Adam G. Gagorik, Ph.D. - Publications

Institution:
University of Pittsburgh, Pittsburgh, PA, United States
Area:
Chemistry

7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2016 Gagorik AG, Savoie BM, Jackson NE, Agrawal A, Choudhary A, Ratner MA, Schatz GC, Kohlstedt KL. Improved Scaling of Molecular Network Calculations: The Emergence of Molecular Domains. The Journal of Physical Chemistry Letters. PMID 28036172 DOI: 10.1021/Acs.Jpclett.6B02921  0.476
2015 Gagorik AG, Mohin JW, Kowalewski T, Hutchison GR. Effects of Delocalized Charge Carriers in Organic Solar Cells: Predicting Nanoscale Device Performance from Morphology Advanced Functional Materials. 25: 1996-2003. DOI: 10.1002/Adfm.201402332  0.76
2013 Gagorik AG, Mohin JW, Kowalewski T, Hutchison GR. Monte Carlo Simulations of Charge Transport in 2D Organic Photovoltaics. The Journal of Physical Chemistry Letters. 4: 36-42. PMID 26291208 DOI: 10.1021/Jz3016292  0.723
2013 Gagorik AG, Mohin JW, Kowalewski T, Hutchison GR. Monte Carlo simulations of charge transport in 2D organic photovoltaics Journal of Physical Chemistry Letters. 4: 36-42. DOI: 10.1021/jz3016292  0.695
2013 Hoffmann PB, Gagorik AG, Chen X, Hutchison GR. Asymmetric surface potential energy distributions in organic electronic materials via Kelvin probe force microscopy Journal of Physical Chemistry C. 117: 18367-18374. DOI: 10.1021/Jp406781X  0.668
2012 Gagorik AG, Hutchison GR. Simulating charge injection and dynamics in microscale organic field-effect transistors Journal of Physical Chemistry C. 116: 21232-21239. DOI: 10.1021/Jp306597N  0.682
2012 Madison TA, Gagorik AG, Hutchison GR. Charge transport in imperfect organic field effect transistors: Effects of charge traps Journal of Physical Chemistry C. 116: 11852-11858. DOI: 10.1021/Jp207421N  0.44
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