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Bigang Min, Ph.D. - Publications

Affiliations: 
2005 University of Texas at Arlington, Arlington, TX, United States 
Area:
Electronics and Electrical Engineering
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5 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2007 Devireddy SP, Min B, Çelik-Butler Z, Tseng HH, Tobin PJ, Zlotnicka A. Improved low frequency noise characteristics of sub-micron MOSFETs with TaSiN/TiN gate on ALD HfO2 dielectric Microelectronics Reliability. 47: 1228-1232. DOI: 10.1016/J.Microrel.2007.05.006  0.734
2006 Min B, Devireddy SP, Celik-Butler Z, Shanware A, Colombo L, Green K, Chambers JJ, Visokay MR, Rotondaro ALP. Impact of interfacial layer on low-frequency noise of HfSiON dielectric MOSFETs Ieee Transactions On Electron Devices. 53: 1459-1466. DOI: 10.1109/Ted.2006.874759  0.727
2006 Devireddy SP, Min B, Celik-Butler Z, Tseng H, Tobin PJ, Wang F, Zlotnicka A. Low-frequency noise in TaSiN/HfO/sub 2/ nMOSFETs and the effect of stress-relieved preoxide interfacial layer Ieee Transactions On Electron Devices. 53: 538-544. DOI: 10.1109/Ted.2005.863769  0.706
2005 Min B, Devireddy SP, Celik-Butler Z, Shanware A, Green K, Chambers JJ, Visokay MV, Colombo L. Low-frequency noise characteristics of HfSiON gate-dielectric metal-oxide-semiconductor-field-effect transistors Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1866507  0.73
2004 Min B, Devireddy S, Celik-Butler Z, Wang F, Zlotnicka A, Tseng H, Tobin P. Low-Frequency Noise in Submicrometer MOSFETs With HfO<tex>$_2$</tex>, HfO<tex>$_2/hbox Al_2hbox O_3$</tex>and HfAlO<tex>$_x$</tex>Gate Stacks Ieee Transactions On Electron Devices. 51: 1315-1322. DOI: 10.1109/Ted.2004.832821  0.698
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