Year |
Citation |
Score |
2015 |
Coakley KJ, Imtiaz A, Wallis TM, Weber JC, Berweger S, Kabos P. Adaptive and robust statistical methods for processing near-field scanning microwave microscopy images. Ultramicroscopy. 150: 1-9. PMID 25463325 DOI: 10.1016/J.Ultramic.2014.11.014 |
0.349 |
|
2014 |
Weber JC, Blanchard PT, Sanders AW, Gertsch JC, George SM, Berweger S, Imtiaz A, Coakley KJ, Wallis TM, Bertness KA, Kabos P, Sanford NA, Bright VM. GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy. Nanotechnology. 25: 415502. PMID 25258349 DOI: 10.1088/0957-4484/25/41/415502 |
0.368 |
|
2014 |
Imtiaz A, Wallis TM, Kabos P. Near-field scanning microwave microscopy: An emerging research tool for nanoscale metrology Ieee Microwave Magazine. 15: 52-64. DOI: 10.1109/Mmm.2013.2288711 |
0.31 |
|
2014 |
Imtiaz A, Wallis TM, Weber JC, Coakley KJ, Brubaker MD, Blanchard PT, Bertness KA, Sanford NA, Kabos P. Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope Applied Physics Letters. 104. DOI: 10.1063/1.4886963 |
0.355 |
|
2014 |
Weber JC, Blanchard PT, Sanders AW, Imtiaz A, Wallis TM, Coakley KJ, Bertness KA, Kabos P, Sanford NA, Bright VM. Gallium nitride nanowire probe for near-field scanning microwave microscopy Applied Physics Letters. 104. DOI: 10.1063/1.4861862 |
0.362 |
|
2013 |
Imtiaz A, Wallis TM, Kabos P. Near-field scanning microwave microscope (NSMM) Access Science. DOI: 10.1036/1097-8542.Yb130175 |
0.372 |
|
2012 |
Weber JC, Schlager JB, Sanford NA, Imtiaz A, Wallis TM, Mansfield LM, Coakley KJ, Bertness KA, Kabos P, Bright VM. A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics. The Review of Scientific Instruments. 83: 083702. PMID 22938298 DOI: 10.1063/1.4740513 |
0.503 |
|
2012 |
Imtiaz A, Wallis TM, Lim SH, Tanbakuchi H, Huber HP, Hornung A, Hinterdorfer P, Smoliner J, Kienberger F, Kabos P. Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope Journal of Applied Physics. 111. DOI: 10.1063/1.4716026 |
0.465 |
|
2012 |
Huber HP, Humer I, Hochleitner M, Fenner M, Moertelmaier M, Rankl C, Imtiaz A, Wallis TM, Tanbakuchi H, Hinterdorfer P, Kabos P, Smoliner J, Kopanski JJ, Kienberger F. Calibrated nanoscale dopant profiling using a scanning microwave microscope Journal of Applied Physics. 111. DOI: 10.1063/1.3672445 |
0.444 |
|
2011 |
Wallis TM, Gu D, Imtiaz A, Smith CS, Chiang CJ, Kabos P, Blanchard PT, Sanford NA, Bertness KA. Electrical characterization of photoconductive gan nanowires from 50 MHz to 33 GHz Ieee Transactions On Nanotechnology. 10: 832-838. DOI: 10.1109/TNANO.2010.2084588 |
0.301 |
|
2011 |
Kim K, Wallis TM, Rice P, Gu D, Lim SH, Imtiaz A, Kabos P, Filipovic DS. High-frequency characterization of contact resistance and conductivity of platinum nanowires Ieee Transactions On Microwave Theory and Techniques. 59: 2647-2654. DOI: 10.1109/Tmtt.2011.2163417 |
0.368 |
|
2011 |
Weber JC, Bertness KA, Schlager JB, Sanford NA, Imtiaz A, Wallis TM, Kabos P, Coakley KJ, Bright VM, Mansfield LM. Microwave near-field probes for photovoltaic applications Conference Record of the Ieee Photovoltaic Specialists Conference. 001978-001982. DOI: 10.1109/PVSC.2011.6186341 |
0.361 |
|
2011 |
Lim SH, Wallis TM, Imtiaz A, Gu D, Krivosik P, Kabos P. Influence of periodic patterning on the magnetization response of micromagnetic structures Ieee Magnetics Letters. 2. DOI: 10.1109/Lmag.2011.2119394 |
0.339 |
|
2011 |
