Keng Liang

Affiliations: 
Exxon Corporate Research Laboratory, Annandale, NJ, United States 
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"Keng Liang"
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Publications

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Kim C, Kim Y, Song C, et al. (2014) Resolution enhancement in coherent x-ray diffraction imaging by overcoming instrumental noise. Optics Express. 22: 29161-9
Chien CC, Tseng PY, Chen HH, et al. (2013) Imaging cells and sub-cellular structures with ultrahigh resolution full-field X-ray microscopy. Biotechnology Advances. 31: 375-86
Lee CH, Liang KS, Chern MY. (2013) The structures of yttrium iron garnet/gadolinium gallium garnet superlattice thin films studied by synchrotron X-ray surface scattering Journal of the Chinese Chemical Society. 60: 870-876
Liu DG, Chang CH, Liu CY, et al. (2009) A dedicated small-angle X-ray scattering beamline with a superconducting wiggler source at the NSRRC. Journal of Synchrotron Radiation. 16: 97-104
Chu YS, Yi JM, De Carlo F, et al. (2008) Hard-x-ray microscopy with Fresnel zone plates reaches 40nm Rayleigh resolution Applied Physics Letters. 92: 103119
Song YF, Chang CH, Liu CY, et al. (2007) X-ray beamlines for structural studies at the NSRRC superconducting wavelength shifter. Journal of Synchrotron Radiation. 14: 320-5
Liu W, Hsieh WF, Hsu C, et al. (2007) Threading dislocations in domain-matching epitaxial films of ZnO Journal of Applied Crystallography. 40: 924-930
Yin G, Chen F, Hwu Y, et al. (2007) Quantitative phase retrieval in transmission hard x-ray microscope Applied Physics Letters. 90: 181118
Tang M, Song Y, Yin G, et al. (2005) X-ray Microscopy Project at NSRRC Acta Crystallographica Section a Foundations of Crystallography. 61: c117-c117
Hsu C, Jeng U, Lee H, et al. (2005) Structural study of a low dielectric thin film using X-ray reflectivity and grazing incidence small angle X-ray scattering Thin Solid Films. 472: 323-327
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