| Year |
Citation |
Score |
| 2009 |
Sporken R, Kiran R, Casselman T, Aqariden F, Velicu S, Chang Y, Sivananthan S. The effect of wet etching on surface properties of HgCdTe Journal of Electronic Materials. 38: 1781-1789. DOI: 10.1007/S11664-009-0844-X |
0.513 |
|
| 2008 |
Kiran R, Sporken R, Casselman TN, Emelie PY, Kodama R, Chang Y, Aqariden F, Velicu S, Zhao J, Sivananthan S. Effect of atmosphere on n-Type Hg 1-x Cd x Te surface after different wet etching treatments: An electrical and structural study Journal of Electronic Materials. 37: 1471-1479. DOI: 10.1007/S11664-008-0494-4 |
0.329 |
|
| 2008 |
Chang Y, Becker CR, Grein CH, Zhao J, Fulk C, Casselman T, Kiran R, Wang XJ, Robinson E, An SY, Mallick S, Sivananthan S, Aoki T, Wang CZ, Smith DJ, et al. Surface morphology and defect formation mechanisms for HgCdTe (211)B grown by molecular beam epitaxy Journal of Electronic Materials. 37: 1171-1183. DOI: 10.1007/S11664-008-0477-5 |
0.569 |
|
| 2007 |
Mallick S, Kiran R, Ghosh S, Velicu S, Sivananthan S. Comparative study of HgCdTe etchants: An electrical characterization Journal of Electronic Materials. 36: 993-999. DOI: 10.1007/S11664-007-0159-8 |
0.502 |
|
| 2006 |
Kiran R, Mallick S, Hahn SR, Lee TS, Sivananthan S, Ghosh S, Wijewarnasuriya PS. Passivation effect on optical and electrical properties of molecular beam epitaxy-grown HgCdTe/CdTe/Si layers Journal of Electronic Materials. 35: 1379-1384. DOI: 10.1007/S11664-006-0271-1 |
0.518 |
|
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