Richard Oleksak

Affiliations: 
2010-2014 Chemical Engineering Oregon State University, Corvallis, OR 
 2015- National Energy Technology Laboratory 
Area:
materials in extreme environments, thin film
Website:
https://www.linkedin.com/in/richard-oleksak-48100323
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"Richard Oleksak"
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Publications

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Flynn B, Oleksak R, Thevuthasan S, et al. (2018) Interfacial Chemistry Induced Modulation of Schottky Barrier Heights: in-situ Measurements of the Pt - Amorphous Indium Gallium Zinc Oxide Interface using X-ray Photoelectron Spectroscopy. Acs Applied Materials & Interfaces
Oleksak RP, Ruther RE, Luo F, et al. (2018) Evaluation of Thermal and Radiation Induced Chemistries of Metal Oxo–Hydroxo Clusters for Next-Generation Nanoscale Inorganic Resists Acs Applied Nano Materials. 1: 4548-4556
Oleksak RP, Devaraj A, Herman GS. (2016) Atomic-scale structural evolution of Ta-Ni-Si amorphous metal thin films Materials Letters. 164: 9-14
Fairley KC, Merrill DR, Woods KN, et al. (2015) Non-uniform Composition Profiles in Inorganic Thin Films from Aqueous Solutions. Acs Applied Materials & Interfaces
Oleksak RP, Stickle WF, Herman GS. (2015) Aqueous-based synthesis of gallium tungsten oxide thin film dielectrics Journal of Materials Chemistry C. 3: 3114-3120
Oleksak RP, Hostetler EB, Flynn BT, et al. (2015) Thermal oxidation of Zr-Cu-Al-Ni amorphous metal thin films Thin Solid Films. 595: 209-213
Flynn BT, Zhang KHL, Shutthanandan V, et al. (2015) Growth and surface modification of LaFeO3 thin films induced by reductive annealing Applied Surface Science. 330: 309-315
Fitzmorris RC, Oleksak RP, Zhou Z, et al. (2015) Structural and optical characterization of CuInS2 quantum dots synthesized by microwave-assisted continuous flow methods Journal of Nanoparticle Research. 17
Oleksak RP, Ruther RE, Luo F, et al. (2014) Chemical and structural investigation of high-resolution patterning with HafSO(x). Acs Applied Materials & Interfaces. 6: 2917-21
Oleksak RP, Herman GS. (2014) Characterization of high-resolution HafSOx inorganic resists Proceedings of Spie - the International Society For Optical Engineering. 9048
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