| Year |
Citation |
Score |
| 2019 |
Moshe R, Kaplan WD. The influence of CaO on alumina grain boundary mobility Journal of the European Ceramic Society. 39: 1324-1328. DOI: 10.1016/J.Jeurceramsoc.2018.10.014 |
0.306 |
|
| 2019 |
Nahor H, Kauffmann Y, Kaplan WD. The Cr-Doped Ni-YSZ(111) interface: Segregation, oxidation and the Ni equilibrium crystal shape Acta Materialia. 166: 28-36. DOI: 10.1016/J.Actamat.2018.12.023 |
0.311 |
|
| 2019 |
Mao T, Nahor H, Kaplan WD. Ca segregation at Au–YSZ interfaces Journal of Materials Science. 54: 7719-7727. DOI: 10.1007/S10853-019-03436-5 |
0.359 |
|
| 2019 |
Sternlicht H, Rheinheimer W, Dunin-Borkowski RE, Hoffmann MJ, Kaplan WD. Characterization of grain boundary disconnections in SrTiO3 part I: the dislocation component of grain boundary disconnections Journal of Materials Science. 54: 3694-3709. DOI: 10.1007/S10853-018-3096-4 |
0.312 |
|
| 2019 |
Sternlicht H, Rheinheimer W, Kim J, Liberti E, Kirkland AI, Hoffmann MJ, Kaplan WD. Characterization of grain boundary disconnections in SrTiO 3 Part II: the influence of superimposed disconnections on image analysis Journal of Materials Science. 54: 3710-3725. DOI: 10.1007/S10853-018-3095-5 |
0.323 |
|
| 2018 |
Nahor H, Kauffmann Y, Lazar S, Shilo D, Kaplan WD. Discerning interface atomistic structure by phase contrast in STEM: The equilibrated Ni-YSZ interface Acta Materialia. 154: 71-78. DOI: 10.1016/J.Actamat.2018.05.011 |
0.365 |
|
| 2017 |
Sternlicht H, Bojarski SA, Rohrer GS, Kaplan WD. Quantitative differences in the Y grain boundary excess at boundaries delimiting large and small grains in Y doped Al2O3 Journal of the European Ceramic Society. 38: 1829-1835. DOI: 10.1016/J.Jeurceramsoc.2017.11.006 |
0.319 |
|
| 2016 |
Nahor H, Kaplan WD. Structure of the Equilibrated Ni(111)-YSZ(111) Solid-Solid Interface Journal of the American Ceramic Society. 99: 1064-1070. DOI: 10.1111/Jace.14015 |
0.382 |
|
| 2016 |
Avraham S, Kaplan WD. Reactive wetting of rutile by liquid aluminium Journal of Materials Science. 40: 1093-1100. DOI: 10.1007/S10853-005-6922-4 |
0.319 |
|
| 2015 |
Kaplan WD. MATERIALS SCIENCE. The mechanism of crystal deformation. Science (New York, N.Y.). 349: 1059-60. PMID 26339018 DOI: 10.1126/Science.Aac9623 |
0.301 |
|
| 2015 |
Gandman M, Kauffmann Y, Kaplan WD. Quantification of ordering at a solid-liquid interface using plasmon electron energy loss spectroscopy Applied Physics Letters. 106. DOI: 10.1063/1.4907617 |
0.336 |
|
| 2015 |
Gross E, Dahan DB, Kaplan WD. The role of carbon and SiO<inf>2</inf> in solid-state sintering of SiC Journal of the European Ceramic Society. 35: 2001-2005. DOI: 10.1016/J.Jeurceramsoc.2014.12.035 |
0.351 |
|
| 2015 |
Chatain D, Curiotto S, Wynblatt P, Meltzman H, Kaplan WD, Rohrer GS. Orientation relationships of copper crystals on sapphire (1 0 1 ! 0) m-plane and (1 0 1 ! 2) r-plane substrates Journal of Crystal Growth. 418: 57-63. DOI: 10.1016/J.Jcrysgro.2015.02.023 |
