Jeremy M. Beebe, Ph.D.

Affiliations: 
2005 University of Minnesota, Twin Cities, Minneapolis, MN 
Area:
Organic and Molecular Electronics
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"Jeremy Beebe"
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C. Daniel Frisbie grad student 2005 UMN
 (Charge transport and contact effects in nanoscale electrical junctions formed via conducting probe atomic force microscopy.)
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Publications

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Beebe JM, Swatowski BW, Weidner WK, et al. (2020) Semi-quantitative AFM-IR Analysis of Chemical Gradients in Silicone Optical Waveguides. Acs Applied Materials & Interfaces
Beebe JM, Kim B, Frisbie CD, et al. (2008) Measuring relative barrier heights in molecular electronic junctions with transition voltage spectroscopy. Acs Nano. 2: 827-32
Troisi A, Beebe JM, Picraux LB, et al. (2007) Tracing electronic pathways in molecules by using inelastic tunneling spectroscopy. Proceedings of the National Academy of Sciences of the United States of America. 104: 14255-9
Beebe JM, Moore HJ, Lee TR, et al. (2007) Vibronic coupling in semifluorinated alkanethiol junctions: implications for selection rules in inelastic electron tunneling spectroscopy. Nano Letters. 7: 1364-8
Beebe JM, Kushmerick JG. (2007) Nanoscale switch elements from self-assembled monolayers on silver Applied Physics Letters. 90
Kim B, Beebe JM, Olivier C, et al. (2007) Temperature and length dependence of charge transport in redox-active molecular wires incorporating ruthenium(II) bis(σ-arylacetylide) complexes Journal of Physical Chemistry C. 111: 7521-7526
Beebe JM, Kim B, Gadzuk JW, et al. (2006) Transition from direct tunneling to field emission in metal-molecule-metal junctions. Physical Review Letters. 97: 026801
Kim B, Beebe JM, Jun Y, et al. (2006) Correlation between HOMO alignment and contact resistance in molecular junctions: aromatic thiols versus aromatic isocyanides. Journal of the American Chemical Society. 128: 4970-1
Beebe JM, Engelkes VB, Liu J, et al. (2005) Length dependence of charge transport in nanoscopic molecular junctions incorporating a series of rigid thiol-terminated norbornylogs. The Journal of Physical Chemistry. B. 109: 5207-15
Engelkes VB, Beebe JM, Frisbie CD. (2005) Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy. The Journal of Physical Chemistry. B. 109: 16801-10
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