| Year |
Citation |
Score |
| 2020 |
Own C, Martinez J, DeRego T, Own L, Morales Z, Thomas-Keprta K, Rahman Z, Pettit D. Mochii ISS-NL: Electron Microscopy Has Arrived at the International Space Station Microscopy and Microanalysis. 1-4. DOI: 10.1017/S1431927620018590 |
0.482 |
|
| 2019 |
Own CS, DeRego T, Own LS, Weppelman G, Wanner AA, Ströh S, Hammerschmith E, Vishwanathan A, Seung HS. Multi-order Scaling of High-throughput Transmission Electron Microscopy. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 25: 1040-1041. PMID 34421339 DOI: 10.1017/s1431927619005932 |
0.375 |
|
| 2019 |
Own CS, DeRego T, Own LS, Weppelman G, Wanner AA, Ströh S, Hammerschmith E, Vishwanathan A, Seung HS. Multi-order Scaling of High-throughput Transmission Electron Microscopy Microscopy and Microanalysis. 25: 1040-1041. DOI: 10.1017/S1431927619005932 |
0.472 |
|
| 2019 |
Martinez JE, Own CS, Galeano MP, Weppelman G, Pettit DR. Flight Readiness of Mochii S: Portable Spectroscopic Scanning Electron Microscope Facility on the International Space Station (ISS) Microscopy and Microanalysis. 25: 700-701. DOI: 10.1017/S1431927619004239 |
0.465 |
|
| 2017 |
Own CS, Murfitt MF, Own LS, Cushing J, Martinez J, Thomas-Keprta K, Pettit DR. Portable Electron Microscopy and Microanalysis in Extreme Environments Microscopy and Microanalysis. 23: 1082-1083. DOI: 10.1017/S1431927617006079 |
0.553 |
|
| 2017 |
Own CS, Murfitt MF, Own LS, Cushing J. Developments in Reel-to-Reel Electron Microscopy Infrastructure Microscopy and Microanalysis. 23: 32-33. DOI: 10.1017/S1431927617000848 |
0.549 |
|
| 2015 |
Own CS, Murfitt MF, Own LS, Brittain D, da Costa N, Clay Reid R, Hildebrand DGC, Graham B, Lee WA. Reel-to-Reel Electron Microscopy: Latency-Free Continuous Imaging of Large Sample Volumes Microscopy and Microanalysis. 21: 157-158. DOI: 10.1017/S1431927615001580 |
0.438 |
|
| 2013 |
Own C, Bleloch A, Lerach W, Bowell C, Hamalainen M, Herschleb J, Melville C, Stark J, Andregg M, Andregg W. First Nucleotide Sequence Data from an Electron Microscopy Based DNA Sequencer Microscopy and Microanalysis. 19: 208-209. DOI: 10.1017/S1431927613003036 |
0.393 |
|
| 2011 |
Bleloch A, Own C, Hamalainen M, Hershleb J, Kemmish K, Koene R, Stark H, Stark J, Andregg M, Andregg W. DNA Sequencing by Electron Microscopy Microscopy and Microanalysis. 17: 1274-1275. DOI: 10.1017/S1431927611007240 |
0.443 |
|
| 2010 |
Krivanek OL, Chisholm MF, Nicolosi V, Pennycook TJ, Corbin GJ, Dellby N, Murfitt MF, Own CS, Szilagyi ZS, Oxley MP, Pantelides ST, Pennycook SJ. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy. Nature. 464: 571-4. PMID 20336141 DOI: 10.1038/Nature08879 |
0.389 |
|
| 2009 |
Krivanek OL, Ursin JP, Bacon NJ, Corbin GJ, Dellby N, Hrncirik P, Murfitt MF, Own CS, Szilagyi ZS. High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy. Philosophical Transactions. Series a, Mathematical, Physical, and Engineering Sciences. 367: 3683-97. PMID 19687060 DOI: 10.1098/Rsta.2009.0087 |
0.43 |
|
| 2008 |
Krivanek OL, Corbin GJ, Dellby N, Elston BF, Keyse RJ, Murfitt MF, Own CS, Szilagyi ZS, Woodruff JW. An electron microscope for the aberration-corrected era. Ultramicroscopy. 108: 179-95. PMID 18054168 DOI: 10.1016/J.Ultramic.2007.07.010 |
0.487 |
|
| 2008 |
Ciston J, Deng B, Marks LD, Own CS, Sinkler W. A quantitative analysis of the cone-angle dependence in precession electron diffraction. Ultramicroscopy. 108: 514-22. PMID 17854997 DOI: 10.1016/J.Ultramic.2007.08.004 |
0.75 |
|
| 2008 |
Sinkler W, Own C, Ciston J, Marks L. Models for simplified treatment of precession electron diffraction Acta Crystallographica Section a Foundations of Crystallography. 64: C76-C77. DOI: 10.1107/S0108767308097559 |
0.754 |
|
| 2008 |
Ciston J, Own CS, Marks LD. Cone-angle dependence of Ab-initio structure solutions using precession electron diffraction Aip Conference Proceedings. 999: 53-65. DOI: 10.1063/1.2918117 |
