Year |
Citation |
Score |
2010 |
Williams P, Franzreb K, Sobers RC, Lörinčík J. On the effect of oxygen flooding on the detection of noble gas ions in a SIMS instrument Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 268: 2758-2765. DOI: 10.1016/J.Nimb.2010.05.037 |
0.621 |
|
2006 |
Sommerfeld T, Franzreb K, Sobers RC, Williams P. Small silicon-oxygen dianions in the gas phase Chemical Physics. 329: 216-221. DOI: 10.1016/J.Chemphys.2006.05.025 |
0.547 |
|
2006 |
Williams P, Sobers RC, Franzreb K, Lörinčík J. Quantitative fundamental SIMS studies using 18O implant standards Applied Surface Science. 252: 6429-6432. DOI: 10.1016/J.Apsusc.2006.02.091 |
0.58 |
|
2005 |
Franzreb K, Sobers RC, Lörinčik J, Williams P. Observation of small long-lived diatomic dications BeH2+ and BeD2+ Physical Review a - Atomic, Molecular, and Optical Physics. 71. DOI: 10.1103/Physreva.71.024701 |
0.419 |
|
2005 |
Franzreb K, Hrušák J, Alikhani ME, Lörinčík J, Sobers RC, Williams P. Erratum: Gas-phase diatomic trications of Se23+, Te23+, and LaF3+ [J. Chem. Phys. 121, 12293 (2004)] The Journal of Chemical Physics. 123: 209901. DOI: 10.1063/1.2135774 |
0.447 |
|
2004 |
Franzreb K, Hrusák J, Alikhani ME, Lörincík J, Sobers RC, Williams P. Gas-phase diatomic trications of Se2(3+), Te2(3+), and LaF3+. The Journal of Chemical Physics. 121: 12293-302. PMID 15606247 DOI: 10.1063/1.1821496 |
0.577 |
|
2004 |
Franzreb K, Sobers RC, Lorincik J, Williams P. Formation of doubly positively charged diatomic ions of Mo2(2+) produced by Ar+ sputtering of an Mo metal surface. The Journal of Chemical Physics. 120: 7983-6. PMID 15267715 DOI: 10.1063/1.1690234 |
0.559 |
|
2004 |
Franzreb K, Sobers RC, Lörincík J, Williams P. Detection of the diatomic dications SiH2+ and AlH2+ Applied Surface Science. 231: 82-85. DOI: 10.1016/J.Apsusc.2004.03.040 |
0.547 |
|
2004 |
Sobers RC, Franzreb K, Williams P. Quantitative measurement of O/Si ratios in oxygen-sputtered silicon using 18O implant standards Applied Surface Science. 231: 729-733. DOI: 10.1016/J.Apsusc.2004.03.033 |
0.581 |
|
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