Jianing Sun, Ph.D.
Affiliations: | University of Michigan, Ann Arbor, Ann Arbor, MI |
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"Jianing Sun"Mean distance: 11.02
Parents
Sign in to add mentor| Albert F. Yee | grad student | 2002 | University of Michigan | |
| (Probing porous low-dielectric constant thin films using positronium annihilation lifetime spectroscopy.) | ||||
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Publications
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| Pai RA, Humayun R, Schulberg MT, et al. (2004) Mesoporous silicates prepared using preorganized templates in supercritical fluids. Science (New York, N.Y.). 303: 507-10 |
| Li S, Sun J, Li Z, et al. (2004) Evaluation of Pore Structure in Pure Silica Zeolite MFI Low-k Thin Films Using Positronium Annihilation Lifetime Spectroscopy Journal of Physical Chemistry B. 108: 11689-11692 |
| Harkness BR, Boisvert R, Deng Q, et al. (2003) Accelerated Oxidation of Hydrogen Silsesquioxane Thin Films Facilitated by an Organosilicone Resin Additive Mrs Proceedings. 766 |
| Ryan ET, Freeman M, Svedberg L, et al. (2003) A Study of Atomic Layer Deposition and Reactive Plasma Compatibilitywith Mesoporous Organosilicate Glass Films Mrs Proceedings. 766 |
| Sun JN, Hu Y, Frieze WE, et al. (2003) How pore size and surface roughness affect diffusion barrier continuity on porous low-k films Journal of the Electrochemical Society. 150 |
| Yang S, Mirau P, Sun J, et al. (2003) Characterization of nanoporous ultra low-k thin films templated by copolymers with different architectures Radiation Physics and Chemistry. 68: 351-356 |
| Sun JN, Gidley DW, Hu Y, et al. (2002) Depth-profiling plasma-induced densification of porous low-k thin films using positronium annihilation lifetime spectroscopy Applied Physics Letters. 81: 1447-1449 |
| Lin S, Sun J, Gidley DW, et al. (2001) Positron Annihilation Lifetime Spectroscopy (Pals) Application in Metal Barrier Layer Integrity for Porous Low-K Materials Mrs Proceedings. 686 |
| Ryan ET, Martin J, Junker K, et al. (2001) Effect of material properties on integration damage in organosilicate glass films Journal of Materials Research. 16: 3335-3338 |
| Sun JN, Gidley DW, Dull TL, et al. (2001) Probing diffusion barrier integrity on porous silica low-k thin films using positron annihilation lifetime spectroscopy Journal of Applied Physics. 89: 5138-5144 |