0.3 |
|
| 2015 |
Sternlicht H, Rheinheimer W, Hoffmann MJ, Kaplan WD. The mechanism of grain boundary motion in SrTiO3 Journal of Materials Science. DOI: 10.1007/S10853-015-9058-1 |
0.312 |
|
| 2015 |
Dennenwaldt T, Lübbe M, Winklhofer M, Müller A, Döblinger M, Nabi HS, Gandman M, Cohen-Hyams T, Kaplan WD, Moritz W, Pentcheva R, Scheu CU. Insights into the structural, electronic, and magnetic properties of Fe2−xTixO3/Fe2O3 thin films with x = 0.44 grown on Al2O3 (0001) Journal of Materials Science. 50: 122-137. DOI: 10.1007/S10853-014-8572-X |
0.328 |
|
| 2014 |
Mikhelashvili V, Cristea D, Meyler B, Yofis S, Shneider Y, Atiya G, Cohen-Hyams T, Kauffmann Y, Kaplan WD, Eisenstein G. A highly sensitive broadband planar metal-oxide-semiconductor photo detector fabricated on a silicon-on-insulator substrate Journal of Applied Physics. 116: 74513. DOI: 10.1063/1.4893582 |
0.302 |
|
| 2014 |
Moshe R, Berner A, Kaplan WD. The solubility limit of SiO2 in α-alumina at 1600 °c Scripta Materialia. 86: 40-43. DOI: 10.1016/J.Scriptamat.2014.05.005 |
0.311 |
|
| 2014 |
Atiya G, Chatain D, Mikhelashvili V, Eisenstein G, Kaplan WD. The role of abnormal grain growth on solid-state dewetting kinetics Acta Materialia. 81: 304-314. DOI: 10.1016/J.Actamat.2014.08.038 |
0.355 |
|
| 2014 |
Ni N, Kaufmann Y, Kaplan WD, Saiz E. Interfacial energies and mass transport in the Ni(Al)-Al2O 3 system: The implication of very low oxygen activities Acta Materialia. 64: 282-296. DOI: 10.1016/J.Actamat.2013.10.041 |
0.361 |
|
| 2014 |
Atiya G, Mikhelashvili V, Eisenstein G, Kaplan WD. Solid-state dewetting of Pt on (100) SrTiO3 Journal of Materials Science. 49: 3863-3874. DOI: 10.1007/S10853-013-7966-5 |
0.313 |
|
| 2014 |
Nahor H, Meltzman H, Kaplan WD. Ni-YSZ(111) solid-solid interfacial energy Journal of Materials Science. 49: 3943-3950. DOI: 10.1007/S10853-013-7960-Y |
0.364 |
|
| 2014 |
Altberg A, Atiya G, Mikhelashvili V, Eisenstein G, Kaplan WD. The equilibrium orientation relationship between Pt and SrTiO3 and its implication on Pt films deposited by physical vapor phase deposition Journal of Materials Science. 49: 3917-3927. DOI: 10.1007/S10853-013-7941-1 |
0.305 |
|
| 2013 |
Gandman M, Kauffmann Y, Koch CT, Kaplan WD. Direct quantification of ordering at a solid-liquid interface using aberration corrected transmission electron microscopy. Physical Review Letters. 110: 086106. PMID 23473172 DOI: 10.1103/Physrevlett.110.086106 |
0.315 |
|
| 2013 |
Gluzer G, Kaplan WD. Particle occlusion and mechanical properties of Ni-Al2O3 nanocomposites Journal of the European Ceramic Society. 33: 3101-3113. DOI: 10.1016/J.Jeurceramsoc.2013.05.019 |
0.343 |
|
| 2013 |
Curiotto S, Chien H, Meltzman H, Labat S, Wynblatt P, Rohrer GS, Kaplan WD, Chatain D. Copper crystals on the (11\bf{\bar{2}}0) sapphire plane: orientation relationships, triple line ridges and interface shape equilibrium Journal of Materials Science. 48: 3013-3026. DOI: 10.1007/S10853-012-7080-0 |
