Peter A. Veneman, Ph.D.

2009 Chemistry University of Arizona, Tucson, AZ 
"Peter Veneman"
Mean distance: 14.56


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Neal R. Armstrong grad student 2009 University of Arizona
 (Scanning current spectroscopy: A conducting probe atomic force microscopy technique for exploring the physical and electronic properties of metal oxide/organic interfaces.)
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MacDonald GA, Veneman PA, Placencia D, et al. (2012) Electrical property heterogeneity at transparent conductive oxide/organic semiconductor interfaces: mapping contact ohmicity using conducting-tip atomic force microscopy. Acs Nano. 6: 9623-36
Ratcliff EL, Veneman PA, Simmonds A, et al. (2010) A planar, chip-based, dual-beam refractometer using an integrated organic light-emitting diode (OLED) light source and organic photovoltaic (OPV) detectors. Analytical Chemistry. 82: 2734-42
Kumaran N, Veneman PA, Minch BA, et al. (2010) Self-organized thin films of hydrogen-bonded phthalocyanines: Characterization of structure and electrical properties on nanometer length scales Chemistry of Materials. 22: 2491-2501
Armstrong NR, Veneman PA, Ratcliff E, et al. (2009) Oxide contacts in organic photovoltaics: characterization and control of near-surface composition in indium-tin oxide (ITO) electrodes. Accounts of Chemical Research. 42: 1748-57
Beam BM, Simmonds A, Veneman PA, et al. (2009) Waveguide-based chemical and spectroelectrochemical sensor platforms Ecs Transactions. 19: 109-117
Armstrong NR, Alloway D, Graham A, et al. (2008) Critical interfaces in new solar cell materials: Organic heterojunctions and heterojunctions involving semiconductor nanoparticles Proceedings of Spie - the International Society For Optical Engineering. 7034
Brumbach M, Veneman PA, Marrikar FS, et al. (2007) Surface composition and electrical and electrochemical properties of freshly deposited and acid-etched indium tin oxide electrodes. Langmuir : the Acs Journal of Surfaces and Colloids. 23: 11089-99
Schulmeyer T, Paniagua SA, Veneman PA, et al. (2007) Modification of BaTiO3 thin films: Adjustment of the effective surface work function Journal of Materials Chemistry. 17: 4563-4570
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