Kung-Ching Liao, Ph.D.

Affiliations: 
2012 Chemistry Princeton University, Princeton, NJ 
Area:
interface chemistry
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"Kung-Ching Liao"
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Parents

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Jeffrey Schwartz grad student 2008-2012 Princeton
 (Molecular design to control device behavior of organic electronics.)
George M. Whitesides post-doc 2012-2015 Harvard
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Publications

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Saller KB, Liao KC, Riedl H, et al. (2020) Contact Architecture Controls Conductance in Monolayer Devices. Acs Applied Materials & Interfaces
Baghbanzadeh M, Bowers CM, Rappoport D, et al. (2017) Anomalously Rapid Tunneling: Charge Transport across SAMs of Oligoethylene Glycol. Journal of the American Chemical Society
Pathak A, Bora A, Liao KC, et al. (2016) Disorder-derived, strong tunneling attenuation in bis-phosphonate monolayers. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 28: 094008
Bowers CM, Rappoport D, Baghbanzadeh M, et al. (2016) Tunneling across SAMs Containing Oligophenyl Groups Journal of Physical Chemistry C. 120: 11331-11337
Yazji S, Westermeier C, Weinbrenner D, et al. (2016) Surface-directed molecular assembly of pentacene on aromatic organophosphonate self-assembled monolayers explored by polarized Raman spectroscopy Journal of Raman Spectroscopy
Wu WL, Shen H, Liao K, et al. (2015) [The volume of residual urine correlates with bladder outlet obstruction and detrusor contractility in patients with benign prostatic hyperplasia]. Zhonghua Nan Ke Xue = National Journal of Andrology. 21: 729-32
Kong GD, Kim M, Jang HJ, et al. (2015) Influence of halogen substitutions on rates of charge tunneling across SAM-based large-area junctions. Physical Chemistry Chemical Physics : Pccp. 17: 13804-7
Liao KC, Hsu LY, Bowers CM, et al. (2015) Molecular series-tunneling junctions. Journal of the American Chemical Society. 137: 5948-54
Liao KC, Bowers CM, Yoon HJ, et al. (2015) Fluorination, and tunneling across molecular junctions. Journal of the American Chemical Society. 137: 3852-8
Bowers CM, Liao KC, Zaba T, et al. (2015) Characterizing the metal-SAM interface in tunneling junctions. Acs Nano. 9: 1471-7
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