Tao Feng, Ph.D. - Publications
Affiliations: | 2006 | California Institute of Technology, Pasadena, CA |
Area:
photovoltaicsYear | Citation | Score | |||
---|---|---|---|---|---|
2007 | Feng T, Miller G, Atwater HA. Charge retention characteristics of silicon nanocrystal layers by ultrahigh vacuum atomic force microscopy Journal of Applied Physics. 102: 034305. DOI: 10.1063/1.2764001 | 0.563 | |||
2006 | Walters RJ, Carreras J, Feng T, Bell LD, Atwater HA. Silicon nanocrystal field-effect light-emitting devices Ieee Journal On Selected Topics in Quantum Electronics. 12: 1647-1655. DOI: 10.1109/Jstqe.2006.885387 | 0.493 | |||
2005 | Feng T, Yu H, Dicken M, Heath JR, Atwater HA. Probing the size and density of silicon nanocrystals in nanocrystal memory device applications Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1852078 | 0.454 | |||
2002 | Feng T, Atwater HA. Quantitative Charge Imaging of Silicon Nanocrystals by Atomic Force Microscopy Mrs Proceedings. 737. DOI: 10.1557/Proc-737-F1.7 | 0.558 | |||
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