Thomas J. Knisley, Ph.D. - Publications
Affiliations: | 2012 | Chemistry | Wayne State University, Detroit, MI, United States |
Area:
Inorganic Chemistry, Chemical Engineering, Materials Science EngineeringYear | Citation | Score | |||
---|---|---|---|---|---|
2021 | Cwik S, Woods KN, Perera SS, Saly MJ, Knisley TJ, Winter CH. Thermal atomic layer deposition of rhenium nitride and rhenium metal thin films using methyltrioxorhenium. Dalton Transactions (Cambridge, England : 2003). 50: 18202-18211. PMID 34860223 DOI: 10.1039/d1dt03454e | 0.651 | |||
2013 | Karunarathne MC, Knisley TJ, Tunstull GS, Heeg MJ, Winter CH. Exceptional thermal stability and high volatility in mid to late first row transition metal complexes containing carbohydrazide ligands Polyhedron. 52: 820-830. DOI: 10.1016/J.Poly.2012.07.034 | 0.567 | |||
2013 | Knisley TJ, Kalutarage LC, Winter CH. Precursors and chemistry for the atomic layer deposition of metallic first row transition metal films Coordination Chemistry Reviews. 257: 3222-3231. DOI: 10.1016/J.Ccr.2013.03.019 | 0.676 | |||
2011 | Knisley TJ, Saly MJ, Heeg MJ, Roberts JL, Winter CH. Volatility and high thermal stability in mid- to late-first-row transition-metal diazadienyl complexes Organometallics. 30: 5010-5017. DOI: 10.1021/Om200626W | 0.718 | |||
2011 | Knisley TJ, Ariyasena TC, Sajavaara T, Saly MJ, Winter CH. Low temperature growth of high purity, low resistivity copper films by atomic layer deposition Chemistry of Materials. 23: 4417-4419. DOI: 10.1021/Cm202475E | 0.748 | |||
Show low-probability matches. |