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Philippe Adell, Ph.D. - Publications

Affiliations: 
2006 Vanderbilt University, Nashville, TN 
Area:
Radiation Physics
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26 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Witulski AF, Mahadevan N, Kauppila J, Karsai G, Sternberg A, Schrimpf RD, Reed RA, Adell P, Schone H, Daniel A, Privat A, Barnaby H. Simulation of Transistor-Level Radiation Effects on System-Level Performance Parameters Ieee Transactions On Nuclear Science. 66: 1634-1641. DOI: 10.1109/Tns.2019.2922903  0.579
2015 Adell PC, Rax B, Esqueda IS, Barnaby HJ. Hydrogen Limits for Total Dose and Dose Rate Response in Linear Bipolar Circuits Ieee Transactions On Nuclear Science. 62: 2476-2481. DOI: 10.1109/Tns.2015.2500198  0.595
2015 Allen GR, Scheick LZ, Irom F, Guertin SM, Adell PC, Amrbar M, Vartanian S, O'Connor M. 2015 compendium of recent test results of single event effects conducted by the Jet Propulsion Laboratory's radiation effects group Ieee Radiation Effects Data Workshop. 2015. DOI: 10.1109/REDW.2015.7336703  0.31
2012 Adell PC, Esqueda IS, Barnaby HJ, Rax B, Johnston AH. Impact of low temperatures (< 125 K) on the total ionizing dose response and ELDRS in gated lateral PNP BJTs Ieee Transactions On Nuclear Science. 59: 3081-3086. DOI: 10.1109/Tns.2012.2224372  0.594
2012 Allen GR, Adell PC, Chen D, Musil P. Single-event transient testing of low dropout PNP series linear voltage regulators Ieee Transactions On Nuclear Science. 59: 2764-2771. DOI: 10.1109/TNS.2012.2222442  0.315
2012 Buchner S, Roche N, Warner J, McMorrow D, Miller F, Morand S, Pouget V, Larue C, Ferlet-Cavrois V, El Mamouni F, Kettunen H, Adell P, Allen G, Aveline D. Comparison of single event transients generated at four pulsed-laser test facilities-NRL, IMS, EADS, JPL Ieee Transactions On Nuclear Science. 59: 988-998. DOI: 10.1109/TNS.2012.2201956  0.585
2012 Esqueda IS, Barnaby HJ, Adell PC. Modeling the effects of hydrogen on the mechanisms of dose rate sensitivity Ieee Transactions On Nuclear Science. 59: 701-706. DOI: 10.1109/TNS.2012.2195201  0.609
2011 Esqueda IS, Barnaby HJ, Adell PC, Rax BG, Hjalmarson HP, McLain ML, Pease RL. Modeling low dose rate effects in shallow trench isolation oxides Ieee Transactions On Nuclear Science. 58: 2945-2952. DOI: 10.1109/Tns.2011.2168569  0.574
2010 Pease RL, Adell PC, Rax B, McClure S, Barnaby HJ, Kruckmeyer K, Triggs B. Evaluation of an accelerated ELDRS test using molecular hydrogen Ieee Transactions On Nuclear Science. 57: 3419-3425. DOI: 10.1109/Tns.2010.2070806  0.587
2009 Chen XJ, Barnaby HJ, Adell P, Pease RL, Vermeire B, Holbert KE. Modeling the dose rate response and the effects of hydrogen in bipolar technologies Ieee Transactions On Nuclear Science. 56: 3196-3202. DOI: 10.1109/Tns.2009.2034154  0.65
2009 Adell PC, Pease RL, Barnaby HJ, Rax B, Chen XJ, McClure SS. Irradiation with molecular hydrogen as an accelerated total dose hardness assurance test method for bipolar linear circuits Ieee Transactions On Nuclear Science. 56: 3326-3333. DOI: 10.1109/Tns.2009.2033797  0.63
2009 Esqueda IS, Barnaby HJ, McLain ML, Adell PC, Mamouni FE, Dixit SK, Schrimpf RD, Xiong W. Modeling the radiation response of fully-depleted SOI n-channel MOSFETs Ieee Transactions On Nuclear Science. 56: 2247-2250. DOI: 10.1109/Tns.2009.2012709  0.563
