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Emma J. Dell, Ph.D. - Publications

Affiliations: 
2015 Chemistry Columbia University, New York, NY 
Area:
integrating reaction chemistry into electrical devices
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2015 Capozzi B, Xia J, Adak O, Dell EJ, Liu ZF, Taylor JC, Neaton JB, Campos LM, Venkataraman L. Single-molecule diodes with high rectification ratios through environmental control. Nature Nanotechnology. 10: 522-7. PMID 26005998 DOI: 10.1038/Nnano.2015.97  0.353
2015 Dell EJ, Capozzi B, Xia J, Venkataraman L, Campos LM. Molecular length dictates the nature of charge carriers in single-molecule junctions of oxidized oligothiophenes. Nature Chemistry. 7: 209-14. PMID 25698329 DOI: 10.1038/Nchem.2160  0.386
2015 Dell EJ, Capozzi B, Xia J, Venkataraman L, Campos LM. Molecular electronics under the microscope Nature Chemistry. 7: 181-181. PMID 25698315 DOI: 10.1038/Nchem.2200  0.373
2014 Capozzi B, Dell EJ, Berkelbach TC, Reichman DR, Venkataraman L, Campos LM. Length-dependent conductance of oligothiophenes. Journal of the American Chemical Society. 136: 10486-92. PMID 25003761 DOI: 10.1021/Ja505277Z  0.354
2014 Wei S, Xia J, Dell EJ, Jiang Y, Song R, Lee H, Rodenbough P, Briseno AL, Campos LM. Bandgap engineering through controlled oxidation of polythiophenes. Angewandte Chemie (International Ed. in English). 53: 1832-6. PMID 24505004 DOI: 10.1002/Anie.201309398  0.312
2013 Dell EJ, Capozzi B, DuBay KH, Berkelbach TC, Moreno JR, Reichman DR, Venkataraman L, Campos LM. Impact of molecular symmetry on single-molecule conductance. Journal of the American Chemical Society. 135: 11724-7. PMID 23905714 DOI: 10.1021/Ja4055367  0.332
2012 Dell EJ, Campos LM. The preparation of thiophene-S,S-dioxides and their role in organic electronics Journal of Materials Chemistry. 22: 12945-12952. DOI: 10.1039/C2Jm31220D  0.342
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