Karen M. Siegrist, Ph.D.
Affiliations: | University of Maryland, College Park, College Park, MD |
Area:
NanostructuresGoogle:
"Karen Siegrist"Mean distance: 10.82 | S | N | B | C | P |
Parents
Sign in to add mentor| Ellen D. Williams | grad student | 2003 | University of Maryland | |
| (Characterization of contrast mechanisms of the photoelectron emission microscope.) | ||||
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Publications
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| Sangwan VK, Ballarotto VW, Siegrist K, et al. (2010) Characterizing voltage contrast in photoelectron emission microscopy. Journal of Microscopy. 238: 210-7 |
| Siegrist K, Ballarotto VW, Breban M, et al. (2004) Imaging buried structures with photoelectron emission microscopy Applied Physics Letters. 84: 1419-1421 |
| Siegrist K, Williams ED, Ballarotto VW. (2003) Characterizing topography-induced contrast in photoelectron emission microscopy Journal of Vacuum Science and Technology. 21: 1098-1102 |
| Yongsunthon R, Rous PJ, Stanishevsky A, et al. (2003) Phase imaging of buried structures Applied Surface Science. 210: 6-11 |