Year |
Citation |
Score |
2013 |
Zheng P, Bryan SE, Yang Y, Murali R, Naeemi A, Meindl JD. Hydrogenation of graphene nanoribbon edges: Improvement in carrier transport Ieee Electron Device Letters. 34: 707-709. DOI: 10.1109/Led.2013.2253593 |
0.633 |
|
2012 |
Bryan SE, Brenner K, Yang Y, Murali R, Meindl JD. P-type electrical transport of chemically doped epitaxial graphene nanoribbons Ieee Electron Device Letters. 33: 866-868. DOI: 10.1109/Led.2012.2189432 |
0.548 |
|
2012 |
Yang Y, Brenner K, Murali R. The influence of atmosphere on electrical transport in graphene Carbon. 50: 1727-1733. DOI: 10.1016/J.Carbon.2011.12.008 |
0.364 |
|
2012 |
Brenner K, Yang Y, Murali R. Edge doping of graphene sheets Carbon. 50: 637-645. DOI: 10.1016/J.Carbon.2011.09.021 |
0.41 |
|
2011 |
Yang Y, Murali R. Binding mechanisms of molecular oxygen and moisture to graphene Applied Physics Letters. 98: 93116. DOI: 10.1063/1.3562317 |
0.368 |
|
2011 |
Brenner K, Murali R. In situ doping of graphene by exfoliation in a nitrogen ambient Applied Physics Letters. 98. DOI: 10.1063/1.3562018 |
0.381 |
|
2011 |
Bryan SE, Yang Y, Murali R. Conductance of Epitaxial Graphene Nanoribbons: Influence of Size Effects and Substrate Morphology Journal of Physical Chemistry C. 115: 10230-10235. DOI: 10.1021/Jp200543F |
0.395 |
|
2010 |
Yang Y, Murali R. Impact of Size Effect on Graphene Nanoribbon Transport Ieee Electron Device Letters. 31: 237-239. DOI: 10.1109/Led.2009.2039915 |
0.412 |
|
2010 |
Meindl J, Naeemi A, Bakir M, Murali R. Nanoelectronics in retrospect, prospect and principle Digest of Technical Papers - Ieee International Solid-State Circuits Conference. 53: 31-35. DOI: 10.1109/ISSCC.2010.5434062 |
0.611 |
|
2010 |
Brenner K, Murali R. Single step, complementary doping of graphene Applied Physics Letters. 96. DOI: 10.1063/1.3308482 |
0.396 |
|
2009 |
Murali R, Meindl JD. What is graphene? Acm Sigda Newsletter. 39: 1-1. DOI: 10.1145/1862906.1862907 |
0.563 |
|
2009 |
Murali R, Brenner K, Yang Y, Beck T, Meindl JD. Resistivity of graphene nanoribbon interconnects Ieee Electron Device Letters. 30: 611-613. DOI: 10.1109/Led.2009.2020182 |
0.537 |
|
2009 |
Murali R, Yang Y, Brenner K, Beck T, Meindl JD. Breakdown current density of graphene nanoribbons Applied Physics Letters. 94. DOI: 10.1063/1.3147183 |
0.564 |
|
2007 |
Murali R, Brown D, Martin KP, Meindl JD. Improving electron beam resist sensitivity by preexposure to deep ultraviolet radiation Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 25: 2064-2067. DOI: 10.1116/1.2794070 |
0.485 |
|
2007 |
Murali R, Meindl JD. Modeling the effect of source/drain junction depth on bulk-MOSFET scaling Solid-State Electronics. 51: 823-827. DOI: 10.1016/J.Sse.2007.03.012 |
0.524 |
|
2006 |
Murali R, Brown DK, Martin KP, Meindl JD. Process optimization and proximity effect correction for gray scale e-beam lithography Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 24: 2936-2939. DOI: 10.1116/1.2357962 |
0.497 |
|
2004 |
Murali R, Austin BL, Wang L, Meindl JD. Short-channel modeling of bulk accumulation MOSFETs Ieee Transactions On Electron Devices. 51: 940-947. DOI: 10.1109/Ted.2004.828276 |
0.662 |
|
2002 |
Murali R, Austin BL, Wang L, Meindl JD. Scaled accumulation FETS for ultra-low power logic Proceedings of the Annual Ieee International Asic Conference and Exhibit. 2002: 371-375. DOI: 10.1109/ASIC.2002.1158087 |
0.631 |
|
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