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Lucille A. Giannuzzi - Publications

Affiliations: 
University of Central Florida, Orlando, FL, United States 
Area:
Materials Science Engineering
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52 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2016 Vitale S, Sugar JD, Cappillino PJ, Giannuzzi LA, Robinson DB. Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam Microscopy and Microanalysis. 22: 180-181. DOI: 10.1017/S1431927616001756  0.371
2014 Bassim N, Scott K, Giannuzzi LA. Recent advances in focused ion beam technology and applications Mrs Bulletin. 39: 317-325. DOI: 10.1557/Mrs.2014.52  0.376
2012 Giannuzzi LA. Optimizing morphology and structure with multi-signal FIB/SEM tomography Materials Research Society Symposium Proceedings. 1421: 47-52. DOI: 10.1557/Opl.2012.432  0.347
2009 Giannuzzi LA, Gorman BP. Particle-induced x-ray emission in stainless steel using 30 keV Ga+ focused ion beams Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 27: 668-671. DOI: 10.1116/1.3136852  0.317
2009 Giannuzzi LA, Utlaut M. Contrast mechanisms in ga+ ion induced secondary electron images Microscopy and Microanalysis. 15: 650-651. DOI: 10.1017/S1431927609093982  0.308
2008 Van Leer B, Giannuzzi LA. Advances in TEM sample preparation using a focused ion beam Microscopy and Microanalysis. 14: 380-381. DOI: 10.1017/S1431927608086030  0.358
2008 Russo MF, Maazouz M, Giannuzzi LA, Chandler C, Utlaut M, Garrison BJ. Gallium-induced milling of silicon: A computational investigation of focused ion beams Microscopy and Microanalysis. 14: 315-320. DOI: 10.1017/S1431927608080653  0.366
2008 Russo MF, Maazouz M, Giannuzzi LA, Chandler C, Utlaut M, Garrison BJ. Trench formation and lateral damage induced by gallium milling of silicon Applied Surface Science. 255: 828-830. DOI: 10.1016/J.Apsusc.2008.05.083  0.34
2007 Giannuzzi LA, Phifer D, Giannuzzi NJ, Capuano MJ. Two-dimensional and 3-dimensional analysis of bone/dental implant interfaces with the use of focused ion beam and electron microscopy. Journal of Oral and Maxillofacial Surgery : Official Journal of the American Association of Oral and Maxillofacial Surgeons. 65: 737-47. PMID 17368372 DOI: 10.1016/J.Joms.2006.10.025  0.366
2007 Stokes DJ, Roussel L, Wilhelmi O, Giannuzzi LA, Hubert DHW. Recent advances in FIB technology for nano-prototyping and nano-characterisation Materials Research Society Symposium Proceedings. 1020: 15-20. DOI: 10.1557/Proc-1020-Gg01-05  0.4
2007 Mayer J, Giannuzzi LA, Kamino T, Michael J. TEM sample preparation and FIB-induced damage Mrs Bulletin. 32: 400-407. DOI: 10.1557/Mrs2007.63  0.368
2007 Giannuzzi LA, Garrison BJ. Molecular dynamics simulations of 30 and 2 keV Ga in Si Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 25: 1417-1419. DOI: 10.1116/1.2756541  0.301
2007 Giannuzzi L, Leer BV, Ringnalda J. Evidence for a Critical Amorphization Thickness Limit of Ga+ Ion Bombardment in Si Microscopy and Microanalysis. 13: 1516-1517. DOI: 10.1017/S1431927607074405  0.358
2007 Giannuzzi L. FIB/DualBeam Techniques for Quantitative Analyses Microscopy and Microanalysis. 13: 1408-1409. DOI: 10.1017/S1431927607074399  0.423
2007 Henager CH, Shin Y, Blum Y, Giannuzzi LA, Kempshall BW, Schwarz SM. Coatings and joining for SiC and SiC-composites for nuclear energy systems Journal of Nuclear Materials. 367: 1139-1143. DOI: 10.1016/J.Jnucmat.2007.03.189  0.733
2006 Heymann JA, Hayles M, Gestmann I, Giannuzzi LA, Lich B, Subramaniam S. Site-specific 3D imaging of cells and tissues with a dual beam microscope. Journal of Structural Biology. 155: 63-73. PMID 16713294 DOI: 10.1016/J.Jsb.2006.03.006  0.323
2006 Giannuzzi LA. Particle‐induced x‐ray analysis using focused ion beams Scanning. 27: 165-169. DOI: 10.1002/Sca.4950270402  0.315
2005 Giannuzzi LA, Prenitzer BI, Kempshall BW. Ion - Solid interactions Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. 13-52. DOI: 10.1007/0-387-23313-X_2  0.715
