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Christopher W. Szakal, Ph.D. - Publications

Affiliations: 
2006 Pennsylvania State University, State College, PA, United States 
Area:
General Chemistry
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36 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Szakal C, Simons DS, Fassett JD, Fahey AJ. Advances in age-dating of individual uranium particles by large geometry secondary ion mass spectrometry. The Analyst. PMID 31199423 DOI: 10.1039/C9An00774A  0.357
2018 Forbes TP, Szakal C. Considerations for uranium isotope ratio analysis by atmospheric pressure ionization mass spectrometry. The Analyst. 144: 317-323. PMID 30499992 DOI: 10.1039/C8An01716F  0.336
2014 Szakal C, Ugelow MS, Gorham JM, Konicek AR, Holbrook RD. Visualizing nanoparticle dissolution by imaging mass spectrometry. Analytical Chemistry. 86: 3517-24. PMID 24611464 DOI: 10.1021/Ac404153Q  0.362
2012 Konicek AR, Lefman J, Szakal C. Automated correlation and classification of secondary ion mass spectrometry images using a k-means cluster method. The Analyst. 137: 3479-87. PMID 22567660 DOI: 10.1039/C2An16122B  0.447
2012 Holbrook RD, Davis JM, Scott KC, Szakal C. Detection and speciation of brominated flame retardants in high-impact polystyrene (HIPS) polymers. Journal of Microscopy. 246: 143-52. PMID 22455446 DOI: 10.1111/J.1365-2818.2012.03602.X  0.402
2012 Szakal C, Konicek A, Ugelow M, Simons D, Holbrook R. New Desorption Mass Spectrometry Approaches for Inorganic Particle Analysis Microscopy and Microanalysis. 18: 902-903. DOI: 10.1017/S1431927612006368  0.303
2011 Szakal C, Narayan K, Fu J, Lefman J, Subramaniam S. Compositional mapping of the surface and interior of mammalian cells at submicrometer resolution. Analytical Chemistry. 83: 1207-13. PMID 21268648 DOI: 10.1021/Ac1030607  0.438
2011 Konicek A, Lefman J, Szakal C. Automated Classification of SIMS Images Using K-means Clustering Microscopy and Microanalysis. 17: 564-565. DOI: 10.1017/S1431927611003692  0.304
2011 Gillen G, Szakal C, Brewer TM. Useful yields of organic molecules under dynamic SIMS cluster bombardment Surface and Interface Analysis. 43: 376-379. DOI: 10.1002/Sia.3484  0.528
2010 Brewer TM, Szakal C, Gillen G. Method for improved secondary ion yields in cluster secondary ion mass spectrometry. Rapid Communications in Mass Spectrometry : Rcm. 24: 593-8. PMID 20155758 DOI: 10.1002/rcm.4423  0.574
2010 Szakal C, Hues SM, Bennett J, Gillen G. Effect of cluster ion analysis fluence on interface quality in SIMS molecular depth profiling Journal of Physical Chemistry C. 114: 5338-5343. DOI: 10.1021/Jp905019X  0.57
2010 Lefman J, Szakal C. Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images Microscopy and Microanalysis. 16: 284-285. DOI: 10.1017/s1431927610060988  0.442
2010 Brewer TM, Szakal C, Gillen G. Method for improved secondary ion yields in cluster secondary ion mass spectrometry Rapid Communications in Mass Spectrometry. 24: 593-598. DOI: 10.1002/Rcm.4423  0.639
2009 Szakal C, Brewer TM. Analysis and mechanisms of cyclotrimethylenetrinitramine ion formation in desorption electrospray ionization. Analytical Chemistry. 81: 5257-66. PMID 19514715 DOI: 10.1021/Ac900467R  0.471
2007 Russo MF, Szakal C, Kozole J, Winograd N, Garrison BJ. Sputtering yields for C60 and Au3 bombardment of water ice as a function of incident kinetic energy. Analytical Chemistry. 79: 4493-8. PMID 17503768 DOI: 10.1021/Ac070105L  0.539
2006 Szakal C, Kozole J, Russo MF, Garrison BJ, Winograd N. Surface sensitivity in cluster-ion-induced sputtering. Physical Review Letters. 96: 216104. PMID 16803256 DOI: 10.1103/Physrevlett.96.216104  0.69
2006 Fisher GL, Szakal C, Wetteland CJ, Winograd N. TOF-SIMS evidence of intercalated molecular gases and diffusion-limited reaction kinetics in an alpha particle-irradiated PTFE matrix. The Journal of Physical Chemistry. B. 110: 1820-9. PMID 16471751 DOI: 10.1021/Jp055402D  0.508
2006 Fisher GL, Szakal C, Wetteland CJ, Winograd N. Role of low-level impurities and intercalated molecular gases in the α particle radiolysis of polytetrafluoroethylene examined by static time-of-flight secondary-ion-mass spectrometery Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 24: 1166-1171. DOI: 10.1116/1.2167982  0.614