0.303 |
|
| 2013 |
Nijikovsky B, Richardson JJ, Garbrecht M, Denbaars SP, Kaplan WD. Microstructure of ZnO films synthesized on MgAl2O4 from low-temperature aqueous solution: Growth and post-annealing Journal of Materials Science. 48: 1614-1622. DOI: 10.1007/S10853-012-6918-9 |
0.367 |
|
| 2012 |
Meltzman H, Besmann TM, Kaplan WD. Hf-doped Ni - Al 2 O 3 interfaces at equilibrium Journal of the American Ceramic Society. 95: 3997-4003. DOI: 10.1111/J.1551-2916.2012.05434.X |
0.346 |
|
| 2012 |
Kadosh T, Cohen Y, Talmon Y, Kaplan WD. In situ characterization of spinel nanoceramic suspensions Journal of the American Ceramic Society. 95: 3103-3108. DOI: 10.1111/J.1551-2916.2012.05360.X |
0.305 |
|
| 2012 |
Meltzman H, Mordehai D, Kaplan WD. Solid-solid interface reconstruction at equilibrated Ni-Al 2O 3 interfaces Acta Materialia. 60: 4359-4369. DOI: 10.1016/J.Actamat.2012.04.037 |
0.357 |
|
| 2012 |
Nussbaum E, Meltzman H, Kaplan WD. Equilibrium segregation of Ti to Au-sapphire interfaces Journal of Materials Science. 47: 1647-1654. DOI: 10.1007/S10853-011-5707-1 |
0.375 |
|
| 2011 |
Baram M, Chatain D, Kaplan WD. Nanometer-thick equilibrium films: the interface between thermodynamics and atomistics. Science (New York, N.Y.). 332: 206-9. PMID 21474752 DOI: 10.1126/Science.1201596 |
0.31 |
|
| 2011 |
Tripathi JK, Garbrecht M, Sztrum-Vartash CG, Rabani E, Kaplan WD, Goldfarb I. Coverage-dependent self-organized ordering of Co- and Ti-silicide nanoislands along step-bunch edges of vicinal Si(111) Physical Review B. 83: 165409. DOI: 10.1103/Physrevb.83.165409 |
0.323 |
|
| 2011 |
Baram M, Garofalini SH, Kaplan WD. Order in nanometer thick intergranular films at Au-sapphire interfaces Acta Materialia. 59: 5710-5715. DOI: 10.1017/S1431927611007537 |
0.304 |
|
| 2011 |
Curiotto S, Chien H, Meltzman H, Wynblatt P, Rohrer GS, Kaplan WD, Chatain D. Orientation relationships of copper crystals on c-plane sapphire Acta Materialia. 59: 5320-5331. DOI: 10.1016/J.Actamat.2011.05.008 |
0.313 |
|
| 2011 |
Kauffmann Y, Oh SH, Koch CT, Hashibon A, Scheu C, Rühle M, Kaplan WD. Quantitative analysis of layering and in-plane structural ordering at an alumina-aluminum solid-liquid interface Acta Materialia. 59: 4378-4386. DOI: 10.1016/J.Actamat.2011.03.061 |
0.32 |
|
| 2011 |
Meltzman H, Chatain D, Avizemer D, Besmann TM, Kaplan WD. The equilibrium crystal shape of nickel Acta Materialia. 59: 3473-3483. DOI: 10.1016/J.Actamat.2011.02.021 |
0.3 |
|
| 2010 |
Thangadurai P, Mikhelashvili V, Eisenstein G, Kaplan WD. Microstructure and chemical analysis of Hf-based high-k dielectric layers in metal-insulator-metal capacitors Thin Solid Films. 518: 4467-4472. DOI: 10.1016/J.Tsf.2010.03.002 |
0.312 |
|
| 2009 |
Meltzman H, Kauffmann Y, Thangadurai P, Drozdov M, Baram M, Brandon D, Kaplan WD. An experimental method for calibration of the plasmon mean free path Journal of Microscopy. 236: 165-173. DOI: 10.1111/J.1365-2818.2009.03214.X |
