Xianbo Shi, Ph.D.
Affiliations: | 2010 | Chemistry | City University of New York, New York, NY, United States |
Area:
Physical Chemistry, Atomic Physics, Molecular PhysicsGoogle:
"Xianbo Shi"Mean distance: (not calculated yet)
Parents
Sign in to add mentor| Cherice M. Evans | grad student | 2010 | CUNY | |
| (Energy of the quasi-free electron in atomic and molecular fluids.) | ||||
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Publications
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| Rebuffi L, Shi X, Sanchez Del Rio M, et al. (2020) A ray-tracing algorithm for ab initio calculation of thermal load in undulator-based synchrotron beamlines. Journal of Synchrotron Radiation. 27: 1108-1120 |
| Cocco D, Hardin C, Morton D, et al. (2020) Adaptive shape control of wavefront-preserving X-ray mirrors with active cooling and heating. Optics Express. 28: 19242-19254 |
| Liu Y, Seaberg M, Feng Y, et al. (2020) X-ray free-electron laser wavefront sensing using the fractional Talbot effect. Journal of Synchrotron Radiation. 27: 254-261 |
| Sanchez Del Rio M, Celestre R, Glass M, et al. (2019) A hierarchical approach for modeling X-ray beamlines: application to a coherent beamline. Journal of Synchrotron Radiation. 26: 1887-1901 |
| Samadi N, Shi X, Chapman D. (2019) Optimization of a phase-space beam position and size monitor for low-emittance light sources. Journal of Synchrotron Radiation. 26: 1863-1871 |
| Samadi N, Shi X, Dallin L, et al. (2019) A real-time phase-space beam emittance monitoring system. Journal of Synchrotron Radiation. 26: 1213-1219 |
| Ren J, Wang Y, Meng X, et al. (2019) In-plane wavevector distribution in partially coherent X-ray propagation. Journal of Synchrotron Radiation. 26: 1198-1207 |
| Grizolli W, Shi X, Assoufid L. (2019) Influence of optics vibration on synchrotron beam coherence. Optics Letters. 44: 899-902 |
| Qi P, Shi X, Samadi N, et al. (2019) Focusing and energy dispersion properties of a cylindrically bent asymmetric Laue crystal Arxiv: Optics. 11108 |
| Kolodziej T, Stoupin S, Grizolli W, et al. (2018) Efficiency and coherence preservation studies of Be refractive lenses for XFELO application. Journal of Synchrotron Radiation. 25: 354-360 |