2006 Ostrowski SG, Szakal C, Kozole J, Roddy TP, Xu J, Ewing AG, Winograd N. Secondary Ion MS Imaging in Picoliter Vials with a Buckministerfullerene Ion Source Analytical Chemistry. 78: 973-973. DOI: 10.1021/Ac058047W  0.737
2006 Kozole J, Szakal C, Kurczy M, Winograd N. Model multilayer structures for three-dimensional cell imaging Applied Surface Science. 252: 6789-6792. DOI: 10.1016/J.Apsusc.2006.02.209  0.724
2006 Szakal C, Kozole J, Winograd N. Fundamental studies of the cluster ion bombardment of water ice Applied Surface Science. 252: 6526-6528. DOI: 10.1016/J.Apsusc.2006.02.208  0.588
2006 Winograd N, Postawa Z, Cheng J, Szakal C, Kozole J, Garrison BJ. Improvements in SIMS continue. Is the end in sight? Applied Surface Science. 252: 6836-6843. DOI: 10.1016/J.Apsusc.2006.02.142  0.757
2006 Fisher GL, Lakis RE, Davis CC, Szakal C, Swadener JG, Wetteland CJ, Winograd N. Mechanical properties and the evolution of matrix molecules in PTFE upon irradiation with MeV alpha particles Applied Surface Science. 253: 1330-1342. DOI: 10.1016/J.Apsusc.2006.02.002  0.576
2005 Ostrowski SG, Szakal C, Kozole J, Roddy TP, Xu J, Ewing AG, Winograd N. Secondary ion MS imaging of lipids in picoliter vials with a buckminsterfullerene ion source. Analytical Chemistry. 77: 6190-6. PMID 16194078 DOI: 10.1021/Ac0508189  0.754
2005 Sun S, Szakal C, Winograd N, Wucher A. Energetic ion bombardment of Ag surfaces by C60+ and Ga+ projectiles. Journal of the American Society For Mass Spectrometry. 16: 1677-86. PMID 16099165 DOI: 10.1016/J.Jasms.2005.06.009  0.781
2004 Wucher A, Sun S, Szakal C, Winograd N. Molecular depth profiling of histamine in ice using a buckminsterfullerene probe. Analytical Chemistry. 76: 7234-42. PMID 15595864 DOI: 10.1021/Ac049641T  0.773
2004 Xu J, Szakal CW, Martin SE, Peterson BR, Wucher A, Winograd N. Molecule-specific imaging with mass spectrometry and a buckminsterfullerene probe: application to characterizing solid-phase synthesized combinatorial libraries. Journal of the American Chemical Society. 126: 3902-9. PMID 15038744 DOI: 10.1021/Ja036549Q  0.755
2004 Sun S, Wucher A, Szakal C, Winograd N. Depth profiling of polycrystalline multilayers using a Buckminsterfullerene projectile Applied Physics Letters. 84: 5177-5179. DOI: 10.1063/1.1764594  0.716
2004 Wojciechowski IA, Sun S, Szakal C, Winograd N, Garrison BJ. Ion Emission from Water Ice Due to Energetic Particle Bombardment Journal of Physical Chemistry A. 108: 2993-2998. DOI: 10.1021/Jp0373696  0.755
2004 Szakal C, Sun S, Wucher A, Winograd N. C60 molecular depth profiling of a model polymer Applied Surface Science. 231: 183-185. DOI: 10.1016/J.Apsusc.2004.03.113  0.801
2004 Sostarecz AG, Sun S, Szakal C, Wucher A, Winograd N. Depth profiling studies of multilayer films with a C60 + ion source Applied Surface Science. 231: 179-182. DOI: 10.1016/J.Apsusc.2004.03.111  0.772
2004 Xu J, Ostrowski S, Szakal C, Ewing AG, Winograd N. ToF-SIMS imaging with cluster ion beams Applied Surface Science. 231: 159-163. DOI: 10.1016/J.Apsusc.2004.03.104  0.756
2004 Wojciechowski IA, Kutliev U, Sun S, Szakal C, Winograd N, Garrison BJ. Emission of ionic water clusters from water ice films bombarded by energetic projectiles Applied Surface Science. 231: 72-77. DOI: 10.1016/J.Apsusc.2004.03.036  0.764
2004 Wucher A, Sun S, Szakal C, Winograd N. Molecular depth profiling in ice matrices using C60 projectiles Applied Surface Science. 231: 68-71. DOI: 10.1016/J.Apsusc.2004.03.035  0.783
2004 Sun S, Szakal C, Smiley EJ, Postawa Z, Wucher A, Garrison BJ, Winograd N. Sputtering of Ag under C60 + and Ga+ projectile bombardment Applied Surface Science. 231: 64-67. DOI: 10.1016/J.Apsusc.2004.03.034  0.777
2004 Sun S, Szakal C, Roll T, Mazarov P, Wucher A, Winograd N. Use of C60 cluster projectiles for sputter depth profiling of polycrystalline metals Surface and Interface Analysis. 36: 1367-1372. DOI: 10.1002/Sia.1923  0.774
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