| Year |
Citation |
Score |
| 2020 |
Trifonov A, Stemmer A, Tel-Vered R. Carbon-coated magnetic nanoparticles as a removable protection layer extending the operation lifetime of bilirubin oxidase-based bioelectrode. Bioelectrochemistry (Amsterdam, Netherlands). 137: 107640. PMID 32891965 DOI: 10.1016/J.Bioelechem.2020.107640 |
0.308 |
|
| 2020 |
Ritz C, Wagner T, Stemmer A. Measurement of electrostatic tip-sample interactions by time-domain Kelvin probe force microscopy. Beilstein Journal of Nanotechnology. 11: 911-921. PMID 32596095 DOI: 10.3762/Bjnano.11.76 |
0.387 |
|
| 2018 |
Wagner T, Menges F, Riel H, Gotsmann B, Stemmer A. Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire. Beilstein Journal of Nanotechnology. 9: 129-136. PMID 29441258 DOI: 10.3762/Bjnano.9.15 |
0.332 |
|
| 2017 |
Tisserant JN, Wagner T, Reissner PA, Beyer H, Fedoryshyn Y, Stemmer A. Visualizing local morphology and conductivity switching in interface-assembled nanoporous C60 thin films. Acs Applied Materials & Interfaces. PMID 28745479 DOI: 10.1021/Acsami.7B06682 |
0.358 |
|
| 2017 |
Beyer H, Kory MJ, Hofer G, Stemmer A, Schlüter AD. Exfoliation of two-dimensional polymer single crystals into thin sheets and investigations of their surface structure by high-resolution atomic force microscopy. Nanoscale. PMID 28660973 DOI: 10.1039/C7Nr02210G |
0.377 |
|
| 2017 |
Mojarad N, Tisserant JN, Beyer H, Dong H, Reissner PA, Fedoryshyn Y, Stemmer A. Monitoring the transformation of aliphatic and fullerene molecules by high-energy electrons using surface-enhanced Raman spectroscopy. Nanotechnology. 28: 165701. PMID 28319037 DOI: 10.1088/1361-6528/Aa655F |
0.331 |
|
| 2016 |
Reissner PA, Tisserant JN, Sánchez-Ferrer A, Mezzenga R, Stemmer A. Solvent-mediated conductance increase of dodecanethiol-stabilized gold nanoparticle monolayers. Beilstein Journal of Nanotechnology. 7: 2057-2064. PMID 28144553 DOI: 10.3762/Bjnano.7.196 |
0.3 |
|
| 2016 |
Reissner PA, Fedoryshyn Y, Tisserant JN, Stemmer A. Resistive switching of alkanethiolated nanoparticle monolayers patterned by electron-beam exposure. Physical Chemistry Chemical Physics : Pccp. PMID 27492444 DOI: 10.1039/C6Cp03928F |
0.31 |
|
| 2016 |
Menges F, Riel H, Stemmer A, Gotsmann B. Nanoscale thermometry by scanning thermal microscopy. The Review of Scientific Instruments. 87: 074902. PMID 27475585 DOI: 10.1063/1.4955449 |
0.303 |
|
| 2016 |
Beyer H, Wagner T, Stemmer A. Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air. Beilstein Journal of Nanotechnology. 7: 432-8. PMID 27335735 DOI: 10.3762/Bjnano.7.38 |
0.382 |
|
| 2016 |
Menges F, Mensch P, Schmid H, Riel H, Stemmer A, Gotsmann B. Temperature mapping of operating nanoscale devices by scanning probe thermometry. Nature Communications. 7: 10874. PMID 26936427 DOI: 10.1038/Ncomms10874 |
0.354 |
|
| 2015 |
Wagner T, Beyer H, Reissner P, Mensch P, Riel H, Gotsmann B, Stemmer A. Kelvin probe force microscopy for local characterisation of active nanoelectronic devices. Beilstein Journal of Nanotechnology. 6: 2193-206. PMID 26734511 DOI: 10.3762/Bjnano.6.225 |
0.411 |
|
| 2015 |
Ruiz-Vargas CS, Reissner PA, Wagner T, Wyss RM, Park HG, Stemmer A. Contact transfer length investigation of a 2D nanoparticle network by scanning probe microscopy. Nanotechnology. 26: 365701. PMID 26291069 DOI: 10.1088/0957-4484/26/36/365701 |
0.339 |
|
| 2013 |