0.542 |
|
| 2008 |
Krivanek OL, Dellby N, Keyse RJ, Murfitt MF, Own CS, Szilagyi ZS. Chapter 3 Advances in Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy Advances in Imaging and Electron Physics. 153: 121-160. DOI: 10.1016/S1076-5670(08)01003-3 |
0.475 |
|
| 2007 |
Sinkler W, Own CS, Marks LD. Application of a 2-beam model for improving the structure factors from precession electron diffraction intensities. Ultramicroscopy. 107: 543-50. PMID 17240530 DOI: 10.1016/J.Ultramic.2006.02.008 |
0.564 |
|
| 2007 |
Own CS, Sinkler W, Marks LD. Prospects for aberration corrected electron precession. Ultramicroscopy. 107: 534-42. PMID 17207934 DOI: 10.1016/J.Ultramic.2006.03.011 |
0.623 |
|
| 2007 |
Krivanek O, Corbin G, Dellby N, Elston B, Keyse R, Murfitt M, Own C, Szilagyi Z. UltraSTEM Progress: Flexible Electron Optics, High-Performance Sample Stage Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607078774 |
0.396 |
|
| 2007 |
Own C, Dellby N, Krivanek O, Marks L, Murfitt M. Aberration-corrected Precession Electron Diffraction Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607078555 |
0.684 |
|
| 2007 |
Ciston J, Deng B, Marks L, Sinkler W, Own C. Precession Electron Diffraction: Optimized Experimental Conditions to Detect Valence Charge Density Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607073667 |
0.736 |
|
| 2007 |
Sinkler W, Own C, Ciston J, Marks L. Statistical Treatment of Precession Electron Diffraction Data with Principal Components Analysis Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607072844 |
0.751 |
|
| 2006 |
Own CS, Marks LD, Sinkler W. Precession electron diffraction 1: multislice simulation. Acta Crystallographica. Section a, Foundations of Crystallography. 62: 434-43. PMID 17057352 DOI: 10.1107/S0108767306032892 |
0.586 |
|
| 2006 |
Own CS, Sinkler W, Marks LD. Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction data. Ultramicroscopy. 106: 114-22. PMID 16125847 DOI: 10.1016/J.Ultramic.2005.06.058 |
0.592 |
|
| 2005 |
Haes AJ, Zhao J, Zou S, Own CS, Marks LD, Schatz GC, Van Duyne RP. Solution-phase, triangular ag nanotriangles fabricated by nanosphere lithography. The Journal of Physical Chemistry. B. 109: 11158-62. PMID 16852361 DOI: 10.1021/Jp051178G |
0.411 |
|
| 2005 |
Kilaas R, Marks LD, Own CS. EDM 1.0: electron direct methods. Ultramicroscopy. 102: 233-7. PMID 15639355 DOI: 10.1016/J.Ultramic.2004.10.004 |
0.545 |
|
| 2005 |
Own CS, Marks LD, Sinkler W. Electron precession: A guide for implementation Review of Scientific Instruments. 76. DOI: 10.1063/1.1866612 |
0.579 |
|
| 2005 |
Own CS, Marks LD. Electron Precession for Routine Crystallography Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605508006 |
0.676 |
|
| 2004 |
Own CS, Subramanian AK, Marks LD. Quantitative analyses of precession diffraction data for a large cell oxide. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 10: 96-104. PMID 15306071 DOI: 10.1017/S1431927604040322 |
0.71 |
|
| 2004 |
Sinkler W, Own CS, Marks LD. Advances in electron crystallography using precession electron diffraction for ab initio structure analysis of catalytic materials Microscopy and Microanalysis. 10: 40-41. DOI: 10.1017/S1431927604887476 |
0.66 |
|
| 2004 |
Marks LD, Own CS, Sinkler W. Prospects for Aberration Corrected Nanocrystallogrphy Microscopy and Microanalysis. 10: 30-30. DOI: 10.1017/S1431927604555897 |
0.452 |
|
| 2003 |
Own CS, Sinkler W, Marks LD. The Nature of Precession Electron Diffraction Data Microscopy and Microanalysis. 9: 858-859. DOI: 10.1017/s1431927603444292 |
0.518 |
|
| 2003 |
Own CS, Sinkler W, Marks LD. The nature of precession electron diffraction data Microscopy and Microanalysis. 9: 858-859. DOI: 10.1017/S1431927603444292 |
0.683 |
|
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