Arun K. Nallani, Ph.D. - Publications

Affiliations: 
2005 University of Texas at Dallas, Richardson, TX, United States 
Area:
Electronics and Electrical Engineering, Packaging Engineering

7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2010 Park DSW, Nallani AK, Cha D, Lee GS, Kim MJ, Skidmore G, Lee JB, Lee JS. A sub-micron metallic electrothermal gripper Microsystem Technologies. 16: 367-373. DOI: 10.1007/S00542-009-0939-6  0.383
2007 Nallani AK, Lee JB. Ferromagnetic 3-D impellor-shaped micro-stirrer bar for micromixing Proceedings of Spie - the International Society For Optical Engineering. 6589. DOI: 10.1117/12.722098  0.344
2006 Lee J, Park DS, Nallani AK, Cui Y, Skoyles A, Lee JB. High-aspect ratio metallic nano grippers Proceedings of 1st Ieee International Conference On Nano Micro Engineered and Molecular Systems, 1st Ieee-Nems. 682-686. DOI: 10.1109/NEMS.2006.334872  0.436
2006 Nallani AK, Chen T, Hayes DJ, Che WS, Lee JB. A method for improved VCSEL packaging using MEMS and ink-jet technologies Journal of Lightwave Technology. 24: 1504-1512. DOI: 10.1109/Jlt.2005.863305  0.348
2006 Nallani AK, Lee JB, Wallace DB, Hayes DJ. Novel 3-D impellor-shaped ferromagnetic micro-stirrer bar and its use for active micromixing Micro Total Analysis Systems - Proceedings of Microtas 2006 Conference: 10th International Conference On Miniaturized Systems For Chemistry and Life Sciences. 1139-1141.  0.396
2005 Lee JS, Park DSW, Nallani AK, Lee GS, Lee JB. Sub-micron metallic electrothermal actuators Journal of Micromechanics and Microengineering. 15: 322-327. DOI: 10.1088/0960-1317/15/2/011  0.481
2003 Nallani AK, Park SW, Lee JB. Characterization of SU-8 as a resist for electron beam lithography Proceedings of Spie - the International Society For Optical Engineering. 5116: 414-423. DOI: 10.1117/12.499112  0.387
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