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Joel C. Weber, Ph.D. - Publications

Affiliations: 
2014 Mechanical Engineering University of Colorado, Boulder, Boulder, CO, United States 
Area:
Mechanical Engineering, Materials Science Engineering, Nanotechnology
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10 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2023 Spann BT, Weber JC, Brubaker MD, Harvey TE, Yang L, Honarvar H, Tsai CN, Treglia AC, Lee M, Hussein MI, Bertness KA. Semiconductor Thermal and Electrical Properties Decoupled by Localized Phonon Resonances. Advanced Materials (Deerfield Beach, Fla.). e2209779. PMID 36951229 DOI: 10.1002/adma.202209779  0.493
2018 Brubaker MD, Genter KL, Weber JC, Spann BT, Roshko A, Blanchard PT, Harvey TE, Bertness KA. Core-shell GaN nanowire LEDs by N-polar selective area growth. Proceedings of Spie--the International Society For Optical Engineering. 10725. PMID 33343056 DOI: 10.1117/12.2322832  0.54
2018 Blanchard P, Brubaker M, Harvey T, Roshko A, Sanford N, Weber J, Bertness K. Characterization of Sub-Monolayer Contaminants at the Regrowth Interface in GaN Nanowires Grown by Selective-Area Molecular Beam Epitaxy Crystals. 8: 178. DOI: 10.3390/CRYST8040178  0.514
2017 Weber J, Brubaker M, Wallis T, Bertness K. Lithographic sonication patterning of large area GaN nanopillar forests grown on a Si substrate Microelectronic Engineering. 181: 43-46. DOI: 10.1016/J.Mee.2017.07.004  0.557
2015 Berweger S, Weber JC, John J, Velazquez JM, Pieterick A, Sanford NA, Davydov AV, Brunschwig B, Lewis NS, Wallis TM, Kabos P. Microwave near-field imaging of two-dimensional semiconductors. Nano Letters. 15: 1122-7. PMID 25625509 DOI: 10.1021/Nl504960U  0.359
2014 Weber JC, Blanchard PT, Sanders AW, Gertsch JC, George SM, Berweger S, Imtiaz A, Coakley KJ, Wallis TM, Bertness KA, Kabos P, Sanford NA, Bright VM. GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy. Nanotechnology. 25: 415502. PMID 25258349 DOI: 10.1088/0957-4484/25/41/415502  0.525
2014 Imtiaz A, Wallis TM, Weber JC, Coakley KJ, Brubaker MD, Blanchard PT, Bertness KA, Sanford NA, Kabos P. Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope Applied Physics Letters. 104. DOI: 10.1063/1.4886963  0.334
2014 Weber JC, Blanchard PT, Sanders AW, Imtiaz A, Wallis TM, Coakley KJ, Bertness KA, Kabos P, Sanford NA, Bright VM. Gallium nitride nanowire probe for near-field scanning microwave microscopy Applied Physics Letters. 104. DOI: 10.1063/1.4861862  0.55
2012 Weber JC, Schlager JB, Sanford NA, Imtiaz A, Wallis TM, Mansfield LM, Coakley KJ, Bertness KA, Kabos P, Bright VM. A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics. The Review of Scientific Instruments. 83: 083702. PMID 22938298 DOI: 10.1063/1.4740513  0.537
2011 Weber JC, Bertness KA, Schlager JB, Sanford NA, Imtiaz A, Wallis TM, Kabos P, Coakley KJ, Bright VM, Mansfield LM. Microwave near-field probes for photovoltaic applications Conference Record of the Ieee Photovoltaic Specialists Conference. 001978-001982. DOI: 10.1109/PVSC.2011.6186341  0.491
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