Zheng Z, Ruiz-Vargas CS, Bauer T, Rossi A, Payamyar P, Schütz A, Stemmer A, Sakamoto J, Schlüter AD. Square-micrometer-sized, free-standing organometallic sheets and their square-centimeter-sized multilayers on solid substrates. Macromolecular Rapid Communications. 34: 1670-80. PMID 24115363 DOI: 10.1002/Marc.201300624 |
0.305 |
|
| 2013 |
Rey A, Billardon G, Lörtscher E, Moth-Poulsen K, Stuhr-Hansen N, Wolf H, Bjørnholm T, Stemmer A, Riel H. Deterministic assembly of linear gold nanorod chains as a platform for nanoscale applications. Nanoscale. 5: 8680-8. PMID 23900232 DOI: 10.1039/C3Nr02358C |
0.311 |
|
| 2013 |
Smith PJS, Davies I, Galbraith CG, Stemmer A. Special issue on high-resolution optical imaging Journal of Optics (United Kingdom). 15. DOI: 10.1088/2040-8978/15/9/090201 |
0.321 |
|
| 2012 |
Menges F, Riel H, Stemmer A, Gotsmann B. Quantitative thermometry of nanoscale hot spots. Nano Letters. 12: 596-601. PMID 22214277 DOI: 10.1021/Nl203169T |
0.302 |
|
| 2011 |
Enning R, Ziegler D, Nievergelt A, Friedlos R, Venkataramani K, Stemmer A. A high frequency sensor for optical beam deflection atomic force microscopy. The Review of Scientific Instruments. 82: 043705. PMID 21529011 DOI: 10.1063/1.3575322 |
0.359 |
|
| 2011 |
Ziegler D, Stemmer A. Force gradient sensitive detection in lift-mode Kelvin probe force microscopy. Nanotechnology. 22: 075501. PMID 21233549 DOI: 10.1088/0957-4484/22/7/075501 |
0.389 |
|
| 2009 |
Fiolka R, Wicker K, Heintzmann R, Stemmer A. Simplified approach to diffraction tomography in optical microscopy. Optics Express. 17: 12407-17. PMID 19654642 DOI: 10.1364/Oe.17.012407 |
0.638 |
|
| 2009 |
Beck M, Fiolka R, Stemmer A. Variable phase retarder made of a dielectric elastomer actuator. Optics Letters. 34: 803-5. PMID 19282938 DOI: 10.1364/Ol.34.000803 |
0.634 |
|
| 2009 |
Fiolka RP, Stemmer A. Extending The Resolution In Total Internal Reflection Fluorescence (TIRF) Microscopy Biophysical Journal. 96: 636a. DOI: 10.1016/J.Bpj.2008.12.3364 |
0.393 |
|
| 2008 |
Beck M, Aschwanden M, Stemmer A. Sub-100-nanometre resolution in total internal reflection fluorescence microscopy. Journal of Microscopy. 232: 99-105. PMID 19017206 DOI: 10.1111/J.1365-2818.2008.02075.X |
0.391 |
|
| 2008 |
Münzenberg C, Rossi A, Feldman K, Fiolka R, Stemmer A, Kita-Tokarczyk K, Meier W, Sakamoto J, Lukin O, Schlüter AD. Synthesis of compounds presenting three and four anthracene units as potential connectors to mediate infinite lateral growth at the air/water interface. Chemistry (Weinheim An Der Bergstrasse, Germany). 14: 10797-807. PMID 18942696 DOI: 10.1002/Chem.200800478 |
0.622 |
|
| 2008 |
Stemmer A, Beck M, Fiolka R. Widefield fluorescence microscopy with extended resolution. Histochemistry and Cell Biology. 130: 807-17. PMID 18810482 DOI: 10.1007/S00418-008-0506-8 |
0.669 |
|
| 2008 |
Fiolka R, Beck M, Stemmer A. Structured illumination in total internal reflection fluorescence microscopy using a spatial light modulator. Optics Letters. 33: 1629-31. PMID 18628820 DOI: 10.1364/Ol.33.001629 |
0.659 |
|
| 2008 |
Ziegler D, Naujoks N, Stemmer A. Feed-forward compensation of surface potential in atomic force microscopy. The Review of Scientific Instruments. 79: 063704. PMID 18601410 DOI: 10.1063/1.2947740 |
0.38 |
|
| 2008 |
Fiolka R, Belyaev Y, Ewers H, Stemmer A. Even illumination in total internal reflection fluorescence microscopy using laser light. Microscopy Research and Technique. 71: 45-50. PMID 17886344 DOI: 10.1002/Jemt.20527 |