2005 Giannuzzi LA, Kempshall BW, Schwarz SM, Lomness JK, Prenitzer BI, Stevie FA. FIB lift-out specimen preparation techniques ex-situ and in-situ methods Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. 201-228. DOI: 10.1007/0-387-23313-X_10  0.741
2004 Giannuzzi LA. FIB Lift-Out and Milling of Cylindrical Specimens for Electron Tomography (or Atom Probe Field Ion Microscopy) Microscopy Today. 12: 34-35. DOI: 10.1017/S1551929500065950  0.329
2004 Schwarz SM, Giannuzzi LA. FIB specimen preparation for STEM and EFTEM tomography Microscopy and Microanalysis. 10: 142-143. DOI: 10.1017/S143192760488752X  0.587
2004 Laxman S, Franke B, Kempshall BW, Sohn YH, Giannuzzi LA, Murphy KS. Phase transformations of thermally grown oxide on (Ni,Pt)Al bondcoat during electron beam physical vapor deposition and subsequent oxidation Surface and Coatings Technology. 177: 121-130. DOI: 10.1016/j.surfcoat.2003.08.072  0.698
2003 Prenitzer BI, Urbanik-Shannon CA, Giannuzzi LA, Brown SR, Irwin RB, Shofner TL, Stevie FA. The correlation between ion beam/material interactions and practical FIB specimen preparation Microscopy and Microanalysis. 9: 216-236. PMID 12807673 DOI: 10.1017/S1431927603030034  0.397
2003 McCartney MR, Li J, Chakraborty P, Giannuzzi LA, Schwarz SM. Issues Affecting Quantitative Evaluation of Dopant Profiles Using Electron Holography Microscopy and Microanalysis. 9: 776-777. DOI: 10.1017/S1431927603443882  0.615
2003 Schwarz SM, Kempshall BW, Giannuzzi LA, McCartney MR. Avoiding the curtaining effect: Backside milling by FIB INLO Microscopy and Microanalysis. 9: 116-117. DOI: 10.1017/S1431927603441044  0.728
2003 Schwarz SM, Kempshall BW, Giannuzzi LA, Stevie FA. Multiple analytical instrumentation for complete materials characterization Microscopy and Microanalysis. 9: 256-257. DOI: 10.1017/S1431927603440749  0.735
2003 Schwarz SM, Kempshall BW, Giannuzzi LA. Effects of diffusion induced recrystallization on volume diffusion in the copper-nickel system Acta Materialia. 51: 2765-2776. DOI: 10.1016/S1359-6454(03)00082-X  0.746
2003 McCartney MR, Li J, Chakraborty P, Giannuzzi LA, Schwarz SM. Issues affecting quantitative evaluation of dopant profiles using electron holography Microscopy and Microanalysis. 9: 776-777.  0.584
2002 Lins A, Giannuzzi LA, Stevie FA, Price B, Tucker M, Gutman N. FIB/TEM analysis of paint layers from Thomas Eakins' The Crucifixion, 1880 Materials Research Society Symposium - Proceedings. 712: 113-118. DOI: 10.1557/Proc-712-Ii1.2  0.308
2002 Kempshall BW, Giannuzzi LA, Prenitzer BI, Stevie FA, Da SX. Comparative evaluation of protective coatings and focused ion beam chemical vapor deposition processes Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 286-290. DOI: 10.1116/1.1445165  0.744
2002 Clayton FB, Kempshall BW, Schwarz SM, Giannuzzi LA. Automated Crystallography and Grain Mapping in the TEM Microscopy and Microanalysis. 8: 656-657. DOI: 10.1017/S1431927602106283  0.753
2002 Rajsiri S, Kempshall B, Schwarz S, Giannuzzi L. FIB Damage in Silicon: Amorphization or Redeposition? Microscopy and Microanalysis. 8: 50-51. DOI: 10.1017/S1431927602101577  0.736
2002 Kempshall BW, Giannuzzi LA. In-situ lift-out FIB specimen preparation for TEM of magnetic materials Microscopy and Microanalysis. 8: 390-391. DOI: 10.1017/S1431927602100717  0.7
2002 Kempshall BW, Prenitzer BI, Giannuzzi LA. Grain boundary segregation: Equilibrium and non-equilibrium conditions Scripta Materialia. 47: 447-451. DOI: 10.1016/S1359-6462(02)00141-0  0.712
2002 Schwarz SM, Kempshall BW, Giannuzzi LA, Stevie FA. Utilizing the SIMS technique in the study of grain boundary diffusion along twist grain boundaries in the Cu(Ni) system Acta Materialia. 50: 5079-5084. DOI: 10.1016/S1359-6454(02)00362-2  0.748
2002 Matteson TL, Schwarz SW, Houge EC, Kempshall BW, Giannuzzi LA. Electron backscattering diffraction investigation of focused ion beam surfaces Journal of Electronic Materials. 31: 33-39. DOI: 10.1007/S11664-002-0169-5  0.75
