-0084-X |
0.326 |
|
| 2003 |
Li C, Williams DB. Application of automated crystallography for transmission electron microscopy in the study of grain-boundary segregation. Micron (Oxford, England : 1993). 34: 199-209. PMID 12895491 DOI: 10.1016/S0968-4328(03)00026-X |
0.344 |
|
| 2003 |
Li C, Williams DB. Anisotropy of P Grain Boundary Segregation in a Rapidly Solidified Fe-0.6wt%P Alloy Interface Science. 11: 461-472. DOI: 10.1023/A:1026339829086 |
0.328 |
|
| 2002 |
Mun S, Watanabe M, Williams DB, Li X, Oh KH, Lee H. Precipitation of austenite particles at grain boundaries during aging of Fe-Mn-Ni steel Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science. 33: 1057-1067. DOI: 10.1007/S11661-002-0207-1 |
0.335 |
|
| 2001 |
Papworth AJ, Watanabe M, Williams DB. X-ray spectral simulation and experimental detection of phosphorus segregation to grain boundaries in the presence of molybdenum. Ultramicroscopy. 88: 265-274. PMID 11545322 DOI: 10.1016/S0304-3991(01)00083-3 |
0.303 |
|
| 2000 |
Keast VJ, Williams DB. Quantification of boundary segregation in the analytical electron microscope Journal of Microscopy. 199: 45-55. PMID 10886528 DOI: 10.1046/J.1365-2818.2000.00694.X |
0.328 |
|
| 2000 |
Claves SR, Misiolek WZ, Geertruyden WHV, Williams DB. Use of Electron Backscatter Diffraction Technique in Characterization of 6XXX Aluminum Alloy Extrusions Microscopy and Microanalysis. 6: 954-955. DOI: 10.1017/S1431927600037260 |
0.307 |
|
| 2000 |
Newbury DE, Williams DB. The electron microscope: the materials characterization tool of the millennium☆ Acta Materialia. 48: 323-346. DOI: 10.1016/S1359-6454(99)00302-X |
0.305 |
|
| 2000 |
Alamgir FM, Jain H, Schwarz RB, Jin O, Williams DB. Electronic structure of Pd-based bulk metallic glasses Journal of Non-Crystalline Solids. 274: 289-293. DOI: 10.1016/S0022-3093(00)00192-7 |
0.308 |
|
| 1999 |
Carpenter DT, Watanabe M, Barmak K, Williams DB. Low-magnification Quantitative X-ray Mapping of Grain-boundary Segregation in Aluminum-4 wt.% Copper by Analytical Electron Microscopy. Microscopy and Microanalysis. 5: 254-266. PMID 10421810 DOI: 10.1017/S1431927699990293 |
0.316 |
|
| 1999 |
Keast VJ, Williams DB. Quantitative compositional mapping of Bi segregation to grain boundaries in Cu Acta Materialia. 47: 3999-4008. DOI: 10.1016/S1359-6454(99)00260-8 |
0.302 |
|
| 1998 |
Williams DB. Impact of Energy-Dispersive Spectrometry in Materials Science Microanalysis. Microscopy and Microanalysis. 4: 567-575. PMID 10087279 DOI: 10.1017/S1431927698980540 |
0.315 |
|
| 1998 |
Keast V, Bruley J, Rez P, Maclaren J, Williams D. Chemistry and bonding changes associated with the segregation of Bi to grain boundaries in Cu Acta Materialia. 46: 481-490. DOI: 10.1016/S1359-6454(97)00262-0 |
0.319 |
|
| 1997 |
Ito Y, Winkler D, Jain H, Williams D. Application of extended energy loss fine structure in determining the structure of amorphous SiO2 Journal of Non-Crystalline Solids. 222: 83-93. DOI: 10.1016/S0022-3093(97)90099-5 |
0.306 |
|
| 1996 |
Bruley J, Keast VJ, Williams DB. Measurement of the localized electronic structure associated with bismuth segregation to copper grain boundaries Journal of Physics D. 29: 1730-1739. DOI: 10.1088/0022-3727/29/7/008 |
0.31 |
|
| 1991 |
Vecchio KS, Hunt JA, Williams DB. Transmission electron microscope in situ fatigue experiments: A computer-control approach Journal of Electron Microscopy Technique. 17: 351-355. PMID 2045966 DOI: 10.1002/Jemt.1060170309 |
0.484 |
|
| 1989 |