Gu D, Wallis TM, Blanchard P, Lim SH, Imtiaz A, Bertness KA, Sanford NA, Kabos P. De-embedding parasitic elements of GaN nanowire metal semiconductor field effect transistors by use of microwave measurements Applied Physics Letters. 98. DOI: 10.1063/1.3597408 |
0.364 |
|
2011 |
Lim SH, Wallis TM, Imtiaz A, Gu D, Krivosik P, Kabos P. Comparison of electrical techniques for magnetization dynamics measurements in micro/nanoscale structures Journal of Applied Physics. 109. DOI: 10.1063/1.3544480 |
0.312 |
|
2010 |
Huber HP, Moertelmaier M, Wallis TM, Chiang CJ, Hochleitner M, Imtiaz A, Oh YJ, Schilcher K, Dieudonne M, Smoliner J, Hinterdorfer P, Rosner SJ, Tanbakuchi H, Kabos P, Kienberger F. Calibrated nanoscale capacitance measurements using a scanning microwave microscope. The Review of Scientific Instruments. 81: 113701. PMID 21133472 DOI: 10.1063/1.3491926 |
0.478 |
|
2010 |
Bertness KA, Schlager JB, Sanford NA, Imtiaz A, Wallis TM, Weber JC, Kabos P, Mansfield LM. Application of microwave scanning probes to photovoltaic materials Conference Record of the Ieee Photovoltaic Specialists Conference. 1669-1674. DOI: 10.1109/PVSC.2010.5616057 |
0.315 |
|
2010 |
Kim K, Wallis TM, Rice P, Chiang CJ, Imtiaz A, Kabos P, Filipovic DS. A framework for broadband characterization of individual nanowires Ieee Microwave and Wireless Components Letters. 20: 178-180. DOI: 10.1109/Lmwc.2010.2040224 |
0.396 |
|
2010 |
Kuepferling M, Serpico C, Pufall M, Rippard W, Wallis TM, Imtiaz A, Krivosik P, Pasquale M, Kabos P. Two modes behavior of vortex oscillations in spin-transfer nanocontacts subject to in-plane magnetic fields Applied Physics Letters. 96. DOI: 10.1063/1.3455883 |
0.301 |
|
2010 |
Chiang CJ, Wallis TM, Gu D, Imtiaz A, Kabos P, Blanchard PT, Bertness KA, Sanford NA, Kim K, Filipovic D. High frequency characterization of a Schottky contact to a GaN nanowire bundle Journal of Applied Physics. 107. DOI: 10.1063/1.3428391 |
0.406 |
|
2010 |
Imtiaz A, Wallis TM, Lim SH, Chisum J, Popovic Z, Kabos P. Near-field antenna as a Scanning Microwave Probe for characterization of materials and devices Eucap 2010 - the 4th European Conference On Antennas and Propagation. |
0.357 |
|
2009 |
Chang YJ, Gray JM, Imtiaz A, Seghete D, Mitch Wallis T, George SM, Kabos P, Rogers CT, Bright VM. Micromachined resonators of high Q-factor based on atomic layer deposited alumina Sensors and Actuators, a: Physical. 154: 229-237. DOI: 10.1016/J.Sna.2008.11.015 |
0.381 |
|
2007 |
Wallis TM, Imtiaz A, Nembach HT, Rice P, Kabos P. Metrology for high-frequency nanoelectronics Aip Conference Proceedings. 931: 525-529. DOI: 10.1063/1.2799429 |
0.31 |
|
2007 |
Imtiaz A, Anlage SM, Barry JD, Melngailis J. Nanometer-scale material contrast imaging with a near-field microwave microscope Applied Physics Letters. 90. DOI: 10.1063/1.2719164 |
0.587 |
|
2006 |
Imtiaz A, Anlage SM. Effect of tip geometry on contrast and spatial resolution of the near-field microwave microscope Journal of Applied Physics. 100. DOI: 10.1063/1.2234801 |
0.569 |
|
2005 |
Imtiaz A, Pollak M, Anlage SM, Barry JD, Melngailis J. Near-field microwave microscopy on nanometer length scales Journal of Applied Physics. 97. DOI: 10.1063/1.1844614 |
0.606 |
|
2003 |
Imtiaz A, Anlage SM. A novel STM-assisted microwave microscope with capacitance and loss imaging capability. Ultramicroscopy. 94: 209-16. PMID 12524191 DOI: 10.1016/S0304-3991(02)00291-7 |
0.613 |
|
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