0.636 |
|
| 2008 |
Schitter G, Stemmer A, Allgöwer F. Robust Two-Degree-Of-Freedom Control Of An Atomic Force Microscope Asian Journal of Control. 6: 156-163. DOI: 10.1111/J.1934-6093.2004.Tb00194.X |
0.395 |
|
| 2007 |
Fiolka R, Stemmer A, Belyaev Y. Virtual slit scanning microscopy. Histochemistry and Cell Biology. 128: 499-505. PMID 17891411 DOI: 10.1007/S00418-007-0342-2 |
0.645 |
|
| 2007 |
Stark RW, Naujoks N, Stemmer A. Multifrequency electrostatic force microscopy in the repulsive regime Nanotechnology. 18. DOI: 10.1088/0957-4484/18/6/065502 |
0.401 |
|
| 2007 |
Ziegler D, Rychen J, Naujoks N, Stemmer A. Compensating electrostatic forces by single-scan Kelvin probe force microscopy Nanotechnology. 18. DOI: 10.1088/0957-4484/18/22/225505 |
0.375 |
|
| 2007 |
Seemann L, Stemmer A, Naujoks N. Selective deposition of functionalized nano-objects by nanoxerography Microelectronic Engineering. 84: 1423-1426. DOI: 10.1016/J.Mee.2007.01.108 |
0.344 |
|
| 2006 |
Naujoks N, Stemmer A. Charge patterns as templates for the assembly of layered biomolecular structures. Journal of Nanoscience and Nanotechnology. 6: 2445-50. PMID 17037854 DOI: 10.1166/Jnn.2006.516 |
0.356 |
|
| 2006 |
Aschwanden M, Stemmer A. Polymeric, electrically tunable diffraction grating based on artificial muscles. Optics Letters. 31: 2610-2. PMID 16902635 DOI: 10.1364/Ol.31.002610 |
0.322 |
|
| 2005 |
Rieber JM, Schitter G, Stemmer A, Allgöwer F. Experimental application of ℓ1-optimal control in atomic force microscopy Ifac Proceedings Volumes (Ifac-Papersonline). 16: 664-669. DOI: 10.3182/20050703-6-Cz-1902.00511 |
0.304 |
|
| 2005 |
Stemmer A, Schitter G, Rieber JM, Allgöwer F. Control strategies towards faster quantitative imaging in atomic force microscopy European Journal of Control. 11: 384-395. DOI: 10.3166/Ejc.11.384-395 |
0.379 |
|
| 2005 |
Stark M, Guckenberger R, Stemmer A, Stark RW. Estimating the transfer function of the cantilever in atomic force microscopy: A system identification approach Journal of Applied Physics. 98. DOI: 10.1063/1.2137887 |
0.357 |
|
| 2005 |
Fedosseev R, Belyaev Y, Frohn J, Stemmer A. Structured light illumination for extended resolution in fluorescence microscopy Optics and Lasers in Engineering. 43: 403-414. DOI: 10.1016/J.Optlaseng.2004.04.008 |
0.382 |
|
| 2005 |
Naujoks N, Stemmer A. Micro- and nanoxerography in liquids - Controlling pattern definition Microelectronic Engineering. 78: 331-337. DOI: 10.1016/J.Mee.2004.12.043 |
0.353 |
|
| 2005 |
Rezek B, Stuchlík J, Kočka J, Stemmer A. Persistent microscopic charge patterns in amorphous silicon thin films for guided assembly of colloids Journal of Non-Crystalline Solids. 351: 3127-3131. DOI: 10.1016/J.Jnoncrysol.2005.07.025 |
0.343 |
|
| 2004 |
Cahill BP, Heyderman LJ, Gobrecht J, Stemmer A. Electro-osmotic streaming on application of traveling-wave electric fields. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 70: 036305. PMID 15524631 DOI: 10.1103/Physreve.70.036305 |
0.704 |
|
| 2004 |
Haefliger D, Stemmer A. Writing subwavelength-sized structures into aluminium films by thermo-chemical aperture-less near-field optical microscopy. Ultramicroscopy. 100: 457-64. PMID 15231339 DOI: 10.1016/J.Ultramic.2003.10.008 |
0.388 |
|
| 2004 |
Stark RW, Schitter G, Stemmer A. Velocity dependent friction laws in contact mode atomic force microscopy. Ultramicroscopy. 100: 309-17. PMID 15231324 DOI: 10.1016/J.Ultramic.2003.11.011 |
