Year |
Citation |
Score |
2016 |
Tu Q, Lange B, Parlak Z, Lopes JM, Blum V, Zauscher S. Quantitative Subsurface Atomic Structure Fingerprint for 2D Materials and Heterostructures by First-Principles Calibrated Contact-Resonance Atomic Force Microscopy. Acs Nano. PMID 27263541 DOI: 10.1021/Acsnano.6B02402 |
0.43 |
|
2014 |
Parlak Z, Tu Q, Zauscher S. Liquid contact resonance AFM: analytical models, experiments, and limitations. Nanotechnology. 25: 445703. PMID 25302928 DOI: 10.1088/0957-4484/25/44/445703 |
0.434 |
|
2012 |
Zhang J, Parlak Z, Bowers CM, Oas T, Zauscher S. Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media. Beilstein Journal of Nanotechnology. 3: 464-74. PMID 23019540 DOI: 10.3762/Bjnano.3.53 |
0.36 |
|
2012 |
Giray Oral H, Parlak Z, Levent Degertekin F. Analysis of time-resolved interaction force mode AFM imaging using active and passive probes. Ultramicroscopy. 120: 56-63. PMID 22813887 DOI: 10.1016/J.Ultramic.2012.05.009 |
0.523 |
|
2011 |
Parlak Z, Degertekin FL. Combined quantitative ultrasonic and time-resolved interaction force AFM imaging. The Review of Scientific Instruments. 82: 013703. PMID 21280833 DOI: 10.1063/1.3514099 |
0.554 |
|
2011 |
Thatte A, Parlak Z, Degertekin FL, Salant RF. Nano/micro-scale structural properties of dynamic polymeric seals Bhr Group - 21st International Conference On Fluid Sealing. 239-248. |
0.495 |
|
2009 |
Parlak Z, Hadizadeh R, Balantekin M, Levent Degertekin F. Controlling tip-sample interaction forces during a single tap for improved topography and mechanical property imaging of soft materials by AFM. Ultramicroscopy. 109: 1121-5. PMID 19493622 DOI: 10.1016/J.Ultramic.2009.04.006 |
0.5 |
|
2008 |
Parlak Z, Degertekin FL. Contact stiffness of finite size subsurface defects for atomic force microscopy: Three-dimensional finite element modeling and experimental verification Journal of Applied Physics. 103. DOI: 10.1063/1.2936881 |
0.534 |
|
2006 |
Onaran AG, Balantekin M, Lee W, Hughes WL, Buchine BA, Guldiken RO, Parlak Z, Quate CF, Degertekin FL. A new atomic force microscope probe with force sensing integrated readout and active tip Review of Scientific Instruments. 77. DOI: 10.1063/1.2166469 |
0.474 |
|
Show low-probability matches. |