Gang Feng, Ph.D.

Affiliations: 
2006 Stanford University, Palo Alto, CA 
Area:
materials science
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"Gang Feng"
Mean distance: 14.28
 
SNBCP
Cross-listing: Materials Tree

Parents

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William D. Nix grad student 2006 Stanford
 (The application of contact mechanics in the study of nanoindentation.)
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Publications

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Zhang L, Feng G. (2020) A one-step-assembled three-dimensional network of silver/polyvinylpyrrolidone (PVP) nanowires and its application in energy storage. Nanoscale
Khare HS, Lahouij I, Jackson A, et al. (2018) Nanoscale Generation of Robust Solid Films from Liquid Dispersed Nanoparticles via In-situ Atomic Force Microscopy: Growth Kinetics and Nanomechanical Properties. Acs Applied Materials & Interfaces
Jung JY, Qaiser N, Feng G, et al. (2016) Size-dependent hardness of five-fold twin structured Ag nanowires. Physical Chemistry Chemical Physics : Pccp
Zhang D, Xu Y, Feng G, et al. (2015) Comparing sintering and atomic layer deposition as methods to mechanically reinforce nanocolloidal crystals Journal of Materials Research. 30: 3717-3727
Zhang D, Zhang L, Lee D, et al. (2015) Suppressing unstable deformation of nanocolloidal crystals with atomic layer deposition Materials Science and Engineering A. 639: 514-518
Cho Y, Lee SY, Ellerthorpe L, et al. (2015) Elastoplastic Inverse Opals as Power-Free Mechanochromic Sensors for Force Recording Advanced Functional Materials. 25: 6041-6049
Brugarolas T, Gianola DS, Zhang L, et al. (2014) Tailoring and understanding the mechanical properties of nanoparticle-shelled bubbles. Acs Applied Materials & Interfaces. 6: 11558-72
He MR, Felfer PJ, Dasgupta S, et al. (2014) Understanding the mechanical behavior of nanocrystalline Al-O thin films with complex microstructures Acta Materialia. 77: 269-283
Min Han S, Feng G, Young Jung J, et al. (2013) Critical-temperature/Peierls-stress dependent size effects in body centered cubic nanopillars Applied Physics Letters. 102
Zhang L, Prosser JH, Feng G, et al. (2012) Mechanical properties of atomic layer deposition-reinforced nanoparticle thin films. Nanoscale. 4: 6543-52
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