0.341 |
|
| 2004 |
Schitter G, Stark RW, Stemmer A. Fast contact-mode atomic force microscopy on biological specimen by model-based control. Ultramicroscopy. 100: 253-7. PMID 15231317 DOI: 10.1016/J.Ultramic.2003.11.008 |
0.359 |
|
| 2004 |
Schitter G, Stemmer A. Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning-probe microscopy Ieee Transactions On Control Systems and Technology. 12: 449-454. DOI: 10.1109/Tcst.2004.824290 |
0.374 |
|
| 2004 |
Stark RW, Schitter G, Stark M, Guckenberger R, Stemmer A. State-space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy Physical Review B. 69: 85412. DOI: 10.1103/Physrevb.69.085412 |
0.334 |
|
| 2004 |
Schitter G, Allgöwer F, Stemmer A. A new control strategy for high-speed atomic force microscopy Nanotechnology. 15: 108-114. DOI: 10.1088/0957-4484/15/1/021 |
0.35 |
|
| 2004 |
Naujoks N, Stemmer A. Using local surface charges for the fabrication of protein patterns Colloids and Surfaces a: Physicochemical and Engineering Aspects. 249: 69-72. DOI: 10.1016/J.Colsurfa.2004.08.053 |
0.392 |
|
| 2003 |
Haefliger D, Stemmer A. Fabrication of near-field optical apertures in aluminium by a highly selective corrosion process in the evanescent field. Journal of Microscopy. 209: 150-4. PMID 12641753 DOI: 10.1046/J.1365-2818.2003.01116.X |
0.357 |
|
| 2003 |
Stark RW, Schitter G, Stemmer A. Tuning the interaction forces in tapping mode atomic force microscopy Physical Review B. 68. DOI: 10.1103/Physrevb.68.085401 |
0.35 |
|
| 2003 |
Rezek B, Mates T, Stuchlı́k J, Kočka J, Stemmer A. Charge storage in undoped hydrogenated amorphous silicon by ambient atomic force microscopy Applied Physics Letters. 83: 1764-1766. DOI: 10.1063/1.1606872 |
0.318 |
|
| 2003 |
Haefliger D, Muenchinger M, Schitter G, Stemmer A. An integrated piezo-acoustic shear-force distance sensor with nanometer resolution for a micropipette tool Sensors and Actuators a: Physical. 103: 353-358. DOI: 10.1016/S0924-4247(02)00406-5 |
0.391 |
|
| 2003 |
Schitter G, Stemmer A. Model-based signal conditioning for high-speed atomic force and friction force microscopy Microelectronic Engineering. 67: 938-944. DOI: 10.1016/S0167-9317(03)00157-6 |
0.388 |
|
| 2003 |
Naujoks N, Stemmer A. Localized functionalization of surfaces with molecules from solution using electrostatic attraction Microelectronic Engineering. 67: 736-741. DOI: 10.1016/S0167-9317(03)00134-5 |
0.369 |
|
| 2003 |
Stark RW, Sakai Stalder M, Stemmer A. Microfluidic etching driven by capillary forces for rapid prototyping of gold structures Microelectronic Engineering. 67: 229-236. DOI: 10.1016/S0167-9317(03)00076-5 |
0.36 |
|
| 2002 |
Mesquida P, Stemmer A. Guiding self-assembly with the tip of an atomic force microscope. Scanning. 24: 117-20. PMID 12074491 DOI: 10.1002/Sca.4950240302 |
0.368 |
|
| 2002 |
Haefliger D, Cahill B, Stemmer A. Fabrication of aluminum electrodes by water and light Journal of Micromechatronics. 2: 215-225. DOI: 10.1163/156856304773954296 |
0.327 |
|
| 2002 |
Schitter G, Stemmer A. Eliminating mechanical perturbations in scanning probe microscopy Nanotechnology. 13: 663-665. DOI: 10.1088/0957-4484/13/5/324 |
0.344 |
|
| 2002 |
Haefliger D, Stemmer A. Nanostructuring of aluminum-coated scanning near-field optical microscope probes by direct, laser thermal oxidation in water Microelectronic Engineering. 61: 523-527. DOI: 10.1016/S0167-9317(02)00460-4 |
0.346 |