2002 Ferryman AC, Fulghum JE, Giannuzzi LA, Stevie FA. XPS analysis of FIB-milled Si Surface and Interface Analysis. 33: 907-913. DOI: 10.1002/Sia.1448  0.391
2001 Lomness JK, Giannuzzi LA, Hampton MD. Site-specific Transmission Electron Microscope Characterization of Micrometer-sized Particles Using the Focused Ion Beam Lift-out Technique. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 7: 418-423. PMID 12597804 DOI: 10.1017/S1431927601010418  0.345
2001 Heaney PJ, Vicenzi EP, Giannuzzi LA, Livi KJT. Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials American Mineralogist. 86: 1094-1099. DOI: 10.2138/Am-2001-8-917  0.413
2001 Kempshall BW, Schwarz SM, Prenitzer BI, Giannuzzi LA, Irwin RB, Stevie FA. Ion channeling effects on the focused ion beam milling of Cu Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 19: 749-754. DOI: 10.1116/1.1368670  0.764
2001 Lomness JK, Kempshall BW, Giannuzzi LA, Watson MB. TEM of Sub-Micrometer Particles using the FIB Lift-Out Technique Microscopy and Microanalysis. 7: 950-951. DOI: 10.1017/S1431927600030828  0.69
2001 White H, Pu Y, Rafailovich M, Sokolov J, King AH, Giannuzzi LA, Urbanik-Shannon C, Kempshall BW, Eisenberg A, Schwarz SA, Strzhemechny YM. Focused ion beam/lift-out transmission electron microscopy cross sections of block copolymer films ordered on silicon substrates Polymer. 42: 1613-1619. DOI: 10.1016/S0032-3861(00)00503-6  0.735
2001 Schwarz SM, Houge EC, Giannuzzi LA, King AH. Bicrystal growth and characterization of copper twist grain boundaries Journal of Crystal Growth. 222: 392-398. DOI: 10.1016/S0022-0248(00)00918-0  0.636
2001 Stevie FA, Vartuli CB, Giannuzzi LA, Shofner TL, Brown SR, Rossie B, Hillion F, Mills RH. Application of focused ion beam lift-out specimen preparation to TEM, SEM, STEM, AES and SIMS analysis Surface and Interface Analysis. 31: 345-351. DOI: 10.1002/Sia.1063  0.391
2000 Prenitzer BI, Kempshall BW, Schwarz SM, Giannuzzi LA, Stevie FA. Practical Aspects of FIB Milling: Understanding Ion Beam/Material Interactions Microscopy and Microanalysis. 6: 502-503. DOI: 10.1017/S1431927600035005  0.763
1999 Giannuzzi LA, Young R, Carleson P. Using a Focused Ion Beam (FIB) System to Extract TEM-Ready Samples from Complex Metallic and Ceramic Structures Microscopy Today. 7: 12-15. DOI: 10.1017/S1551929500063860  0.321
1999 Giannuzzi LA, Stevie FA. A review of focused ion beam milling techniques for TEM specimen preparation Micron. 30: 197-204. DOI: 10.1016/S0968-4328(99)00005-0  0.395
1998 Giannuzzi LA, Drown JL, Brown SR, Irwin RB, Stevie FA. Applications of the FIB lift-out technique for TEM specimen preparation Microscopy Research and Technique. 41: 285-290. PMID 9633946 DOI: 10.1002/(Sici)1097-0029(19980515)41:4<285::Aid-Jemt1>3.0.Co;2-Q  0.395
1998 Prenitzer BI, Giannuzzi LA, Brown SR, Irwin RB, Shofner TL, Stevie FA. Material Dependence of Sputtering Behavior During Focused Ion Beam Milling: A Correlation Between Monte Carlo Based Simulation and Empirical Observation Microscopy and Microanalysis. 4: 858-859. DOI: 10.1017/S1431927600024417  0.336
1998 Prenitzer BI, Giannuzzi LA, Newman K, Brown SR, Irwin RB, Shofner TL, Stevie FA. Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique Metallurgical and Materials Transactions a: Physical Metallurgy and Materials Science. 29: 2399-2406. DOI: 10.1007/S11661-998-0116-Z  0.4
1997 Giannuzzi LA, Drown JL, Brown SR, Irwin RB, Stevie FA. Focused ion beam milling and micromanipulation lift-out for site specific cross-section TEM specimen preparation Materials Research Society Symposium - Proceedings. 480: 19-27. DOI: 10.1557/Proc-480-19  0.389
1997 Giannuzzi LA, Drownt JL, Brown SR, Irwin RB, Stevie FA. Focused Ion Beam Milling for Site Specific Scanning and Transmission Electron Microscopy Specimen Preparation Microscopy and Microanalysis. 3: 347-348. DOI: 10.1017/S143192760000862X  0.384
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