John P. Guzowski, Ph.D.

Affiliations: 
2000 Indiana University, Bloomington, Bloomington, IN, United States 
Area:
basic mechanisms in atomic emission, absorption, fluorescence and mass spectrometric analysis, and the development of instrumentation and techniques for atomic methods of analysis
Google:
"John Guzowski"
Mean distance: 11.42
 
SNBCP

Parents

Sign in to add mentor
Gary M. Hieftje grad student 2000 Indiana University Bloomington
 (Advances in time -of -flight mass spectrometry for atomic and molecular analysis.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Guzowski JP, Hieftje GM. (2000) Gas sampling glow discharge: a versatile ionization source for gas chromatography time-of-flight mass spectrometry Analytical Chemistry. 72: 3812-20
Guzowski JP, Hieftje GM. (2000) Characterization of switched direct current gas sampling glow discharge ionization source for the time-of-flight mass spectrometer Journal of Analytical Atomic Spectrometry. 15: 27-36
Guzowski JP, Broekaert JAC, Hieftje GM. (2000) Electrothermal vaporization for sample introduction into a gas sampling glow discharge time-of-flight mass spectrometer Spectrochimica Acta, Part B: Atomic Spectroscopy. 55: 1295-1314
Bings NH, Costa-Fernández JM, Guzowski JP, et al. (2000) Time-of-flight mass spectrometry as a tool for speciation analysis Spectrochimica Acta, Part B: Atomic Spectroscopy. 55: 767-778
Guzowski JP, Broekaert JAC, Ray TSJ, et al. (1999) Development of a direct current gas sampling glow discharge ionization source for the time-of-flight mass spectrometer Journal of Analytical Atomic Spectrometry. 14: 1121-1127
Hieftje GM, Ray SJ, Guzowski JP, et al. (1999) A new generation of instrumentation and capabilities for atomic mass spectrometry Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis. 19: 587-589
Pack BW, Broekaert JA, Guzowski JP, et al. (1998) Determination of halogenated hydrocarbons by helium microwave plasma torch time-of-flight mass spectrometry coupled to gas chromatography. Analytical Chemistry. 70: 3957-63
Mahoney PP, Guzowski JP, Ray SJ, et al. (1997) Electrospray Ionization Time-Of-Flight Mass Spectrometer for Elemental Analysis Applied Spectroscopy. 51: 1464-1470
HIEFTJE GM, MYERS DP, LI G, et al. (1997) Toward the Next Generation of Atomic Mass Spectrometers Journal of Analytical Atomic Spectrometry. 12: 287-292
Mahoney PP, Guzowski JP, Ray SJ, et al. (1997) Electrospray ionization time-of-flight mass spectrometer for elemental analysis Applied Spectroscopy. 51: 1464-1470
See more...