Doogie Oh, Ph.D.

Affiliations: 
Georgia Institute of Technology, Atlanta, GA 
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"Doogie Oh"
Mean distance: 10.05
 
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Thomas M. Orlando grad student 2009 Georgia Tech
 (Low-energy electron diffraction effects at complex interfaces.)
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Publications

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Oh D, Sieger MT, Orlando TM. (2010) A theoretical description and experimental demonstration of diffraction in electron-stimulated desorption. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 22: 084001
Sharma N, Oh D, Abernathy H, et al. (2010) Signatures of epitaxial graphene grown on Si-terminated 6H-SiC (0 0 0 1) Surface Science. 604: 84-88
Orlando TM, Oh D, Chen Y, et al. (2008) Low-energy electron diffraction and induced damage in hydrated DNA Journal of Chemical Physics. 128
Oh D, Sieger MT, Orlando TM. (2006) Zone specificity in low energy electron stimulated desorption of Cl+ from reconstructed Si(1 1 1)-7 × 7:Cl surfaces Surface Science. 600: L245-L249
Orlando TM, Oh D, Sieger MT, et al. (2004) Electron collisions with complex targets: Diffraction effects in stimulated desorption Physica Scripta T. 256-261
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