0.556 |
|
| 2009 |
Shaffir E, Riess I, Kaplan WD. The mechanism of initial de-wetting and detachment of thin Au films on YSZ Acta Materialia. 57: 248-256. DOI: 10.1016/J.Actamat.2008.09.004 |
0.366 |
|
| 2008 |
Miller L, Kaplan WD. Solubility limits of la and y in aluminum oxynitride at 1870°C Journal of the American Ceramic Society. 91: 1693-1696. DOI: 10.1111/J.1551-2916.2008.02323.X |
0.301 |
|
| 2008 |
Mikhelashvili V, Eisenstein G, Thangadurai P, Kaplan WD, Brener R, Saguy C. The use of nanolaminates to obtain structurally stable high-K films with superior electrical properties: HfNO–HfTiO Journal of Applied Physics. 103: 114106. DOI: 10.1063/1.2936895 |
0.328 |
|
| 2008 |
Mikhelashvili V, Thangadurai P, Kaplan WD, Eisenstein G. High capacitance density metal-insulator-metal structures based on a high- κ Hf Nx Oy -Si O2 -HfTi Oy laminate stack Applied Physics Letters. 92. DOI: 10.1063/1.2905273 |
0.304 |
|
| 2008 |
Thangadurai P, Lumelsky Y, Silverstein MS, Kaplan WD. TEM specimen preparation of semiconductor-PMMA-metal interfaces Materials Characterization. 59: 1623-1629. DOI: 10.1016/J.Matchar.2008.02.007 |
0.349 |
|
| 2008 |
Drozdov M, Gur G, Atzmon Z, Kaplan WD. Detailed investigation of ultrasonic Al-Cu wire-bonds: II. Microstructural evolution during annealing Journal of Materials Science. 43: 6038-6048. DOI: 10.1007/S10853-008-2955-9 |
0.311 |
|
| 2008 |
Drozdov M, Gur G, Atzmon Z, Kaplan WD. Detailed investigation of ultrasonic Al-Cu wire-bonds: I. Intermetallic formation in the as-bonded state Journal of Materials Science. 43: 6029-6037. DOI: 10.1007/S10853-008-2954-X |
0.317 |
|
| 2008 |
Brandon D, Kaplan WD. Microstructural Characterization of Materials: 2nd Edition Microstructural Characterization of Materials: 2nd Edition. 1-536. DOI: 10.1002/9780470727133 |
0.474 |
|
| 2007 |
Sadan H, Kaplan W. Correlating Interfacial Energy with Orientation and Atomistic Structure at Metal Ceramic Interfaces Microscopy and Microanalysis. 13: 900-901. DOI: 10.1017/S1431927607077823 |
0.301 |
|
| 2007 |
Karpel A, Gur G, Atzmon Z, Kaplan WD. Microstructural evolution of gold-aluminum wire-bonds Journal of Materials Science. 42: 2347-2357. DOI: 10.1007/S10853-007-1593-Y |
0.323 |
|
| 2007 |
Karpel A, Gur G, Atzmon Z, Kaplan WD. TEM microstructural analysis of As-Bonded Al-Au wire-bonds Journal of Materials Science. 42: 2334-2346. DOI: 10.1007/S10853-007-1592-Z |
0.325 |
|
| 2006 |
Avraham S, Beyer P, Janssen R, Claussen N, Kaplan WD. Characterization of α-Al2O3-(Al-Si)3Ti composites Journal of the European Ceramic Society. 26: 2719-2726. DOI: 10.1016/J.Jeurceramsoc.2005.06.024 |
0.316 |
|
| 2006 |
Levi G, Kaplan WD. The influence of interfacial wetting and adhesion on the formation of voids at metal-ceramic interfaces Journal of Materials Science. 41: 817-821. DOI: 10.1007/S10853-006-6565-0 |
0.356 |
|
| 2006 |