|
| 2002 |
Mesquida P, Stemmer A. Maskless nanofabrication using the electrostatic attachment of gold particles to electrically patterned surfaces Microelectronic Engineering. 61: 671-674. DOI: 10.1016/S0167-9317(02)00441-0 |
0.369 |
|
| 2002 |
Mesquida P, Knapp HF, Stemmer A. Charge writing on the nanometre scale in a fluorocarbon film Surface and Interface Analysis. 33: 159-162. DOI: 10.1002/Sia.1181 |
0.339 |
|
| 2002 |
Knapp HF, Mesquida P, Stemmer A. Imaging the surface potential of active purple membrane Surface and Interface Analysis. 33: 108-112. DOI: 10.1002/Sia.1172 |
0.354 |
|
| 2001 |
Frohn JT, Knapp HF, Stemmer A. Three-dimensional resolution enhancement in fluorescence microscopy by harmonic excitation. Optics Letters. 26: 828-30. PMID 18040464 DOI: 10.1364/Ol.26.000828 |
0.353 |
|
| 2001 |
Reilly GC, Knapp HF, Stemmer A, Niederer P, Knothe Tate ML. Investigation of the morphology of the lacunocanalicular system of cortical bone using atomic force microscopy. Annals of Biomedical Engineering. 29: 1074-81. PMID 11853258 DOI: 10.1114/1.1424910 |
0.321 |
|
| 2001 |
Schitter G, Menold P, Knapp HF, Allgöwer F, Stemmer A. High performance feedback for fast scanning atomic force microscopes Review of Scientific Instruments. 72: 3320-3327. DOI: 10.1063/1.1387253 |
0.361 |
|
| 2001 |
Mesquida P, Stemmer A. Attaching Silica Nanoparticles from Suspension onto Surface Charge Patterns Generated by a Conductive Atomic Force Microscope Tip Advanced Materials. 13: 1395-1398. DOI: 10.1002/1521-4095(200109)13:18<1395::Aid-Adma1395>3.0.Co;2-0 |
0.349 |
|
| 2000 |
Frohn JT, Knapp HF, Stemmer A. True optical resolution beyond the Rayleigh limit achieved by standing wave illumination. Proceedings of the National Academy of Sciences of the United States of America. 97: 7232-6. PMID 10840057 DOI: 10.1073/Pnas.130181797 |
0.375 |
|
| 2000 |
Robin F, Jacobs H, Homan O, Stemmer A, Bächtold W. Investigation of the cleaved surface of a p–i–n laser using Kelvin probe force microscopy and two-dimensional physical simulations Applied Physics Letters. 76: 2907-2909. DOI: 10.1063/1.126513 |
0.62 |
|
| 1999 |
Jacobs HO, Knapp HF, Stemmer A. Practical aspects of Kelvin probe force microscopy Review of Scientific Instruments. 70: 1756-1760. DOI: 10.1063/1.1149664 |
0.653 |
|
| 1999 |
Jacobs HO, Stemmer A. Measuring and modifying the electric surface potential distribution on a nanometre scale: a powerful tool in science and technology Surface and Interface Analysis. 27: 361-367. DOI: 10.1002/(Sici)1096-9918(199905/06)27:5/6<361::Aid-Sia482>3.0.Co;2-8 |
0.643 |
|
| 1999 |
Knapp HF, Stemmer A. Preparation, comparison and performance of hydrophobic AFM tips Surface and Interface Analysis. 27: 324-331. DOI: 10.1002/(Sici)1096-9918(199905/06)27:5/6<324::Aid-Sia489>3.0.Co;2-J |
0.357 |
|
| 1998 |
Jacobs HO, Leuchtmann P, Homan OJ, Stemmer A. Resolution and contrast in Kelvin probe force microscopy Journal of Applied Physics. 84: 1168-1173. DOI: 10.1063/1.368181 |
0.641 |
|
| 1997 |
Jacobs HO, Knapp HF, Müller S, Stemmer A. Surface potential mapping: A qualitative material contrast in SPM Ultramicroscopy. 69: 39-49. DOI: 10.1016/S0304-3991(97)00027-2 |
0.631 |
|
| 1996 |
Stemmer A, Jacobs H, Knapp HF. Approaching the nanoworld Proceedings of Spie - the International Society For Optical Engineering. 2906: 80-85. DOI: 10.1117/12.260631 |
0.635 |
|
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