Year |
Citation |
Score |
2003 |
France CB, Schroeder PG, Forsythe JC, Parkinson BA. Scanning tunneling microscopy study of the coverage-dependent structures of pentacene on Au(111) Langmuir. 19: 1274-1281. DOI: 10.1021/La026221V |
0.702 |
|
2003 |
Bloom CJ, Elliott CM, Schroeder PG, France CB, Parkinson BA. Low work function reduced metal complexes as cathodes in organic electroluminescent devices Journal of Physical Chemistry B. 107: 2933-2938. DOI: 10.1021/Jp026865B |
0.655 |
|
2003 |
Schroeder PG, France CB, Park JB, Parkinson BA. Orbital alignment and morphology of pentacene deposited on Au(111) and SnS2 studied using photoemission spectroscopy Journal of Physical Chemistry B. 107: 2253-2261. DOI: 10.1021/Jp025807N |
0.725 |
|
2002 |
Schroeder PG, France CB, Parkinson BA, Schlaf R. Orbital alignment at p-sexiphenyl and coronene/layered materials interfaces measured with photoemission spectroscopy Journal of Applied Physics. 91: 9095-9107. DOI: 10.1063/1.1473217 |
0.728 |
|
2002 |
Schroeder PG, France CB, Park JB, Parkinson BA. Energy level alignment and two-dimensional structure of pentacene on Au(111) surfaces Journal of Applied Physics. 91: 3010-3014. DOI: 10.1063/1.1445286 |
0.714 |
|
2002 |
France CB, Schroeder PG, Parkinson BA. Direct Observation of a Widely Spaced Periodic Row Structure at the Pentacene/Au(111) Interface Using Scanning Tunneling Microscopy Nano Letters. 2: 693-696. DOI: 10.1021/nl025567n |
0.656 |
|
2001 |
Bloom CJ, Elliott CM, Schroeder PG, France CB, Parkinson BA. Tervalent conducting polymers with tailor-made work functions: preparation, characterization, and applications as cathodes in electroluminescent devices. Journal of the American Chemical Society. 123: 9436-42. PMID 11562227 DOI: 10.1021/Ja011333E |
0.624 |
|
2000 |
Schroeder PG, Nelson MW, Parkinson BA, Schlaf R. Investigation of band bending and charging phenomena in frontier orbital alignment measurements of para-quaterphenyl thin films grown on highly oriented pyrolytic graphite and SnS2 Surface Science. 459: 349-364. DOI: 10.1016/S0039-6028(00)00472-6 |
0.692 |
|
1999 |
Nelson MW, Schroeder PG, Schlaf R, Parkinson BA. Two-dimensional dopant profiling of an integrated circuit using bias-applied phase-imaging tapping mode atomic force microscopy Electrochemical and Solid-State Letters. 2: 475-477. DOI: 10.1149/1.1390875 |
0.654 |
|
1999 |
Nelson MW, Schroeder PG, Schlaf R, Parkinson BA. Two-dimensional dopant profiling of patterned Si wafers using phase imaging tapping mode atomic force microscopy with applied biases Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 17: 1354. DOI: 10.1116/1.590760 |
0.65 |
|
1999 |
Schlaf R, Schroeder PG, Nelson MW, Parkinson BA, Lee PA, Nebesny KW, Armstrong NR. Observation of strong band bending in perylene tetracarboxylic dianhydride thin films grown on SnS2 Journal of Applied Physics. 86: 1499-1509. DOI: 10.1063/1.370920 |
0.623 |
|
1999 |
Schlaf R, Schroeder PG, Nelson MW, Parkinson BA, Lee PA, Nebesny KW, Armstrong NR. Observation of strong band bending in perylene tetracarboxylic dianhydride thin films grown on SnS2 Journal of Applied Physics. 86: 1499-1509. DOI: 10.1063/1.370920 |
0.619 |
|
1999 |
Nelson MW, Schroeder PG, Schlaf R, Parkinson BA, Almgren CW, Erickson AN. Spatially resolved dopant profiling of patterned Si wafers by bias-applied phase-imaging tapping-mode atomic force microscopy Applied Physics Letters. 74: 1421-1423. DOI: 10.1063/1.123569 |
0.561 |
|
1999 |
Nelson MW, Schroeder PG, Schlaf R, Parkinson BA, Almgren CW, Erickson AN. Spatially resolved dopant profiling of patterned Si wafers by bias-applied phase-imaging tapping-mode atomic force microscopy Applied Physics Letters. 74: 1421-1423. DOI: 10.1063/1.123569 |
0.603 |
|
1999 |
Schlaf R, Crisafulli LA, Murata H, Merritt CD, Kafafi ZH, Schroeder PG, Nelson MW, Parkinson BA, Lee PA, Nebesny KW, Armstrong NR. Determination of the electronic structure of organic Schottky contacts by photoemission spectroscopy Proceedings of Spie - the International Society For Optical Engineering. 3797: 189-197. |
0.46 |
|
1998 |
Schlaf R, Schroeder PG, Nelson MW, Stübner R, Tiefenbacher S, Jungblut H, Parkinson BA. Influence of electrostatic forces on the imaging process in scanning tunneling microscopy Thin Solid Films. 331: 203-209. DOI: 10.1016/S0040-6090(98)00920-1 |
0.67 |
|
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