Baram M, Kaplan WD. Intergranular films at Au-sapphire interfaces Journal of Materials Science. 41: 7775-7784. DOI: 10.1007/S10853-006-0897-7 |
0.328 |
|
| 2006 |
Sadan H, Kaplan WD. Au-Sapphire (0001) solid-solid interfacial energy Journal of Materials Science. 41: 5099-5107. DOI: 10.1007/S10853-006-0437-5 |
0.339 |
|
| 2006 |
Sadan H, Kaplan WD. Morphology and orientation of the equilibrated Au-sapphire (101̄0) interface Journal of Materials Science. 41: 5371-5375. DOI: 10.1007/S10853-006-0407-Y |
0.334 |
|
| 2005 |
Oh SH, Kauffmann Y, Scheu C, Kaplan WD, Rühle M. Ordered liquid aluminum at the interface with sapphire Science. 310: 661-663. DOI: 10.1126/Science.1118611 |
0.311 |
|
| 2005 |
Avishai A, Scheu C, Kaplan WD. Intergranular films at metal-ceramic interfaces: Part I - Interface structure and chemistry Acta Materialia. 53: 1559-1569. DOI: 10.1016/J.Actamat.2004.12.009 |
0.357 |
|
| 2005 |
Avishai A, Kaplan WD. Intergranular films at metal-ceramic interfaces: Part II - Calculation of Hamaker coefficients Acta Materialia. 53: 1571-1581. DOI: 10.1016/J.Actamat.2004.12.008 |
0.322 |
|
| 2004 |
Avishai A, Kaplan WD. Intergranular films in metal-ceramic composites and the promotion of metal particle occlusion Zeitschrift Fuer Metallkunde/Materials Research and Advanced Techniques. 95: 266-270. DOI: 10.3139/146.017948 |
0.351 |
|
| 2004 |
Edrei R, Shima R, Gridin VV, Roizin Y, Kaplan WD, Hoffman A. Evolution of surface topography of as-grown Si films near amorphous-to-polycrystalline transition Journal of the Electrochemical Society. 151. DOI: 10.1149/1.1819791 |
0.321 |
|
| 2004 |
Fisher I, Kaplan WD, Eizenberg M. Dielectric property-microstructure relationship for nanoporous silica based thin films Journal of Applied Physics. 95: 5762-5767. DOI: 10.1063/1.1699491 |
0.307 |
|
| 2004 |
Cohen-Hyams T, Plitzko JM, Hetherington CJD, Hutchison JL, Yahalom J, Kaplan WD. Microstructural dependence of giant-magnetoresistance in electrodeposited Cu-Co alloys Journal of Materials Science. 39: 5701-5709. DOI: 10.1023/B:Jmsc.0000040079.41985.6B |
0.325 |
|
| 2004 |
Levi G, Clarke DR, Kaplan WD. Free Surface and Interface Thermodynamics of Liquid Nickel in Contact with Alumina Interface Science. 12: 73-83. DOI: 10.1023/B:Ints.0000012295.38485.90 |
0.323 |
|
| 2004 |
Kaplan WD, Avishai A. Equilibrium amorphous films at metal-ceramic interfaces Microscopy and Microanalysis. 10: 274-275. DOI: 10.1017/S1431927604880206 |
0.312 |
|
| 2003 |
Avishai A, Scheu C, Kaplan WD. Amorphous films at metal/ceramic interfaces Zeitschrift Fuer Metallkunde/Materials Research and Advanced Techniques. 94: 272-276. DOI: 10.3139/146.030272 |
0.378 |
|
| 2003 |
Cohen-Hyams T, Kaplan WD, Aurbach D, Cohen YS, Yahalom J. Electrodeposition of granular Cu-Co alloys Journal of the Electrochemical Society. 150. DOI: 10.1149/1.1527938 |
0.341 |
|
| 2003 |
Levi G, Kaplan WD. Aluminium-alumina interface morphology and thermodynamics from dewetting experiments Acta Materialia. 51: 2793-2802. DOI: 10.1016/S1359-6454(03)00084-3 |
