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Yili Hong, Ph.D. - Publications

Affiliations: 
2009 Statistics Iowa State University, Ames, IA, United States 
Area:
Statistics
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50 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Shan Q, Hong Y, Meeker WQ. Seasonal warranty prediction based on recurrent event data Annals of Applied Statistics. 14: 929-955. DOI: 10.1214/20-Aoas1333  0.56
2020 Lu L, Wang BX, Hong Y, Ye Z. General Path Models for Degradation Data with Multiple Characteristics and Covariates Technometrics. 1-16. DOI: 10.1080/00401706.2020.1796814  0.372
2020 Xu L, Gotwalt C, Hong Y, King CB, Meeker WQ. Applications of the Fractional-Random-Weight Bootstrap The American Statistician. 1-21. DOI: 10.1080/00031305.2020.1731599  0.542
2020 Wang X, Wang BX, Jiang PH, Hong Y. Accurate reliability inference based on Wiener process with random effects for degradation data Reliability Engineering & System Safety. 193: 106631. DOI: 10.1016/J.Ress.2019.106631  0.419
2020 Fang G, Pan R, Hong Y. Copula-based reliability analysis of degrading systems with dependent failures Reliability Engineering & System Safety. 193: 106618. DOI: 10.1016/J.Ress.2019.106618  0.392
2020 Xu L, Wang Y, Lux T, Chang T, Bernard J, Li B, Hong Y, Cameron K, Watson L. Modeling I/O performance variability in high-performance computing systems using mixture distributions Journal of Parallel and Distributed Computing. 139: 87-98. DOI: 10.1016/J.Jpdc.2020.01.005  0.377
2020 Wang X, Wang BX, Wu W, Hong Y. Reliability analysis for accelerated degradation data based on the Wiener process with random effects Quality and Reliability Engineering International. DOI: 10.1002/Qre.2668  0.353
2020 Lee IC, Tseng ST, Hong Y. Global planning of accelerated degradation tests based on exponential dispersion degradation models Naval Research Logistics. 67: 469-483. DOI: 10.1002/Nav.21923  0.323
2019 Ding Y, Yang Q, King CB, Hong Y. A General Accelerated Destructive Degradation Testing Model for Reliability Analysis Ieee Transactions On Reliability. 68: 1272-1282. DOI: 10.1109/Tr.2018.2883983  0.416
2019 Cameron KW, Anwar A, Cheng Y, Xu L, Li B, Ananth U, Bernard J, Jearls C, Lux T, Hong Y, Watson LT, Butt AR. MOANA: Modeling and Analyzing I/O Variability in Parallel System Experimental Design Ieee Transactions On Parallel and Distributed Systems. 30: 1843-1856. DOI: 10.1109/Tpds.2019.2892129  0.32
2018 Yuan M, Tang CY, Hong Y, Yang J. Disentangling and assessing uncertainties in multiperiod corporate default risk predictions The Annals of Applied Statistics. 12: 2587-2617. DOI: 10.1214/18-Aoas1170  0.347
2018 Zhang M, Hong Y, Balakrishnan N. The generalized Poisson-binomial distribution and the computation of its distribution function Journal of Statistical Computation and Simulation. 88: 1515-1527. DOI: 10.1080/00949655.2018.1440294  0.373
2018 Lee I, Hong Y, Tseng S, Dasgupta T. Sequential Bayesian Design for Accelerated Life Tests Technometrics. 60: 472-483. DOI: 10.1080/00401706.2018.1437475  0.377
2018 Hong Y, Zhang M, Meeker WQ. Big data and reliability applications: The complexity dimension Journal of Quality Technology. 50: 135-149. DOI: 10.1080/00224065.2018.1438007  0.54
2018 King CB, Xie Y, Hong Y, Van Mullekom JH, DeHart SP, DeFeo PA. A comparison of traditional and maximum likelihood approaches to estimating thermal indices for polymeric materials Journal of Quality Technology. 50: 117-129. DOI: 10.1080/00224065.2018.1406770  0.352
