Joanna Atkin, Ph.D.
Affiliations: | 2009 | Columbia University, New York, NY |
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"Joanna Atkin"Mean distance: 10.37 | S | N | B | C | P |
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Sign in to add mentor| Tony F. Heinz | grad student | 2009 | Columbia | |
| (Optical spectroscopy and electrical properties of low-k dielectric materials.) | ||||
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Publications
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| Atkin JM, Shaw TM, Liniger E, et al. (2012) The effect of voltage bias stress on temperature-dependent conduction properties of low-k dielectrics Ieee International Reliability Physics Symposium Proceedings. BD.1.1-BD.1.6 |
| Atkin JM, Laibowitz RB, Heinz TF, et al. (2009) Effects of photoinduced carrier injection on time-dependent dielectric breakdown Ieee International Reliability Physics Symposium Proceedings. 851-854 |
| Atkin JM, Cartier E, Shaw TM, et al. (2009) The evolution of optical and electrical properties of low-k dielectrics under bias stress Microelectronic Engineering. 86: 1891-1893 |
| Atkin JM, Cartier E, Shaw TM, et al. (2008) Charge trapping at the low- k dielectric-silicon interface probed by the conductance and capacitance techniques Applied Physics Letters. 93 |
| Atkin JM, Song D, Shaw TM, et al. (2008) Photocurrent spectroscopy of low- k dielectric materials: Barrier heights and trap densities Journal of Applied Physics. 103 |