Katherine P. Rice
Affiliations: | 2012-2014 | Applied Chemicals & Materials Division | National Institute of Standards and Technology, Gaithersburg, MD, United States |
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| Rice K, Chen Y, Ulfig R, et al. (2020) Fixturing Options for Atom Probe Tomography Microscopy and Microanalysis. 1-2 |
| Geiser B, Reinhard D, Bunton J, et al. (2019) Reconstruction Metrics in Atom Probe Tomography Microscopy and Microanalysis. 25: 336-337 |
| Rice KP, Ulfig RM, Chen Y, et al. (2018) Grain Boundary Analysis of Inconel 718 Using a Novel Atom Probe Design Microscopy and Microanalysis. 24: 2212-2213 |
| Bonifacio CS, Rice KP, Prosa TJ, et al. (2018) Removal of Ga Implantation on FIB-prepared Atom Probe Specimens Using Small Beam and Low Energy Ar+ Milling Microscopy and Microanalysis. 24: 1118-1119 |
| Exertier F, Fontaine AL, Corcoran C, et al. (2018) Atom probe tomography analysis of the reference zircon gj-1: an interlaboratory study Chemical Geology. 495: 27-35 |
| Larson DJ, Ulfig RM, Lenz DR, et al. (2018) Microstructural Investigations in Metals Using Atom Probe Tomography with a Novel Specimen-Electrode Geometry Jom. 70: 1776-1784 |
| Rice KP, Chen Y, Keller RR, et al. (2016) Beam broadening in transmission and conventional EBSD. Micron (Oxford, England : 1993). 95: 42-50 |
| Rice KP, Chen Y, Prosa TJ, et al. (2016) Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 22: 583-8 |
| Chen Y, Rice KP, Prosa TJ, et al. (2016) Correlative t-EBSD Tomography and Atom Probe Tomography Analysis Microscopy and Microanalysis. 22: 682-683 |
| Reddy SM, van Riessen A, Saxey DW, et al. (2016) Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy Geochimica Et Cosmochimica Acta. 195: 158-170 |