Minou Bina

Affiliations: 
Chemistry Purdue University, West Lafayette, IN, United States 
Area:
transcriptional control elements in human chromosomes
Website:
http://www.chem.purdue.edu/people/faculty/faculty.asp?itemID=26
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"Minou Bina"
Bio:

http://www.chem.purdue.edu/bina/Education_Professional_Experience.htm
http://proquest.umi.com/pqdlink?did=759187571&Fmt=7&clientId =79356&RQT=309&VName=PQD

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SNBCP

Parents

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Donald Morris Crothers grad student 1974 Yale
 (Conformational Properties of Several Transfer Ribonucleic Acids in Solution)
Maxine F. Singer post-doc 1975-1977 National Cancer Institute

Children

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Anissa E. Buckner grad student 2000 Purdue
Tsia-I Gan grad student 2000 Purdue
Elsie I. Pares-Matos grad student 2000 Purdue
Yamini Dalal grad student 1998-2003 Purdue
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Publications

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Bina M, Wyss P. (2015) Impact of the MLL1 morphemes on codon utilization and preservation in CpG Islands. Biopolymers. 103: 480-90
Smith EN, Ghia EM, DeBoever CM, et al. (2015) Genetic and epigenetic profiling of CLL disease progression reveals limited somatic evolution and suggests a relationship to memory-cell development. Blood Cancer Journal. 5: e303
Tyaginov S, Bina M, Franco J, et al. (2014) A predictive physical model for hot-carrier degradation in ultra-scaled MOSFETs International Conference On Simulation of Semiconductor Processes and Devices, Sispad. 89-92
Tyaginov S, Bina M, Franco J, et al. (2014) Physical modeling of hot-carrier degradation for short-and long-channel MOSFETs Ieee International Reliability Physics Symposium Proceedings. XT.16.1-XT.16.8
Bina M, Wyss P, Novorolsky E, et al. (2013) Discovery of MLL1 binding units, their localization to CpG Islands, and their potential function in mitotic chromatin. Bmc Genomics. 14: 927
Bina M. (2013) Gene regulation. Methods in Molecular Biology (Clifton, N.J.). 977: 1-11
Goes W, Toledano-Luque M, Schanovsky F, et al. (2013) Multi-phonon processes as the origin of reliability issues Ecs Transactions. 58: 31-47
Goes W, Toledano-Luque M, Baumgartner O, et al. (2013) Understanding correlated drain and gate current fluctuations Proceedings of the International Symposium On the Physical and Failure Analysis of Integrated Circuits, Ipfa. 51-56
Toledano-Luque M, Kaczer B, Franco J, et al. (2013) Degradation of time dependent variability due to interface state generation Digest of Technical Papers - Symposium On Vlsi Technology. T190-T191
Bina M. (2013) Preface Methods in Molecular Biology. 977: v-vii
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