2009 Laird JS, Chen Y, Vo T, Edmonds L, Scheick L, Adell P. Temperature dependence of spatially resolved picosecond laser induced transients in a deep submicron CMOS inverter Ieee Transactions On Nuclear Science. 56: 220-228. DOI: 10.1109/Tns.2008.2010939  0.381
2008 Chen XJ, Barnaby HJ, Vermeire B, Holbert KE, Wright D, Pease RL, Schrimpf RD, Fleetwood DM, Pantelides ST, Shaneyfelt MR, Adell P. Post-irradiation annealing mechanisms of defects generated in hydrogenated bipolar oxides Ieee Transactions On Nuclear Science. 55: 3032-3038. DOI: 10.1109/Tns.2008.2006972  0.597
2008 Mamouni FE, Dixit SK, Schrimpf RD, Adell PC, Esqueda IS, McLain ML, Barnaby HJ, Cristoloveanu S, Xiong W. Gate-length and drain-bias dependence of band-to-band tunneling-induced drain leakage in irradiated fully depleted SOI devices Ieee Transactions On Nuclear Science. 55: 3259-3264. DOI: 10.1109/Tns.2008.2006500  0.607
2008 Pease RL, Adell PC, Rax BG, Chen XJ, Barnaby HJ, Holbert KE, Hjalmarson HP. The effects of hydrogen on the enhanced Low Dose Rate Sensitivity (ELDRS) of bipolar linear circuits Ieee Transactions On Nuclear Science. 55: 3169-3173. DOI: 10.1109/Tns.2008.2006478  0.608
2008 McLain ML, Barnaby HJ, Adell PC. Analytical model of radiation response in FDSOI MOSFETS Ieee International Reliability Physics Symposium Proceedings. 643-644. DOI: 10.1109/RELPHY.2008.4558967  0.601
2008 Chen XJ, Barnaby HJ, Pease RL, Adell P. Behavior of radiation-induced defects in bipolar oxides during irradiation and annealing in hydrogen-rich and -depleted ambients Ieee International Reliability Physics Symposium Proceedings. 115-120. DOI: 10.1109/RELPHY.2008.4558871  0.597
2007 Chen W, Varanasi N, Pouget V, Barnaby HJ, Vermeire B, Adell PC, Copani T, Fouillat P. Impact of VCO topology on SET induced frequency response Ieee Transactions On Nuclear Science. 54: 2500-2505. DOI: 10.1109/Tns.2007.911422  0.549
2007 Adell PC, Barnaby HJ, Schrimpf RD, Vermeire B. Band-to-Band Tunneling (BBT) induced leakage current enhancement in irradiated fully depleted SOI devices Ieee Transactions On Nuclear Science. 54: 2174-2180. DOI: 10.1109/Tns.2007.911419  0.656
2007 Chen XJ, Barnaby HJ, Vermeire B, Holbert K, Wright D, Pease RL, Dunham G, Platteter DG, Seiler J, McClure S, Adell P. Mechanisms of enhanced radiation-induced degradation due to excess molecular hydrogen in bipolar oxides Ieee Transactions On Nuclear Science. 54: 1913-1919. DOI: 10.1109/Tns.2007.909708  0.6
2007 Pease RL, Platteter DG, Dunham GW, Seiler JE, Adell PC, Barnaby HJ, Chen J. The effects of hydrogen in hermetically sealed packages on the total dose and dose rate response of bipolar linear circuits Ieee Transactions On Nuclear Science. 54: 2168-2173. DOI: 10.1109/Tns.2007.907870  0.61
2007 Adell PC, McClure S, Pease RL, Rax BG, Dunham GW, Barnaby HJ, Chen XJ. Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. DOI: 10.1109/RADECS.2007.5205490  0.596
2005 Adell PC, Schrimpf RD, Cirba CR, Holman WT, Zhu X, Barnaby HJ, Mion O. Single event transient effects in a voltage reference Microelectronics Reliability. 45: 355-359. DOI: 10.1016/J.Microrel.2004.05.029  0.652
2004 Adell PC, Mion O, Schrimpf RD, Chatry C, Calvel P. Set risk analyses in digital optocouplers European Space Agency, (Special Publication) Esa Sp. 301-304.  0.4
2000 Adell P, Schrimpf RD, Barnaby HJ, Marec R, Chatry C, Calvel P, Barillot C, Mion O. Analysis of single-event transients in analog circuits Ieee Transactions On Nuclear Science. 47: 2616-2623. DOI: 10.1109/23.903817  0.643
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