Year |
Citation |
Score |
2005 |
Krishnan R, Xie Q, Kulik J, Wang XD, Krauss TD, Fauchet PM. Charge transport in silicon nanocrystal arrays Materials Research Society Symposium Proceedings. 832: 201-206. DOI: 10.1557/Proc-832-F3.1 |
0.529 |
|
2004 |
Krishnan R, Hahn MA, Yu Z, Silcox J, Fauchet PM, Krauss TD. Polarization surface-charge density of single semiconductor quantum rods. Physical Review Letters. 92: 216803. PMID 15245305 DOI: 10.1103/Physrevlett.92.216803 |
0.468 |
|
2004 |
Krishnan R, Xie Q, Kulik J, Wang XD, Lu S, Molinari M, Gao Y, Krauss TD, Fauchet PM. Effect of oxidation on charge localization and transport in a single layer of silicon nanocrystals Journal of Applied Physics. 96: 654-660. DOI: 10.1063/1.1751632 |
0.593 |
|
2004 |
Striemer CC, Krishnan R, Fauchet PM. The development of nanocrystalline silicon for emerging microelectronic and nanoelectronic applications Jom. 56: 20-25. DOI: 10.1007/S11837-004-0283-3 |
0.564 |
|
2003 |
Krishnan R, Krauss TD, Fauchet PM. Charge retention in single silicon nanocrystal layers Materials Research Society Symposium - Proceedings. 737: 253-258. DOI: 10.1557/Proc-737-F1.3 |
0.677 |
|
2002 |
Striemer CC, Krishnan R, Xie Q, Tsybeskov L, Fauchet PM. Periodic Two-dimensional Arrays of Silicon Quantum Dots for Nanoscale Device Applications Mrs Proceedings. 737. DOI: 10.1557/Proc-737-F3.27 |
0.651 |
|
2002 |
Du H, Chen C, Krishnan R, Krauss TD, Harbold JM, Wise FW, Thomas MG, Silcox J. Optical Properties of Colloidal PbSe Nanocrystals Nano Letters. 2: 1321-1324. DOI: 10.1021/Nl025785G |
0.364 |
|
2001 |
Tsybeskov L, Grom GF, Krishnan R, Montes L, Fauchet PM, Kovalev D, Diener J, Timoshenko V, Koch F, McCaffrey JP, Baribeau JM, Sproule GI, Lockwood DJ, Niquet YM, Delerue C, et al. Resonant tunneling in partially disordered silicon nanostructures Europhysics Letters. 55: 552-558. DOI: 10.1209/Epl/I2001-00451-1 |
0.716 |
|
2001 |
Striemer CC, Krishnan R, Fauchet PM, Tsybeskov L, Xie Q. Controlled Nucleation of Silicon Nanocrystals on a Periodic Template Nano Letters. 1: 643-646. DOI: 10.1021/Nl015599V |
0.648 |
|
2000 |
Krishnan R, Grom G, Fauchet P, Tsybeskov L, Papernov S, Sproule G, Lockwood D. Atomic force microscopy and Raman spectroscopy of nanoscale Si/SiO2superlattices. Mrs Proceedings. 638. DOI: 10.1557/Proc-638-F5.4.1 |
0.719 |
|
2000 |
Kim HB, Montes L, Krishnan R, Fauchet PM, Tsybeskov L. Carrier Transport and Lateral Conductivity in Nanocrystalline Silicon Layers Mrs Proceedings. 638. DOI: 10.1557/Proc-638-F5.12.1 |
0.636 |
|
2000 |
Zollner S, Konkar A, Liu R, Yapa H, Dryer PF, Neeley VA, Xie Q, Grom GF, Zhu Q, Krishnan R, Fauchet PM, Tsybeskov LV. Optical and Structural Characterization of Nanocrystalline Silicon Superlattices: Toward Nanoscale Silicon Metrology Mrs Proceedings. 638. DOI: 10.1557/Proc-638-F5.1.1 |
0.729 |
|
1999 |
Tsybeskov L, Grom GF, Krishnan R, Fauchet PM, McCaffrey JP, Baribeau J, Sproule GI, Lockwood DJ, Timoshenko V, Diener J, Heckler H, Kovalev D, Koch F, Blanton TN. Optical and Microstructural Characterization of Nanocrystalline Silicon Superlattices Mrs Proceedings. 588. DOI: 10.1557/Proc-588-173 |
0.739 |
|
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