Erin M. Sabatke, Ph.D.
Affiliations: | 2002 | University of Arizona, Tucson, AZ |
Area:
Optics PhysicsGoogle:
"Erin Sabatke"Mean distance: (not calculated yet)
Parents
Sign in to add mentor| James H. Burge | grad student | 2002 | University of Arizona | |
| (Fundamentals of the optical design of multiple aperture telescopes with wide fields of view.) | ||||
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Publications
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| Shiri R, Aronstein DL, Smith JS, et al. (2007) Wavefront control toolbox for James Webb Space Telescope Testbed Proceedings of Spie - the International Society For Optical Engineering. 6711 |
| Sabatke E, Acton S, Schwenker J, et al. (2007) Using multifield measurements to eliminate alignment degeneracies in the JWST testbed telescope Proceedings of Spie. 6687: 668707 |
| Sabatke E, Dettmann L, Pierce A, et al. (2007) A snapshot distortion test using Moiré fringes Proceedings of Spie. 6676 |
| Acton DS, Towell T, Schwenker J, et al. (2007) End-to-end commissioning demonstration of the James Webb Space Telescope Proceedings of Spie - the International Society For Optical Engineering. 6687 |
| Sabatke E, Burge J, Sabatke D. (2005) Analytic diffraction analysis of a 32-m telescope with hexagonal segments for high-contrast imaging. Applied Optics. 44: 1360-5 |
| Sabatke E, Burge JH. (2005) Single-arm design method for multiple aperture imaging telescopes Optics Infobase Conference Papers |
| Sabatke EM, Burge JH. (2002) Basic principles in the optical design of imaging multiple aperture systems Proceedings of Spie - the International Society For Optical Engineering. 4832: 236-248 |
| Sabatke EM, Burge JH. (2002) Imaging interferometers using flat primary segments Proceedings of Spie - the International Society For Optical Engineering. 4849: 365-371 |
| Sabatke EM, Saslán JM. (2002) Phase theory for multiple aperture systems Optical Engineering. 41: 647-655 |
| McCarthy DW, Sabatke EM, Sarlot RJ, et al. (2000) Cryogenic beam-combiner for very low background 2- to 20-μm interferometry on the 22.8-m Large Binocular Telescope Astronomical Telescopes and Instrumentation. 4006: 659-672 |