0.365 |
|
| 2002 |
Fisher I, Kaplan WD, Eizenberg M, Nault M, Weidman T. Study of porous silica based films as low-k dielectric material and their interface with copper metallization Materials Research Society Symposium - Proceedings. 716: 355-361. DOI: 10.1557/Proc-716-B7.20 |
0.336 |
|
| 2002 |
Levi G, Kaplan WD. Iron as an oxygen tracer at the aluminum-alumina interface Journal of the American Ceramic Society. 85: 1601-1606. DOI: 10.1111/J.1151-2916.2002.Tb00318.X |
0.31 |
|
| 2002 |
Levi G, Kaplan WD. Oxygen induced interfacial phenomena during wetting of alumina by liquid aluminium Acta Materialia. 50: 75-88. DOI: 10.1016/S1359-6454(01)00333-0 |
0.313 |
|
| 2002 |
Goldstein A, Kaplan WD, Singurindi A. Liquid assisted sintering of SiC powders by MW (2.45 GHz) heating Journal of the European Ceramic Society. 22: 1891-1896. DOI: 10.1016/S0955-2219(01)00498-8 |
0.302 |
|
| 2002 |
Hashibon A, Adler J, Finnis MW, Kaplan WD. Atomistic study of structural correlations at a liquid-solid interface Computational Materials Science. 24: 443-452. DOI: 10.1016/S0927-0256(01)00265-8 |
0.314 |
|
| 2002 |
Levi G, Kaplan WD, Bamberger M. Interfacial phenomena and microstructure evolution during solidification of binary and ternary Al-Mg-Si alloys cast with titanium carbonitride Materials Science and Engineering A. 326: 288-296. DOI: 10.1016/S0921-5093(01)01485-X |
0.304 |
|
| 2001 |
Levi G, Kaplan WD. Non-equilibrium wetting at aluminium-sapphire interfaces Materials Research Society Symposium - Proceedings. 654. DOI: 10.1557/Proc-654-Aa4.6.1 |
0.314 |
|
| 2001 |
Scheu C, Dehm G, Kaplan WD. Equilibrium Amorphous Silicon-Calcium-Oxygen Films at Interfaces in Copper-Alumina Composites Prepared by Melt Infiltration Journal of the American Ceramic Society. 84: 623-630. DOI: 10.1111/J.1151-2916.2001.Tb00710.X |
0.381 |
|
| 2001 |
Levi G, Scheu C, Kaplan WD. Segregation of aluminium at nickel-sapphire interfaces Interface Science. 9: 213-220. DOI: 10.1023/A:1015198409536 |
0.337 |
|
| 2001 |
Hashibon A, Adler J, Finnis MW, Kaplan WD. Ordering at solid-liquid interfaces between dissimilar materials Interface Science. 9: 175-181. DOI: 10.1023/A:1015190207719 |
0.304 |
|
| 2001 |
Kaplan WD, Shneck R, Brandon D, Rabkin E. Interface Science: Foreword Interface Science. 9: 141. DOI: 10.1023/A:1015139621599 |
0.482 |
|
| 2001 |
Lieberthal M, Kaplan WD. Processing and properties of A12O3 nanocomposites reinforced with sub-micron Ni and NiA12O4 Materials Science and Engineering A. 302: 83-91. DOI: 10.1016/S0921-5093(00)01358-7 |
0.319 |
|
| 2000 |
Scheu C, Dehm G, Kaplan WD, García DE, Claussen N. Microstructure of alumina composites containing niobium and niobium aluminides Journal of the American Ceramic Society. 83: 397-402. DOI: 10.1111/J.1151-2916.2000.Tb01203.X |
0.37 |
|
| 1999 |