Liu DR, Williams DB. Accurate composition determination of Be‐Ti alloys by electron energy loss spectroscopy Journal of Microscopy. 156: 201-210. DOI: 10.1111/J.1365-2818.1989.Tb02919.X |
0.311 |
|
| 1989 |
Liu DR, Williams DB. Accurate Quantification of Lithium in Aluminium-Lithium Alloys with Electron Energy-Loss Spectrometry Proceedings of the Royal Society a: Mathematical, Physical and Engineering Sciences. 425: 91-111. DOI: 10.1098/Rspa.1989.0100 |
0.308 |
|
| 1989 |
Reuter KB, Williams DB, Goldstein JI. Determination of the Fe−Ni phase diagram below 400°C Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science. 20: 719-725. DOI: 10.1007/Bf02667589 |
0.3 |
|
| 1988 |
Williams DB. Prospects for Trace Analysis in the Analytical Electron Microscope Journal of Research of the National Bureau of Standards. 93: 369. DOI: 10.6028/Jres.093.081 |
0.31 |
|
| 1988 |
Vecchio KS, Williams DB. A non-icosahedral T2 (Al6Li3Cu) phase Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties. 57: 535-546. DOI: 10.1080/13642818808208503 |
0.525 |
|
| 1988 |
Vecchio KS, Williams DB. Convergent beam electron diffraction analysis of the T 1 (Al 2CuLi) phase in Al-Li-Cu alloys Metallurgical Transactions A. 19: 2885-2891. DOI: 10.1007/Bf02647714 |
0.549 |
|
| 1988 |
Vecchio KS, Williams DB. The apparent 'five-fold' nature of large T 2 (AI 6Li 3Cu) crystals Metallurgical Transactions A. 19: 2875-2884. DOI: 10.1007/Bf02647713 |
0.554 |
|
| 1987 |
Vecchio KS, Williams DB. Experimental conditions affecting coherent bremsstrahlung in X-ray microanalysis Journal of Microscopy. 147: 15-35. DOI: 10.1111/J.1365-2818.1987.Tb02815.X |
0.521 |
|
| 1987 |
Vecchio KS, Williams DB. Convergent beam electron diffraction study of Al3Zr in Al-Zr AND Al-Li-Zr alloys Acta Metallurgica. 35: 2959-2970. DOI: 10.1016/0001-6160(87)90295-1 |
0.534 |
|
| 1986 |
Liu D, Rommal HEG, Williams DB. Preparation of lithium specimens for transmission electron microscopy Journal of Electron Microscopy Technique. 4: 381-383. DOI: 10.1002/Jemt.1060040408 |
0.302 |
|
| 1984 |
Williams DB, Newbury DE. Recent Advances in the Electron Microscopy of Materials Advances in Electronics and Electron Physics. 62: 161-288. DOI: 10.1016/S0065-2539(08)60272-3 |
0.312 |
|
| 1984 |
Michael JR, Williams DB. An analytical electron microscope study of the kinetics Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science. 15: 99-105. DOI: 10.1007/Bf02644391 |
0.32 |
|
| 1981 |
Baumann SF, Williams DB. A STEM/X‐ray microanalytical study of the equilibrium segregation of bismuth in copper Journal of Microscopy. 123: 299-305. DOI: 10.1111/J.1365-2818.1981.Tb02474.X |
0.321 |
|
| 1980 |
BENDER BA, WILLIAMS DB, NOTIS MR. Absorption Effects in STEM Microanalysis of Ceramic Oxides Journal of the American Ceramic Society. 63: 149-151. DOI: 10.1111/J.1151-2916.1980.Tb10680.X |
0.302 |
|
| 1980 |
Mehta S, Novotny PM, Williams DB, Goldstein JI. Electron-optical observations of ordered FeNi in the Estherville meteorite Nature. 284: 151-153. DOI: 10.1038/284151A0 |
0.315 |
|
| 1977 |
Lin LS, Goldstein JI, Williams DB. Analytical electron microscopy study of the plessite structure in the Carlton iron meteorite Geochimica Et Cosmochimica Acta. 41: 1861-1874. DOI: 10.1016/0016-7037(77)90217-4 |
0.311 |
|
| 1977 |
Williams DB, Edington JW. Microstructural characteristics of splatquenched aluminium-copper alloys Journal of Materials Science. 12: 126-130. DOI: 10.1007/Bf00738477 |
0.307 |
|
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