2018 He K, Zhang Q, Hong Y. Profile monitoring based quality control method for fused deposition modeling process Journal of Intelligent Manufacturing. 30: 947-958. DOI: 10.1007/S10845-018-1424-9  0.315
2017 Liu X, Liu C, Hong Y. Analysis of multiple tank car releases in train accidents. Accident; Analysis and Prevention. 107: 164-172. PMID 28865248 DOI: 10.1016/J.Aap.2017.07.007  0.322
2017 Duan Y, Hong Y, Meeker WQ, Stanley DL, Gu X. Photodegradation modeling based on laboratory accelerated test data and predictions under outdoor weathering for polymeric materials The Annals of Applied Statistics. 11: 2052-2079. DOI: 10.1214/17-Aoas1060  0.575
2017 Yang Q, Hong Y, Zhang N, Li J. A Copula-Based Trend-Renewal Process Model for Analysis of Repairable Systems With Multitype Failures Ieee Transactions On Reliability. 66: 590-602. DOI: 10.1109/Tr.2017.2693155  0.379
2017 Xie Y, Hong Y, Escobar LA, Meeker WQ. A general algorithm for computing simultaneous prediction intervals for the (log)-location-scale family of distributions Journal of Statistical Computation and Simulation. 87: 1559-1576. DOI: 10.1080/00949655.2016.1277426  0.623
2017 Xie Y, King CB, Hong Y, Yang Q. Semiparametric Models for Accelerated Destructive Degradation Test Data Analysis Technometrics. 60: 222-234. DOI: 10.1080/00401706.2017.1321584  0.392
2017 Wang X, Ye Z, Hong Y, Tang L. Analysis of Field Return Data With Failed-But-Not-Reported Events Technometrics. 60: 90-100. DOI: 10.1080/00401706.2017.1292957  0.411
2017 Xu Z, Hong Y, Meeker WQ, Osborn BE, Illouz K. A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data Technometrics. 59: 225-236. DOI: 10.1080/00401706.2016.1164758  0.572
2016 Yuan M, Hong Y, Escobar LA, Meeker WQ. Two-sided tolerance intervals for members of the (log)-location-scale family of distributions Quality Technology and Quantitative Management. 1-19. DOI: 10.1080/16843703.2016.1226594  0.593
2016 Rubio FJ, Hong Y. Survival and lifetime data analysis with a flexible class of distributions Journal of Applied Statistics. 1-20. DOI: 10.1080/02664763.2015.1120710  0.422
2016 Bedair K, Hong Y, Li J, Al-Khalidi HR. Multivariate frailty models for multi-type recurrent event data and its application to cancer prevention trial Computational Statistics and Data Analysis. 101: 161-173. DOI: 10.1016/J.Csda.2016.01.018  0.36
2016 King C, Hong Y, Meeker WQ. Product Component Genealogy Modeling and Field-failure Prediction Quality and Reliability Engineering International. DOI: 10.1002/Qre.1996  0.611
2016 Xu Z, Hong Y, Jin R. Nonlinear general path models for degradation data with dynamic covariates Applied Stochastic Models in Business and Industry. 32: 153-167. DOI: 10.1002/Asmb.2129  0.376
2015 Hong Y, Duan Y, Meeker WQ, Stanley DL, Gu X. Statistical methods for degradation data with dynamic covariates information and an application to outdoor weathering data Technometrics. 57: 180-193. DOI: 10.1080/00401706.2014.915891  0.62
2015 Hong Y, King C, Zhang Y, Meeker WQ. Bayesian Life Test Planning for Log-Location-Scale Family of Distributions Journal of Quality Technology. 47: 336-350. DOI: 10.1080/00224065.2015.11918138  0.602
2015 Thapa R, Burkhart HE, Li J, Hong Y. Modeling Clustered Survival Times of Loblolly Pine with Time-dependent Covariates and Shared Frailties Journal of Agricultural, Biological, and Environmental Statistics. DOI: 10.1007/S13253-015-0217-2  0.307
2015 Hong Y, Li M, Osborn B. System unavailability analysis based on window-observed recurrent event data Applied Stochastic Models in Business and Industry. 31: 122-136. DOI: 10.1002/Asmb.1984  0.396