Avinun M, Kaplan WD, Eizenberg M, Guo T, Mosely R. Factors which determine the orientation of CVD Al films grown on TiN Solid-State Electronics. 43: 1011-1014. DOI: 10.1016/S0038-1101(99)00016-7 |
0.325 |
|
| 1998 |
Bamberger M, Nemaizer U, Levi G, Kaplan WD. Microstructure refinement of cast intermetallic alloys-a new application for nano-crystalline powders Materials Science Forum. 269: 1061-1066. DOI: 10.4028/Www.Scientific.Net/Msf.269-272.1061 |
0.351 |
|
| 1998 |
Kaplan WD. The influence of Ca on interface structure and chemistry in melt-infiltrated α-Al2o3/Al composites Acta Materialia. 46: 2369-2379. DOI: 10.1016/S1359-6454(98)80018-9 |
0.337 |
|
| 1998 |
Avinun M, Barel N, Kaplan WD, Eizenberg M, Naik M, Guo T, Chen LY, Mosely R, Littau K, Zhou S, Chen L. Nucleation and growth of CVD Al on different types of TiN Thin Solid Films. 320: 67-72. DOI: 10.1016/S0040-6090(97)01067-5 |
0.334 |
|
| 1998 |
Scheu C, Dehm G, Kaplan WD, Wagner F, Claussen N. Microstructure and phase evolution of niobium-aluminide-alumina composites prepared by melt-infiltration Physica Status Solidi (a) Applied Research. 166: 241-255. DOI: 10.1002/(Sici)1521-396X(199803)166:1<241::Aid-Pssa241>3.0.Co;2-A |
0.384 |
|
| 1997 |
Parnis D, Zolotoyabko E, Kaplan WD, Eizenberg M, Mosleh N, Meyer F, Schwebel C. Structural disorder in SiGe films grown epitaxially on Si by ion beam sputter deposition Thin Solid Films. 294: 64-68. DOI: 10.1016/S0040-6090(96)09218-8 |
0.308 |
|
| 1996 |
Levin I, Kaplan WD, Brandon DG, Müllejans H, Rühle M. Phase boundaries among the metastable precursor phases to α-Al2O3 Materials Science Forum. 207: 749-752. DOI: 10.4028/Www.Scientific.Net/Msf.207-209.749 |
0.625 |
|
| 1996 |
Kaplan WD, Levin I, Brandon DG. Significance of faceting on SiC nanoparticles in alumina Materials Science Forum. 207: 733-736. DOI: 10.4028/Www.Scientific.Net/Msf.207-209.733 |
0.607 |
|
| 1995 |
Levin I, Kaplan WD, Brandon DG, Layyous AA. Effect of SiC Submicrometer Particle Size and Content on Fracture Toughness of Alumina–SiC “Nanocomposites” Journal of the American Ceramic Society. 78: 254-256. DOI: 10.1111/J.1151-2916.1995.Tb08397.X |
0.626 |
|
| 1995 |
Kaplan WD, Kenway PR, Brandon DG. Polymorphic basal twin boundaries and anisotropic growth in α-Al2O3 Acta Metallurgica Et Materialia. 43: 835-848. DOI: 10.1016/0956-7151(94)00276-N |
0.563 |
|
| 1995 |
Levin I, Kaplan WD, Brandon DG, Layyous AA. Effect of SiC submicrometer particle size and content on fracture toughness of alumina-SiC 'nanocomposites' Journal of the American Ceramic Society. 78: 254-256. |
0.488 |
|
| 1994 |
Levin I, Kaplan WD, Brandon DG, Wieder T. Residual stresses in alumina-SiC nanocomposites Acta Metallurgica Et Materialia. 42: 1147-1154. DOI: 10.1016/0956-7151(94)90131-7 |
0.635 |
|
| 1993 |
Kaplan WD, Brandon DG. Self Supporting Ceramic Films for Grain Boundary Characterization Materials Science Forum. 173-176. DOI: 10.4028/Www.Scientific.Net/Msf.126-128.173 |
0.55 |
|
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