Year |
Citation |
Score |
1996 |
Smith WF, Abraham MC, Sloan JM, Switkes M. Simple retrofittable long-range x-y translation system for scanned probe microscopes Review of Scientific Instruments. 67: 3599-3604. DOI: 10.1063/1.1147065 |
0.507 |
|
1994 |
Rubel S, Trochet M, Ehrichs EE, Smith WF, Lozanne ALd. Nanofabrication and rapid imaging with a scanning tunneling microscope Journal of Vacuum Science & Technology B. 12: 1894-1897. DOI: 10.1116/1.587664 |
0.306 |
|
1993 |
Fainchtein R, D'Arcangelis ST, Yang SS, Cowan DO, Yoon S, Pan SH, Smith WF, Yoo M, Lozanne ALd. Scanning tunneling and force microscopies of low-dimensional organic conductors and superconductors Proceedings of Spie. 1855: 129-139. DOI: 10.1117/12.146369 |
0.315 |
|
1992 |
Ehrichs EE, Smith WF, de Lozanne AL. Four-probe resistance measurements of nickel wires written with a scanning tunneling microscope/scanning electron microscope system Ultramicroscopy. 42: 1438-1442. DOI: 10.1016/0304-3991(92)90462-S |
0.34 |
|
1991 |
Smith WF, Tighe TS, Spalding GC, Tinkham M, Lobb CJ. Quantum magnetoresistance fluctuations in an amorphous metal. Physical Review. B, Condensed Matter. 43: 12267-12280. PMID 9997023 DOI: 10.1103/Physrevb.43.12267 |
0.599 |
|
1991 |
Ehrichs EE, Smith WF, Lozanne ALd. A scanning tunneling microscope/scanning electron microscope system for the fabrication of nanostructures Journal of Vacuum Science & Technology B. 9: 1380-1383. DOI: 10.1116/1.585201 |
0.307 |
|
1989 |
Iansiti M, Tinkham M, Johnson AT, Smith WF, Lobb CJ. Charging effects and quantum properties of small superconducting tunnel junctions. Physical Review. B, Condensed Matter. 39: 6465-6484. PMID 9947285 DOI: 10.1103/Physrevb.39.6465 |
0.628 |
|
1987 |
Iansiti M, Johnson AT, Smith WF, Rogalla H, Lobb CJ, Tinkham M. Charging energy and phase delocalization in single very small Josephson tunnel junctions. Physical Review Letters. 59: 489-492. PMID 10035782 DOI: 10.1103/Physrevlett.59.489 |
0.633 |
|
1987 |
Iansiti M, Johnson AT, Smith WF, Lobb CJ, Tinkham M. Possible Observation of Charging Energy Effects in Single Ultra-Small Josephson Tunnel Junctions Japanese Journal of Applied Physics. 26: 1557-1558. DOI: 10.7567/Jjaps.26S3.1557 |
0.627 |
|
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