Jacques Weber, Ph.D.
Affiliations: | Chemistry | Université de Genève, Genève, Genève, Switzerland |
Area:
Theoretical ChemistryWebsite:
http://www.unige.ch/sciences/chimie/?enseignants/weber_fr.phpGoogle:
"Jacques Weber"Mean distance: 10.49
Children
Sign in to add traineePavel Jungwirth | research assistant | University of Geneva | |
Clemence Corminboeuf | grad student | ||
Olivier Parisel | post-doc | 1995-1996 | Université de Genève |
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Publications
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Vincent TM, Estreicher SK, Weber J, et al. (2020) The Cu photoluminescence defect and the early stages of Cu precipitation in Si Journal of Applied Physics. 127: 85704 |
Stübner R, Kolkovsky V, Weber J, et al. (2020) Identification of the donor and acceptor states of the bond-centered hydrogen–carbon pair in Si and diluted SiGe alloys Journal of Applied Physics. 127: 45701 |
Yarykin N, Shuman VB, Portsel LM, et al. (2019) DLTS Investigation of the Energy Spectrum of Si:Mg Crystals Semiconductors. 53: 789-794 |
Stübner R, Scheffler L, Kolkovsky V, et al. (2016) Single and double acceptor-levels of a carbon-hydrogen defect in n-type silicon Journal of Applied Physics. 119: 205709 |
Lavrov EV, Herklotz F, Weber J. (2015) Fano resonances in photoconductivity spectra of hydrogen donors in ZnO and rutile Semiconductor Science and Technology. 30 |
Scheffler L, Kolkovsky V, Weber J. (2015) Identification of titanium-hydrogen complexes with up to four hydrogen atoms in silicon Journal of Applied Physics. 117 |
Scheffler L, Kolkovsky V, Weber J. (2014) Electrical levels in nickel doped silicon Journal of Applied Physics. 116: 173704 |
Kolkovsky V, Scheffler L, Weber J. (2014) Transition metals (Ti and Co) in silicon and their complexes with hydrogen: A Laplace DLTS study Physica B-Condensed Matter. 439: 24-28 |
Feklisova OV, Yarykin NA, Weber J. (2013) Annealing kinetics of boron-containing centers in electron-irradiated silicon Semiconductors. 47: 228-231 |
Koch SG, Lavrov EV, Weber J. (2012) Photoconductive detection of tetrahedrally coordinated hydrogen in ZnO. Physical Review Letters. 108: 165501 |