Tommie W. Kelley, Ph.D.
Affiliations: | 2000 | University of Minnesota, Twin Cities, Minneapolis, MN |
Area:
Organic and Molecular ElectronicsGoogle:
"Tommie Kelley"Mean distance: 8.47
Parents
Sign in to add mentor| C. Daniel Frisbie | grad student | 2000 | UMN | |
| (Characterization of organic semiconductors via conducting probe atomic force microscopy.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Fritz SE, Kelley TW, Frisbie CD. (2005) Effect of dielectric roughness on performance of pentacene TFTs and restoration of performance with a polymeric smoothing layer. The Journal of Physical Chemistry. B. 109: 10574-7 |
| Merlo JA, Newman CR, Gerlach CP, et al. (2005) p-Channel organic semiconductors based on hybrid acene-thiophene molecules for thin-film transistor applications. Journal of the American Chemical Society. 127: 3997-4009 |
| Muyres DV, Baude PF, Theiss S, et al. (2004) Polymeric aperture masks for high performance organic integrated circuits Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 22: 1892-1895 |
| Kelley TW, Muyres DV, Baude FP, et al. (2003) High Performance Organic Thin Film Transistors Materials Research Society Symposium - Proceedings. 771: 169-179 |
| Kelley TW, Boardman LD, Dunbar TD, et al. (2003) High-performance OTFTs using surface-modified alumina dielectrics Journal of Physical Chemistry B. 107: 5877-5881 |
| Kelley TW, Frisbie CD. (2001) Gate voltage dependent resistance of a single organic semiconductor grain boundary Journal of Physical Chemistry B. 105: 4538-4540 |
| Kelley TW, Frisbie CD. (2000) Point contact current-voltage measurements on individual organic semiconductor grains by conducting probe atomic force microscopy Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 632-635 |
| Kelley TW, Granstrom E, Frisbie CD. (1999) Conducting Probe Atomic Force Microscopy: A Characterization Tool for Molecular Electronics Advanced Materials. 11: 261-264 |
| Kelley TW, Schorr PA, Johnson KD, et al. (1998) Direct force measurements at polymer brush surfaces by atomic force microscopy Macromolecules. 31: 4297-4300 |