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Gilbert B. Rayner, Ph.D. - Publications

Affiliations: 
North Carolina State University, Raleigh, NC 
Area:
ultra-thin Si oxyitride devices
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15 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2005 Rayner GB, Lucovsky G, Kang D. Chemical phase separation in Zr silicate alloys: An EXAFS study distinguishing between phase separation with and without XRD detectable crystallization Physica Scripta T. 1022-1025. DOI: 10.1238/Physica.Topical.115a01022  0.622
2004 Lucovsky G, Rayner GB, Kang D, Hinkle CL, Hong JG. A spectroscopic study distinguishing between chemical phase separation with different degrees of crystallinity in Zr(Hf) silicate alloys Surface Science. 566: 772-776. DOI: 10.1016/J.Susc.2004.06.010  0.715
2004 Rayner GB, Kang D, Lucovsky G. Chemical phase separation in Zr silicate alloys: A spectroscopic study distinguishing between chemical phase separation with different degrees of micro- and nano-crystallinity Journal of Non-Crystalline Solids. 338: 151-154. DOI: 10.1016/J.Mee.2004.01.008  0.73
2004 Rayner GB, Kang D, Hinkle CL, Hong JG, Lucovsky G. Chemical phase separation in Zr silicate alloys: A spectroscopic study distinguishing between chemical phase separation with different degree of micro- and nano-crystallinity Microelectronic Engineering. 72: 304-309. DOI: 10.1016/j.mee.2004.01.008  0.709
2004 Lucovsky G, Rayner GB, Kang D, Hinkle CL, Hong JG. A spectroscopic study distinguishing between chemical phase separation with different degrees of crystallinity in Hf(Zr) silicate alloys Applied Surface Science. 234: 429-433. DOI: 10.1016/j.apsusc.2004.05.075  0.714
2003 Rayner GB, Kang D, Lucovsky G. Spectroscopic study of chemical phase separation in zirconium silicate alloys Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 21: 1783. DOI: 10.1116/1.1593646  0.694
2003 Bae C, Rayner GB, Lucovsky G. Device-quality GaN-dielectric interfaces by 300 °C remote plasma processing Applied Surface Science. 216: 119-123. DOI: 10.1016/S0169-4332(03)00497-5  0.445
2003 Lucovsky G, Rayner GB, Zhang Y, Fulton CC, Nemanich RJ, Appel G, Ade H, Whitten JL. Electronic structure of transition metal high-k dielectrics: Interfacial band offset energies for microelectronic devices Applied Surface Science. 212: 563-569. DOI: 10.1016/S0169-4332(03)00055-2  0.656
2003 Rayner GB, Kang D, Lucovsky G. Spectroscopic study of chemical phase separation in zirconium silicate alloys Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 21: 1783-1791.  0.578
2002 Rayner GB, Kang D, Zhang Y, Lucovsky G. Nonlinear composition dependence of x-ray photoelectron spectroscopy and Auger electron spectroscopy features in plasma-deposited zirconium silicate alloy thin films Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 1748-1758. DOI: 10.1116/1.1493788  0.594
2002 Lucovsky G, Zhang Y, Rayner GB, Appel G, Ade H, Whitten JL. Electronic structure of high-k transition metal oxides and their silicate and aluminate alloys Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 1739-1747. DOI: 10.1116/1.1493787  0.555
2001 Lucovsky G, Rayner GB, Kang D, Appel G, Johnson RS, Zhang Y, Sayers DE, Ade H, Whitten JL. Electronic structure of noncrystalline transition metal silicate and aluminate alloys Applied Physics Letters. 79: 1775-1777. DOI: 10.1063/1.1404997  0.591
2001 Lucovsky G, Rayner GB, Johnson RS. Chemical and physical limits on the performance of metal silicate high-k gate dielectrics Microelectronics and Reliability. 41: 937-945. DOI: 10.1016/S0026-2714(01)00046-4  0.613
2000 Lucovsky G, Rayner GB. Microscopic model for enhanced dielectric constants in low concentration SiO2-rich noncrystalline Zr and Hf silicate alloys Applied Physics Letters. 77: 2912-2914. DOI: 10.1063/1.1320860  0.573
2000 Lucovsky G, Rayner GB. Microscopic model for enhanced dielectric constants in low concentration SiO2-rich noncrystalline Zr and Hf silicate alloys Applied Physics Letters. 77: 2912-2914.  0.327
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