2014 Hong Y, Meeker WQ. Confidence interval procedures for system reliability and applications to competing risks models. Lifetime Data Analysis. 20: 161-84. PMID 23381812 DOI: 10.1007/S10985-013-9245-9  0.595
2014 Xu Z, Hong Y, Meeker WQ. Assessing Risk of a Serious Failure Mode Based on Limited Field Data Ieee Transactions On Reliability. DOI: 10.1109/Tr.2014.2354893  0.597
2014 Meeker WQ, Hong Y. Reliability meets big data: Opportunities and challenges Quality Engineering. 26: 102-116. DOI: 10.1080/08982112.2014.846119  0.588
2013 Ye Z, Hong Y, Xie Y. How do heterogeneities in operating environments affect field failure predictions and test planning? The Annals of Applied Statistics. 7: 2249-2271. DOI: 10.1214/13-Aoas666  0.451
2013 Yang Q, Zhang N, Hong Y. Reliability Analysis of Repairable Systems With Dependent Component Failures Under Partially Perfect Repair Ieee Transactions On Reliability. 62: 490-498. DOI: 10.1109/Tr.2013.2259194  0.364
2013 Hong Y, Meeker WQ. Field-failure predictions based on failure-time data with dynamic covariate information Technometrics. 55: 135-149. DOI: 10.1080/00401706.2013.765324  0.62
2013 Hong Y. On computing the distribution function for the Poisson binomial distribution Computational Statistics and Data Analysis. 59: 41-51. DOI: 10.1016/J.Csda.2012.10.006  0.362
2012 Yang Q, Hong Y, Chen Y, Shi J. Failure Profile Analysis of Complex Repairable Systems With Multiple Failure Modes Ieee Transactions On Reliability. 61: 180-191. DOI: 10.1109/Tr.2011.2182225  0.349
2011 Al-Khalidi HR, Hong Y, Fleming TR, Therneau TM. Insights on the robust variance estimator under recurrent-events model. Biometrics. 67: 1564-72. PMID 21418051 DOI: 10.1111/J.1541-0420.2011.01589.X  0.311
2011 Hong Y, Meeker WQ. The importance of identifying different components of a mixture distribution in the prediction of field returns Applied Stochastic Models in Business and Industry. 27: 280-289. DOI: 10.1002/Asmb.830  0.626
2010 Hong Y, Meeker WQ. Field-failure and warranty prediction based on auxiliary use-rate information Technometrics. 52: 148-159. DOI: 10.1198/Tech.2010.09097  0.612
2010 Hong Y, Ma H, Meeker WQ. A tool for evaluating time-varying-stress accelerated life test Plans with log-location-scale distributions Ieee Transactions On Reliability. 59: 620-627. DOI: 10.1109/Tr.2010.2083252  0.712
2010 Hong Y, Escobar LA, Meeker WQ. Coverage probabilities of simultaneous confidence bands and regions for log-location-scale distributions Statistics and Probability Letters. 80: 733-738. DOI: 10.1016/J.Spl.2010.01.003  0.574
2009 Hong Y, Meeker WQ, McCalley JD. Prediction of remaining life of power transformers based on left truncated and right censored lifetime data Annals of Applied Statistics. 3: 857-879. DOI: 10.1214/00-Aoas231  0.593
2009 Meeker WQ, Escobar LA, Hong Y. Using accelerated life tests results to predict product field reliability Technometrics. 51: 146-161. DOI: 10.1198/Tech.2009.0016  0.618
2009 Escobar LA, Hong Y, Meeker WQ. Simultaneous confidence bands and regions for log-location-scale distributions with censored data Journal of Statistical Planning and Inference. 139: 3231-3245. DOI: 10.1016/J.Jspi.2009.03.005  0.608
2008 Hong Y, Meeker WQ, Escobar LA. Avoiding problems with normal approximation confidence intervals for probabilities Technometrics. 50: 64-68. DOI: 10.1198/004017007000000470  0.582
2008 Hong Y, Meeker WQ, Escobar LA. The relationship between confidence intervals for failure probabilities and life time quantiles Ieee Transactions On Reliability. 57: 260-266. DOI: 10.1109/Tr.2008.920352  0.539
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