Dana L. Sedin, Ph.D.
Affiliations: | 2000 | University of Colorado, Boulder, Boulder, CO, United States |
Area:
Bioanalytical Chemistry, Spectroscopy, and NanotechnologyGoogle:
"Dana Sedin"Mean distance: 10.06 | S | N | B | C | P |
Parents
Sign in to add mentor| Kathy L. Rowlen | grad student | 2000 | CU Boulder | |
| (Evaluation of atomic force microscopy for the characterization of surface properties.) | ||||
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Publications
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| Sedin DL, Rowlen KL. (2001) Influence of tip size on AFM roughness measurements Applied Surface Science. 182: 40-48 |
| Sedin DL, Rowlen KL. (2000) Adhesion forces measured by atomic force microscopy in humid air Analytical Chemistry. 72: 2183-9 |
| Simpson GJ, Sedin DL, Rowlen KL. (1999) Surface Roughness by Contact versus Tapping Mode Atomic Force Microscopy Langmuir. 15: 1429-1434 |