Year |
Citation |
Score |
2020 |
Kim J, Jang C, Wang X, Paglione J, Hong S, Sayed S, Chun D, Kim D. Electrical detection of the inverse Edelstein effect on the surface of SmB6 Physical Review B. 102. DOI: 10.1103/Physrevb.102.054410 |
0.504 |
|
2019 |
Kim J, Jang C, Wang X, Paglione J, Hong S, Lee J, Choi H, Kim D. Electrical detection of the surface spin polarization of the candidate topological Kondo insulator
SmB6 Physical Review B. 99. DOI: 10.1103/Physrevb.99.245148 |
0.531 |
|
2019 |
Kim SJ, Park YH, Jang C, Hruban A, Koo HC. Anisotropic magnetoresistance in a Ni81Fe19/SiO2/Ca-Bi2Se3 hybrid structure Thin Solid Films. 676: 87-91. DOI: 10.1016/J.Tsf.2019.03.004 |
0.323 |
|
2015 |
Park TE, Suh J, Seo D, Park J, Lin DY, Huang YS, Choi HJ, Wu J, Jang C, Chang J. Hopping conduction in p -type MoS2 near the critical regime of the metal-insulator transition Applied Physics Letters. 107. DOI: 10.1063/1.4936571 |
0.325 |
|
2014 |
Suh J, Park TE, Lin DY, Fu D, Park J, Jung HJ, Chen Y, Ko C, Jang C, Sun Y, Sinclair R, Chang J, Tongay S, Wu J. Doping against the native propensity of MoS2: degenerate hole doping by cation substitution. Nano Letters. 14: 6976-82. PMID 25420217 DOI: 10.1021/Nl503251H |
0.387 |
|
2010 |
Cullen WG, Yamamoto M, Burson KM, Chen JH, Jang C, Li L, Fuhrer MS, Williams ED. High-fidelity conformation of graphene to SiO2 topographic features. Physical Review Letters. 105: 215504. PMID 21231322 DOI: 10.1103/PhysRevLett.105.215504 |
0.717 |
|
2009 |
Chen JH, Cullen WG, Jang C, Fuhrer MS, Williams ED. Defect scattering in graphene. Physical Review Letters. 102: 236805. PMID 19658959 DOI: 10.1103/Physrevlett.102.236805 |
0.703 |
|
2009 |
Fuhrer MS, Chen JH, Jang C, Cho S, Xiao S, Ishigami M, Cullen WG, Williams ED. Scattering mechanisms in graphene Device Research Conference - Conference Digest, Drc. 193. DOI: 10.1109/DRC.2009.5354947 |
0.701 |
|
2009 |
Chen JH, Jang C, Ishigami M, Xiao S, Cullen WG, Williams ED, Fuhrer MS. Diffusive charge transport in graphene on SiO2 Solid State Communications. 149: 1080-1086. DOI: 10.1016/J.Ssc.2009.02.042 |
0.751 |
|
2008 |
Jang C, Adam S, Chen JH, Williams ED, Das Sarma S, Fuhrer MS. Tuning the effective fine structure constant in graphene: opposing effects of dielectric screening on short- and long-range potential scattering. Physical Review Letters. 101: 146805. PMID 18851558 DOI: 10.1103/Physrevlett.101.146805 |
0.663 |
|
2008 |
Chen JH, Jang C, Xiao S, Ishigami M, Fuhrer MS. Intrinsic and extrinsic performance limits of graphene devices on SiO2. Nature Nanotechnology. 3: 206-9. PMID 18654504 DOI: 10.1038/Nnano.2008.58 |
0.731 |
|
2008 |
Chen JH, Jang C, Adam S, Fuhrer MS, Williams ED, Ishigami M. Charged-impurity scattering in graphene Nature Physics. 4: 377-381. DOI: 10.1038/Nphys935 |
0.731 |
|
2007 |
Chen JH, Ishigami M, Jang C, Hines DR, Fuhrer MS, Williams ED. Printed graphene circuits Advanced Materials. 19: 3623-3627. DOI: 10.1002/Adma.200701059 |
0.695 |
|
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